Patents by Inventor David H. Rogoff

David H. Rogoff has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • VLSI component tester with average current measuring capability
    Patent number: 5528136
    Abstract: Automatic test equipment including a circuit to measure average current consumed by a device under test. The circuit operates during the execution of a test pattern which is not dedicated to measuring average current. The average current measuring circuit sets the measurement interval to account for a lag between the current drawn by the device under test and the current being measured.
    Type: Grant
    Filed: October 6, 1994
    Date of Patent: June 18, 1996
    Assignee: Teradyne, Inc.
    Inventors: David H. Rogoff, Edward A. Ostertag