Abstract: A coordinate measuring machine for measuring coordinates or properties of a workpiece includes an extended stylus. The extended stylus includes an extension element and a connection element. The extension element includes a carrier portion mounted at the connection element so as to be rotatable about an axis of rotation. The extension element includes, on a side remote from the connection element, a shaft portion that is aligned so as to deviate from the axis of rotation. The coordinate measuring machine includes a measurement head to which the extended stylus is attached. The measurement head is configured to measure deflections of the stylus resulting from contacts of the extended stylus to the workpiece.

Abstract: A coordinate measuring machine for measuring coordinates or properties of a workpiece includes an extended stylus. The extended stylus includes an extension element and a connection element. The extension element includes a carrier portion mounted at the connection element so as to be rotatable about an axis of rotation. The extension element includes, on a side remote from the connection element, a shaft portion that is aligned so as to deviate from the axis of rotation. The coordinate measuring machine includes a measurement head to which the extended stylus is attached. The measurement head is configured to measure deflections of the stylus resulting from contacts of the extended stylus to the workpiece.

Abstract: A probe system for measuring a measurement object in optical and tactile fashion is provided which includes a tactile sensor. The tactile sensor includes a tactile probe element. The tactile probe element has a sensor surface and is configured to probe the measurement object in a tactile fashion at at least one probing point on the sensor surface. The probe system further includes a microscope camera which includes an illumination device configured to produce an illumination light beam. The microscope camera further includes a microscope optical unit configured to focus the illumination light beam in the probing point and to produce a magnified image of the measurement object in an image plane. The microscope camera also includes an image capture device configured to record the magnified image and is at least partly arranged in the tactile probe element.

Abstract: A probe system for measuring a measurement object in optical and tactile fashion is provided which includes a tactile sensor. The tactile sensor includes a tactile probe element. The tactile probe element has a sensor surface and is configured to probe the measurement object in a tactile fashion at at least one probing point on the sensor surface. The probe system further includes a microscope camera which includes an illumination device configured to produce an illumination light beam. The microscope camera further includes a microscope optical unit configured to focus the illumination light beam in the probing point and to produce a magnified image of the measurement object in an image plane. The microscope camera also includes an image capture device configured to record the magnified image and is at least partly arranged in the tactile probe element.

Abstract: A measuring machine (10), in particular a coordinate measuring machine, has at least one optical sensor (34) for recording an image in an image capturing region (80) during an image recording time period (86), a control signal transducer (89) which provides a control signal that represents the image recording time period (86), a measurement illumination arrangement (96) for illuminating the image capturing region (80), and a control device (19). The control device (19) is configured to switch on the measurement illumination arrangement (96) during the image recording time period (86) in a manner dependent on the control signal. The control device is further configured to switch on at least one further illumination arrangement (97, 98, 100, 102) temporally outside of the image recording time period (86) in a manner dependent on the control signal. A corresponding measurement system and method for controlling the illumination are also discussed.

Abstract: A measuring machine (10), in particular a coordinate measuring machine, has at least one optical sensor (34) for recording an image in an image capturing region (80) during an image recording time period (86), a control signal transducer (89) which provides a control signal that represents the image recording time period (86), a measurement illumination arrangement (96) for illuminating the image capturing region (80), and a control device (19). The control device (19) is configured to switch on the measurement illumination arrangement (96) during the image recording time period (86) in a manner dependent on the control signal. The control device is further configured to switch on at least one further illumination arrangement (97, 98, 100, 102) temporally outside of the image recording time period (86) in a manner dependent on the control signal. A corresponding measurement system and method for controlling the illumination are also discussed.