Patents by Inventor David E. Sloman

David E. Sloman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6426516
    Abstract: A method and structure for an integrated circuit technology segment test structure including a plurality of technology test structures connected together as a chain of elements and a plurality of externally probable regions positioned along said chain of elements, said externally probable regions being positioned so as to enable location of a failed test structure.
    Type: Grant
    Filed: August 16, 1999
    Date of Patent: July 30, 2002
    Assignee: International Business Machines Corporation
    Inventor: David E. Sloman
  • Publication number: 20020063249
    Abstract: A method and structure for an integrated circuit technology segment test structure including a plurality of technology test structures connected together as a chain of elements and a plurality of externally probable regions positioned along said chain of elements, said externally probable regions being positioned so as to enable location of a failed test structure.
    Type: Application
    Filed: August 16, 1999
    Publication date: May 30, 2002
    Inventor: DAVID E. SLOMAN
  • Patent number: 5337178
    Abstract: An X-Y microscope stage is provided with a tiltable support for a specimen. The specimen may be tilted about the tilt axis to re-orient the specimen for viewing. The re-orientation of the specimen may require a small adjustment in the X or Y direction and a subsequent refocus of the microscope optics.
    Type: Grant
    Filed: December 23, 1992
    Date of Patent: August 9, 1994
    Assignee: International Business Machines Corporation
    Inventors: Paul J. Kung, David E. Sloman