Abstract: Test logic supports the testing of an electronic circuit, where the number of ports of the electronic circuit exceeds the number of available tester IO channels. In some examples, the test logic utilizes observe logic in order to analyze the output ports that are masked so that the number of tester IO channels need not be expanded. Digital data from an electronic circuit is compacted by processing the data with a signature compactor to determine a signature corresponding to the output data. A comparator may compare the determined signature with the correct signature to provide a “go/no-go” indication to a process through a processor channel. Providing test coverage using a signature averts the necessity of having additional tester IO channels to cover the associated section of the electronic circuit. Additionally, a pattern generator may be supported by the test logic to provide digital activity for the electronic circuit.

Abstract: Test logic supports the testing of an electronic circuit, where the number of ports of the electronic circuit exceeds the number of available tester IO channels. In some examples, the test logic utilizes observe logic in order to analyze the output ports that are masked so that the number of tester IO channels need not be expanded. Digital data from an electronic circuit is compacted by processing the data with a signature compactor to determine a signature corresponding to the output data. A comparator may compare the determined signature with the correct signature to provide a “go/no-go” indication to a process through a processor channel. Providing test coverage using a signature averts the necessity of having additional tester IO channels to cover the associated section of the electronic circuit. Additionally, a pattern generator may be supported by the test logic to provide digital activity for the electronic circuit.

Abstract: Methods and systems for increasing the speed with which configuration data can be loaded and tested on a reconfigurable interconnect device are disclosed. A reconfigurable interconnect integrated circuit (IC), or a reconfigurable portion of an integrated circuit, is coupled to a digital storage circuit such as a shift register. A seed configuration pattern is loaded once into the digital storage circuit, which is loaded onto a first set of switches in the integrated circuit. The shift register shifts the configuration patterns by a predetermined amount, and then loads the shifted configuration pattern onto a second set of switches in the integrated circuit. Using the digital storage circuit coupled to the reconfigurable interconnect, each integrated circuit only needs to load a configuration pattern once, instead of reloading a new configuration pattern for each set of switches in the integrated circuit.