Patents by Inventor David Hult

David Hult has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20070103665
    Abstract: A system and method for uniformity correction is provided. The system includes a plurality of winged correction elements inserted into the illumination field in a defined configuration. Adjacent winged correction elements are overlapped to minimize induced uniformity ripple. Each winged correction element has a first protrusion on a longitudinal edge of the correction element and a second protrusion on the opposite longitudinal edge. The slope of a sloped edge of the first protrusion and the slope of a sloped edge of the second protrusion are tied to the slope of a gradient in the non-uniformity profile of the illumination field. In addition, the angles defined by the flat tip of the correction element and the sloped edge of the first and second protrusions are tied to the angle of a gradient of the illumination field.
    Type: Application
    Filed: December 7, 2005
    Publication date: May 10, 2007
    Applicant: ASML Holding N.V.
    Inventors: Richard Zimmerman, Eric Catey, David Hult, Alexander Kremer, Heine Mulder, Hendrikus Greevenbroek, Roberto Wiener
  • Publication number: 20070097345
    Abstract: Provided is a reticle masking blade system, including a reticle-masking blade device. Also included is a detector array mounted on an edge of a blade of the blade device.
    Type: Application
    Filed: October 27, 2005
    Publication date: May 3, 2007
    Applicant: ASML Holding N.V.
    Inventor: David Hult
  • Publication number: 20060146309
    Abstract: Provided are a method and system for projecting an illumination beam to an image plane. The method includes producing a sample of the illumination beam and projecting the sample to a secondary image plane. Next, an illumination uniformity profile associated with the projected sample is measured while the received illumination beam is being projected to the image plane.
    Type: Application
    Filed: January 6, 2005
    Publication date: July 6, 2006
    Applicant: ASML Holding N.V.
    Inventor: David Hult
  • Patent number: 6239863
    Abstract: A removable cover for protecting a reticle used in a lithography system is described. The removable cover includes a frame and a membrane supported by the frame. The membrane is transparent to an inspection wavelength such that the reticle can be inspected with the removable cover in place. This removable cover protects the reticle when the removable cover is in place and is removable for lithographic exposure. The removable cover can further include at least one reticle fastener that applies force to the reticle thereby preventing movement of the removable cover relative to the reticle when the removable cover is in place. A plurality of fasteners are used to position and secure the removable cover and reticle. A method of performing lithography and a lithographic system are also described.
    Type: Grant
    Filed: December 29, 1999
    Date of Patent: May 29, 2001
    Assignee: Silicon Valley Group, Inc.
    Inventors: Eric B. Catey, David Hult, Santiago del Puerto, Stephen Roux