Abstract: The mechanic's creeper has a lower body support, an upper body support and dual wheel assemblies mounted to the frame in a triangular array. The triangular positioning of the dual wheel assemblies provides for exceptional mobility when a person is working in a reclined position underneath a motor vehicle. The mechanic's creeper may have trays for holding small tools and parts attached to the frame near the lower body support.

Abstract: The mechanic's creeper has a lower body support, an upper body support and dual wheel assemblies mounted to the frame in a triangular array. The triangular positioning of the dual wheel assemblies provides for exceptional mobility when a person is working in a reclined position underneath a motor vehicle. The mechanic's creeper may have trays for holding small tools and parts attached to the frame near the lower body support.

Abstract: A method for identifying, by way of a genetic algorithm, test points to be inserted in an integrated circuit (IC) chip to improve the testability of the IC is described. The algorithm is particularly well suited for large circuit designs (several million gates) because it allows to simultaneous insert multiple additional test points at critical locations of the IC to gain supplemental controlability and/or observability and thereby eliminating the drawbacks associated with the single test point approach. To further improve performance, cost function gradient techniques are applied to guide the selection of potential test points for consideration by the algorithm. Fault simulation of random patterns is used to more accurately distinguish between random pattern testable and random resistant faults, and to provide a more accurate set of initial probabilities for the cost function calculations.

Abstract: A method for identifying, by way of a genetic algorithm, test points to be inserted in an integrated circuit (IC) chip to improve the testability of the IC is described. The algorithm is particularly well suited for large circuit designs (several million gates) because it allows to simultaneous insert multiple additional test points at critical locations of the IC to gain supplemental controlability and/or observability and thereby eliminating the drawbacks associated with the single test point approach. To further improve performance, cost function gradient techniques are applied to guide the selection of potential test points for consideration by the algorithm. Fault simulation of random patterns is used to more accurately distinguish between random pattern testable and random resistant faults, and to provide a more accurate set of initial probabilities for the cost function calculations.

Abstract: An apparatus for measuring a dimension of a workpiece includes a pair of rods positioned within a channel of a baseplate. At least one wedge member is mounted between the rods and forces the rods in a direction away from each other. A guide plate is adjustably mounted with respect to the baseplate, the guide plate having a cutout positioned at least partially over the rods for accepting the workpiece. A measuring tool is adjustably mounted with respect to the baseplate for moving in at least a linear direction.

Abstract: Improved lubrication system for multiplex pumps including lubrication reservoir means, pump means, filtration means and valve means.