Abstract: A novel method and apparatus has been developed for testing optical circuit modules. More particularly, with the present invention, a given test pack is adapted to “simultaneously” test a plurality of DUT's, by simultaneously apply a given optical signal to each of the plurality of DUT's and allowing each of the DUT's to simultaneously undergo its own testing; the test pack then serially queries each of the DUT's to obtain test results and, if desired, can provide feedback to one or more of the DUT's, whereby the DUT's can be calibrated with the assistance of the test pack. In one preferred form of the invention, all of the plurality of DUT's simultaneously undergoing testing on a given test pack are housed in a single environmental enclosure, permitting all of the DUT's to be simultaneously brought “up to temperature” so as to increase testing throughput.

Abstract: A novel method and apparatus has been developed for testing optical circuit modules. More particularly, with the present invention, a given test pack is adapted to “simultaneously” test a plurality of DUT's, by simultaneously apply a given optical signal to each of the plurality of DUT's and allowing each of the DUT's to simultaneously undergo its own testing; the test pack then serially queries each of the DUT's to obtain test results and, if desired, can provide feedback to one or more of the DUT's, whereby the DUT's can be calibrated with the assistance of the test pack. In one preferred form of the invention, all of the plurality of DUT's simultaneously undergoing testing on a given test pack are housed in a single environmental enclosure, permitting all of the DUT's to be simultaneously brought “up to temperature” so as to increase testing throughput.