Patents by Inventor David E. Methe

David E. Methe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Ultrasonic thickness gauge having automatic transducer recognition and parameter optimization and method thereof
    Patent number: 4840066
    Abstract: A measurement system employs a method and apparatus for uniquely tagging each of a plurality of transducers, automatically recognizing the tag for identifying the transducer and automatically adjusting electronic parameters of the system for enhancing performance with a selected transducer. In a preferred embodiment, a resistor is inserted in a piezoelectric transducer of an ultrasonic thickness gauge, a current source and A to D converter measure the resistor and a microprocessor-based logic system adjusts measurement parameters of the gauge to be automatically optimized for the associated transducer characteristics.
    Type: Grant
    Filed: June 27, 1988
    Date of Patent: June 20, 1989
    Assignee: NDT Instruments, Inc.
    Inventors: Ronald J. Botsco, Robert L. Jones, David E. Methe