Patents by Inventor David E. Klipec

David E. Klipec has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Extending Programmable Measurement Device Functionality
    Publication number: 20140358469
    Abstract: System and method for extending programmable device functionality while preserving functionality of the device driver and driver IP. User input may be received specifying functionality of custom IP for a programmable measurement device with standard driver IP. The custom IP may be generated accordingly, and may be deployable to the programmable measurement device. During operation the custom IP may communicate directly with the standard driver IP and may provide custom functionality of the programmable measurement device while preserving functionality of the standard driver IP on the programmable measurement device and the standard device driver.
    Type: Application
    Filed: June 4, 2014
    Publication date: December 4, 2014
    Applicant: NATIONAL INSTRUMENTS CORPORATION
    Inventors: Christopher F. Graf, Ryan P. Verret, Joseph H. DiGiovanni, David E. Klipec, Dustyn K. Blasig, Jeronimo Mota, Kunal H. Patel, Duncan G. Hudson, III, Brian K. Odom
  • Deterministic reconfiguration of measurement modules using double buffered DMA
    Patent number: 8423314
    Abstract: Configuring at least one radio frequency (RF) instrument according to a plurality of RF measurement configurations for performing a plurality of tests on a device under test (DUT). A list of RF measurement configurations may be stored in a computer memory. The list of RF measurement configurations comprises a plurality of parameters for configuring operation of the at least one instrument. Information regarding the list of RF measurement configurations (e.g., a data stream) may be provided to the at least one RF instrument. The at least one RF instrument may perform the plurality of tests on the DUT, including the at least one RF instrument configuring itself according to the RF measurement configurations based on processing of the information. Configuring enables the at least one RF instrument to perform the plurality of tests on the DUT in a deterministic manner.
    Type: Grant
    Filed: February 25, 2010
    Date of Patent: April 16, 2013
    Assignee: National Instruments Corporation
    Inventors: Kunal H. Patel, David E. Klipec
  • Deterministic Reconfiguration of Measurement Modules Using Double Buffered DMA
    Publication number: 20110119016
    Abstract: Configuring at least one radio frequency (RF) instrument according to a plurality of RF measurement configurations for performing a plurality of tests on a device under test (DUT). A list of RF measurement configurations may be stored in a computer memory. The list of RF measurement configurations comprises a plurality of parameters for configuring operation of the at least one instrument. Information regarding the list of RF measurement configurations (e.g., a data stream) may be provided to the at least one RF instrument. The at least one RF instrument may perform the plurality of tests on the DUT, including the at least one RF instrument configuring itself according to the RF measurement configurations based on processing of the information. Configuring enables the at least one RF instrument to perform the plurality of tests on the DUT in a deterministic manner.
    Type: Application
    Filed: February 25, 2010
    Publication date: May 19, 2011
    Inventors: Kunal H. Patel, David E. Klipec