Patents by Inventor David E. Sawyer

David E. Sawyer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Temperature monitoring apparatus and method therefor
    Patent number: 4828401
    Abstract: Temperature is monitored along a linear path by utilizing a plurality of temperature sensitive diodes spaced along the path. These are connected at separate and spaced taps of a delay line, a pulse is propagated down the delay line and the effect of the temperature influenced conductivity of the diode on the pulse as it passes a respective diode is sensed.
    Type: Grant
    Filed: June 17, 1987
    Date of Patent: May 9, 1989
    Assignee: Systron Donner
    Inventor: David E. Sawyer
  • Nondestructive method for detecting defects in photodetector and solar cell devices
    Patent number: 4287473
    Abstract: The invention described herein is a method for locating semiconductor device defects and for measuring the internal resistance of such devices by making use of the intrinsic distributed resistance nature of the devices. The method provides for forward-biasing a solar cell or other device while it is scanning with an optical spot. The forward-biasing is achieved with either an illuminator light source or an external current source.
    Type: Grant
    Filed: May 25, 1979
    Date of Patent: September 1, 1981
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventor: David E. Sawyer