Patents by Inventor David Hoyal

David Hoyal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8370121
    Abstract: The invention is a method of modeling a hydrocarbon reservoir. A parameter value in a set of equations is adjusted so that the output of the equations accurately matches observed sediment erosion and deposition behavior for sediment sizes throughout a range of about 10 microns to about 10 centimeters. An initial condition of a sediment bed in the hydrocarbon reservoir is defined. The equations are applied to the initial condition, wherein outputs of the equations express how a fluid flow affects erosion and deposition of sediments at the initial condition. The initial condition is adjusted based on the equation outputs to create a subsequent sediment bed condition. The equations are re-applied to the subsequent sediment bed condition a pre-determined number of times. The subsequent sediment bed condition is re-adjusted after each re-application of the equations. The model of the hydrocarbon reservoir is created and outputted.
    Type: Grant
    Filed: November 16, 2009
    Date of Patent: February 5, 2013
    Assignee: ExxonMobil Upstream Research Company
    Inventors: Tao Sun, Dachang Li, David Hoyal
  • Publication number: 20070219725
    Abstract: A method is disclosed for simulating the formation of sedimentary deposits. In one embodiment, this method involves, (a) solving a two-dimensional time-dependent map view system of equations for at least flow momentum, flow height, suspended sediment concentration, and entrainment of overlying water, (b) calculating net sediment deposition at each map view location using the flow properties, (c) recording the time-variability of the net sediment deposition.
    Type: Application
    Filed: August 23, 2005
    Publication date: September 20, 2007
    Inventors: Tao Sun, Dachang Li, Max Deffenbaugh, Chun Huh, David Hoyal, Neal Adair, Xiao-Hui Wu, Timothy Chartrand, John Van Wagoner
  • Publication number: 20060265131
    Abstract: A method to determine the properties of a water-lain sediment body from a measurement of grain size distribution and deposit thickness at one location in the body is disclosed. In one embodiment, the method comprises (a) determining the flow properties at the measured location, (b) extrapolating the flow properties back to the inlet through which the depositing flow was emitted, (c) determining at least one property of the water-lain sediment throughout the sediment body by modeling the flow properties using the extrapolated flow properties at the inlet from step (b) as a boundary condition. The flow properties associated with the sediment body include flow velocity, suspended sediment volume fractions, deposition time, and flow height. The properties of the water-lain sediments include, in addition to the flow properties associated with deposition of the sediments, the thickness of the sediment body, the size of the body, the shape of the body, and the grain size distribution at each point within the body.
    Type: Application
    Filed: March 18, 2004
    Publication date: November 23, 2006
    Applicant: EXXON MOBIL UPSTREAM RESEARCH COMPANY
    Inventors: Max Deffenbaugh, David Hoyal, Neal Adair, Chun Huh
  • Publication number: 20060173622
    Abstract: The present invention is a method for predicting the grain size distribution at a designated location within a water-lain sedimentary deposit. Initially, the vertical thickness of the sedimentary deposit at the designated location must be determined, as well as the vertical thickness and grain size distribution at a second location different from the designated location. Second, a distance parameter corresponding to the two locations must be determined. Finally the distance parameter is used, along with the initially determined vertical thickness at both locations and the grain size distribution at the second location to calculate the grain size distribution at the designated location.
    Type: Application
    Filed: February 20, 2004
    Publication date: August 3, 2006
    Inventors: Max Deffenbaugh, William Heard, Chun Huh, Tao Sun, David Hoyal