Abstract: A method and apparatus for imaging seismic data includes obtaining an initial model of a subsurface formation, wherein the model includes a plurality of nodes that form at least part of a grid; an initial dip value for the nodes; and a set of origin coordinates for each of the nodes; performing bottom-up ray tracing for each node in the model, resulting in a set of arrival coordinates for each node; identifying a plurality of gathers from the seismic data; for each gather: calculating a set of midpoint coordinates; defining a midpoint vicinity surrounding the set of midpoint coordinates; identifying the nodes having arrival coordinates within the midpoint vicinity; and estimating a unique aperture for each of the gathers based on the respective origin coordinates; storing the estimated apertures in a table; and generating a subsurface volume or image with subsurface reflectors determined with apertures of the respective gathers.

Abstract: A method and apparatus for imaging seismic data includes obtaining an initial model of a subsurface formation, wherein the model includes a plurality of nodes that form at least part of a grid; an initial dip value for the nodes; and a set of origin coordinates for each of the nodes; performing bottom-up ray tracing for each node in the model, resulting in a set of arrival coordinates for each node; identifying a plurality of gathers from the seismic data; for each gather: calculating a set of midpoint coordinates; defining a midpoint vicinity surrounding the set of midpoint coordinates; identifying the nodes having arrival coordinates within the midpoint vicinity; and estimating a unique aperture for each of the gathers based on the respective origin coordinates; storing the estimated apertures in a table; and generating a subsurface volume or image with subsurface reflectors determined with apertures of the respective gathers.

Abstract: Systems and methods for performing semiconductor laser annealing using dual loop control are disclosed. The first control loop operates at a first frequency and controls the output of the laser and controls the 1/f laser noise. The second control loop also controls the amount of output power in the laser and operates at second frequency lower than the first frequency. The second control loop measures the thermal emission of the wafer over an area the size of one or more die so that within-die emissivity variations are average out when determining the measured annealing temperature. The measured annealing temperature and an annealing temperature set point are used to generate the control signal for the second control loop.

Abstract: Systems and methods for measuring an intensity characteristic of a light beam are disclosed. The methods include directing the light beam into a prism assembly that includes a thin prism sandwiched by two transparent plates, and reflecting a portion of the light beam by total-internal-reflection surface to an integrating sphere while transmitting the remaining portion of the light beam through the two transparent plates to a beam dump. The method also includes detecting light captured by the integrating sphere and determining the intensity characteristic from the detected light.

Abstract: Systems and methods for measuring an intensity characteristic of a light beam are disclosed. The methods include directing the light beam into a prism assembly that includes a thin prism sandwiched by two transparent plates, and reflecting a portion of the light beam by total-internal-reflection surface to an integrating sphere while transmitting the remaining portion of the light beam through the two transparent plates to a beam dump. The method also includes detecting light captured by the integrating sphere and determining the intensity characteristic from the detected light.

Abstract: Systems and methods for performing semiconductor laser annealing using dual loop control are disclosed. The first control loop operates at a first frequency and controls the output of the laser and controls the 1/f laser noise. The second control loop also controls the amount of output power in the laser and operates at second frequency lower than the first frequency. The second control loop measures the thermal emission of the wafer over an area the size of one or more die so that within-die emissivity variations are average out when determining the measured annealing temperature. The measured annealing temperature and an annealing temperature set point are used to generate the control signal for the second control loop.

Abstract: Systems and methods for performing semiconductor laser annealing using dual loop control are disclosed. The first control loop operates at a first frequency and controls the output of the laser and controls the 1/f laser noise. The second control loop also controls the amount of output power in the laser and operates at second frequency lower than the first frequency. The second control loop measures the thermal emission of the wafer over an area the size of one or more die so that within-die emissivity variations are average out when determining the measured annealing temperature. The measured annealing temperature and an annealing temperature set point are used to generate the control signal for the second control loop.

Abstract: A Simulated Custom Wheel suitable for automotive wheels or truck wheels is described and which is suitable for use on either Ford wheels of General Motor wheels. A unique retainer ring is placed against a decorative cover which is placed adjacent to the wheel. The ring has a flanged rim on the periphery which defines a shoulder portion. The flanged rim is positioned so as to point away from the wheel, and the lug nuts are assembled in the conventional fashion for the Ford wheels. The General Motor wheels use a solid retainer plate against the retainer ring. A universal center hub also having a flanged rim on the periphery defining a shoulder portion is adapted to frictionally engage the shoulder portion on the retainer ring whereby the center hub is supported and held only by the frictional relationship existing between the shoulder on the retaining ring and the shoulder portion on the center hub.

Abstract: A Simulated Custom Wheel suitable for automotive wheels or truck wheels is described and which is suitable for use on either Ford wheels of General Motor wheels. A unique retainer ring is placed against a decorative cover which is placed adjacent to the wheel. The ring has a flange rim on the periphery which defines a shoulder portion. The flanged rim is positioned so as to point away from the wheel, and the lug nuts are assembled in the conventional fashion for the Ford wheels. The General Motor wheels use a solid retainer plate against the retainer ring. A universal center hub also having a flanged rim on the periphery defining a shoulder portion is adapted to fricitionally engage the shoulder portion on the retainer ring whereby the center hub is supported and held only by the frictional relationship existing between the shoulder on the retaining ring and the shoulder portion on the center hub.