Patents by Inventor David F. Fortner

David F. Fortner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and methods for non-destructive inspection using microwave sensing
    Patent number: 6940295
    Abstract: Apparatus and methods for materials inspection using microwave sensing are disclosed. In one aspect, a system for detecting corrosion of a workpiece includes a scanning assembly having a support assembly adapted to be coupled to the workpiece, and a first translation device coupled to the support assembly. A microwave sensor is coupled to the first translation device. The first translation device is adapted to translate the microwave sensor along at least a first direction, and the microwave sensor is adapted to transmit incident microwave signals onto the workpiece and to receive reflected microwave signals reflected from the workpiece. In an alternate aspect, a system may further include a second translation device that is adapted to translate the microwave sensor along at least a second direction that is transverse to the first direction.
    Type: Grant
    Filed: June 11, 2003
    Date of Patent: September 6, 2005
    Assignee: The Boeing Company
    Inventors: Roger W. Engelbart, David F. Fortner, Nancy L. Wood
  • Apparatus and methods for non-destructive inspection using microwave sensing
    Publication number: 20040251920
    Abstract: Apparatus and methods for materials inspection using microwave sensing are disclosed. In one aspect, a system for detecting corrosion of a workpiece includes a scanning assembly having a support assembly adapted to be coupled to the workpiece, and a first translation device coupled to the support assembly. A microwave sensor is coupled to the first translation device. The first translation device is adapted to translate the microwave sensor along at least a first direction, and the microwave sensor is adapted to transmit incident microwave signals onto the workpiece and to receive reflected microwave signals reflected from the workpiece. In an alternate aspect, a system may further include a second translation device that is adapted to translate the microwave sensor along at least a second direction that is transverse to the first direction.
    Type: Application
    Filed: June 11, 2003
    Publication date: December 16, 2004
    Inventors: Roger W. Engelbart, David F. Fortner, Nancy L. Wood