Abstract: A method and apparatus for operating a DRAM while varying the supply voltage provided thereto. A memory system is designed to attach to a DRAM. The DRAM is capable of maintaining data stored therein until supply voltage is varied beyond a predetermined voltage change level without the performance of a refresh operation. The system includes a power source coupled to the DRAM for providing supply voltage thereto and a refresh signal generator coupled to the DRAM for causing the DRAM to perform refresh operations wherein the charges associated with data bits stored within the DRAM memory cells are refreshed thereby maintaining the data integrity of data stored in the DRAM. The relative rates of supply voltage change and refresh signal provision are adjusted so as to ensure that refresh signals are provided to the DRAM prior to a point in time at which the change in supply voltage provided to the DRAM exceeds the predetermined voltage change level.

Abstract: A method and apparatus for operating a DRAM while varying the supply voltage provided thereto. A memory system is designed to attach to a DRAM. The DRAM is capable of maintaining data stored therein until supply voltage is varied beyond a predetermined voltage change level without the performance of a refresh operation. The system includes a power source coupled to the DRAM for providing supply voltage thereto and a refresh signal generation device coupled to the DRAM for causing the DRAM to perform refresh operations wherein the charges associated with data bits stored within the DRAM memory cells are refreshed thereby maintaining the data integrity of data stored in the DRAM. The relative rates of supply voltage change and refresh signal provision are adjusted so as to ensure that refresh signals are provided to the DRAM prior to a point in time at which the change in supply voltage provided to the DRAM exceeds the predetermined voltage change level.

Abstract: A programmable self-time refresh circuit for a semiconductor memory and methods for programming the self-refresh rate for non-invasively and deterministically testing the self-timed refresh circuit for establishing/verifying a refresh rate and a wait state interval for the self-refresh operation. The programmable refresh circuit includes a self-timed oscillator that outputs a clocking signal, and a programmable pattern generator that outputs a first signal pattern and a second signal pattern. The first signal pattern is fed to a counter circuit which also receives the clocking signal. The counter circuit outputs a signal pulse whenever the count driven by the clocking signal reaches a digital pattern representation corresponding to the first signal pattern generated by the programmable pattern generator. Refresh control logic is connected to receive the pulse signal and respond thereto by refreshing a portion of the memory array of the semiconductor memory device.