Abstract: A device for verifying wire connectivity of a bus may include a bus connector configured to connect to a bus comprising a plurality of wires and measurement circuitry configured to perform a verification test on each wire of the bus. The verification test of each wire may include connecting a wire under test in a predetermined configuration relative to the other wires for performing the verification test and measuring a value of an electrical parameter associated with the wire under test. The verification test may also include comparing the value of the measured electrical parameter associated with the wire under test to an expected value of the electrical parameter. The wire under test passes the verification test in response to the measured value of the electrical parameter corresponding substantially to the expected value of the electrical parameter.

Abstract: A device for verifying wire connectivity of a bus may include a bus connector configured to connect to a bus comprising a plurality of wires and measurement circuitry configured to perform a verification test on each wire of the bus. The verification test of each wire may include connecting a wire under test in a predetermined configuration relative to the other wires for performing the verification test and measuring a value of an electrical parameter associated with the wire under test. The verification test may also include comparing the value of the measured electrical parameter associated with the wire under test to an expected value of the electrical parameter. The wire under test passes the verification test in response to the measured value of the electrical parameter corresponding substantially to the expected value of the electrical parameter.

Abstract: A device for verifying wire connectivity of a bus may include a bus connector configured to connect to a bus comprising a plurality of wires and measurement circuitry configured to perform a verification test on each wire of the bus. The verification test of each wire may include connecting a wire under test in a predetermined configuration relative to the other wires for performing the verification test and measuring a value of an electrical parameter associated with the wire under test. The verification test may also include comparing the value of the measured electrical parameter associated with the wire under test to an expected value of the electrical parameter. The wire under test passes the verification test in response to the measured value of the electrical parameter corresponding substantially to the expected value of the electrical parameter.

Abstract: A device for verifying wire connectivity of a bus may include a bus connector configured to connect to a bus comprising a plurality of wires and measurement circuitry configured to perform a verification test on each wire of the bus. The verification test of each wire may include connecting a wire under test in a predetermined configuration relative to the other wires for performing the verification test and measuring a value of an electrical parameter associated with the wire under test. The verification test may also include comparing the value of the measured electrical parameter associated with the wire under test to an expected value of the electrical parameter. The wire under test passes the verification test in response to the measured value of the electrical parameter corresponding substantially to the expected value of the electrical parameter.

Abstract: A device for verifying wire connectivity of a bus may include a bus connector configured to connect to a bus comprising a plurality of wires and measurement circuitry configured to perform a verification test on each wire of the bus. The verification test of each wire may include connecting a wire under test in a predetermined configuration relative to the other wires for performing the verification test and measuring a value of an electrical parameter associated with the wire under test. The verification test may also include comparing the value of the measured electrical parameter associated with the wire under test to an expected value of the electrical parameter. The wire under test passes the verification test in response to the measured value of the electrical parameter corresponding substantially to the expected value of the electrical parameter.

Abstract: A cue stroke practice aid is used by a billiards player to improve the player's cue stroke by repetitiously practicing the stroke at varying skill levels until a consistent stroke is developed. The practice aid comprises an elongated housing with first and second openings at opposed ends. A slide assembly is positioned in the elongated housing. The slide assembly includes a shaft, equi-spaced rails extending axially from the shaft, cue guide arms and an adjusting knob. The adjusting knob is used to move the rails laterally within the housing. This has the effect of causing cue guide arms to radially expand or contract from the axis shaft to form a tubular cavity of a desired cross dimension. The opening defined by tips of the cue guide fingers provides a target for the billiards player to practice a stroke at a selected cross dimension according to an attainable skill level.

Abstract: A desired Acceptable Quality Limit (AQL), a desired Key Defect Rate (KDR), a desired power of a sampling plan for items that are manufactured and a desired false alarm rate for the sampling plan are input into a computer. The computer calculates a required sample size to provide the desired AQL, the desired KDR, the desired power of the sampling plan for the items that are manufactured and the desired false alarm rate for the sampling plan. Thus, each of the individual parameters may be independently specified based on the items that are manufactured, desired AQLs, KDRs, power and false alarm rates. Reliance on ANSI/ASQ Z1.9 tables which might best fit a user's desired parameters can be reduced and preferably eliminated. In addition to calculating the required sample size, a decision rule critical value also may be calculated based upon the required sample size to provide the desired AQL, the desired KDR, the desired power and the desired false alarm rate for the sampling plan.

Abstract: A desired Acceptable Quality Limit (AQL), a desired Key Defect Rate (KDR), a desired power of a sampling plan for items that are manufactured and a desired false alarm rate for the sampling plan are input into a computer. The computer calculates a required sample size to provide the desired AQL, the desired KDR, the desired power of the sampling plan for the items that are manufactured and the desired false alarm rate for the sampling plan. Thus, each of the individual parameters may be independently specified based on the items that are manufactured, desired AQLs, KDRs, power and false alarm rates. Reliance on ANSI/ASQ Z1.9 tables which might best fit a user's desired parameters can be reduced and preferably eliminated. In addition to calculating the required sample size, a decision rule critical value also may be calculated based upon the required sample size to provide the desired AQL, the desired KDR, the desired power and the desired false alarm rate for the sampling plan.

Abstract: A desired Acceptable Quality Limit (AQL), a desired Key Defect Rate (KDR), a desired power of a sampling plan for items that are manufactured and a desired false alarm rate for the sampling plan are input into a computer. The computer calculates a required sample size to provide the desired AQL, the desired KDR, the desired power of the sampling plan for the items that are manufactured and the desired false alarm rate for the sampling plan. Thus, each of the individual parameters may be independently specified based on the items that are manufactured, desired AQLs, KDRs, power and false alarm rates. Reliance on ANSI/ASQ Z1.9 tables which might best fit a user's desired parameters can be reduced and preferably eliminated. In addition to calculating the required sample size, a decision rule critical value also may be calculated based upon the required sample size to provide the desired AQL, the desired KDR, the desired power and the desired false alarm rate for the sampling plan.

Abstract: A method is disclosed for manufacturing ejector sleeves from tubular stock. In particular, the method includes the following steps or operations: (a) cutting the tube stock to length, (b) enlarging a portion of the inside diameter of the sleeve to provide a clearance diameter, (c) rough-sizing a close-fitting inner diameter, (d) optionally semi-finishing the outside diameter of the sleeve, (e) hardening and straightening the sleeve, (f) final sizing of the outside diameter while maintaining concentricity with the inside diameters, (g) finishing the end face of the sleeve adjacent the close-fitting diameter, (h) final sizing of the close-fitting inner diameter while maintaining concentricity with the outside diameter, (i) forming a head on the sleeve by heating and forging to a predetermined size, (j) optional annealing and refinishing of the head for purposes of hardness or dimensional modification, or improving surface finish.