Patents by Inventor David F. Naren

David F. Naren has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Tag buffer with testing capability
    Patent number: 4740971
    Abstract: A tag buffer having built-in testing capabilities is disclosed. In a single-chip, integrated-circuit design which includes a SRAM, a parity generator and checker, and a comparator, a method and capability of testing the functionality of the SRAM and parity components is defined. For an embodiment in which the SRAM component includes a redundancy scheme for replacing a defective memory array row, a test for determining whether a redundant row has been used is also provided.
    Type: Grant
    Filed: February 28, 1986
    Date of Patent: April 26, 1988
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Aloysius T. Tam, Thomas S. Wong, Jim L. Michelsen, David F. Naren, David Wang