Patents by Inventor David Hung

David Hung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240152186
    Abstract: A security apparatus for securing a portable electronic device to an immovable object includes a locking head having a base, a stabilizing element extending axially from the base, and a movable engagement element partially contained within the stabilizing element. The stabilizing element includes a first end adjacent the base and a second end opposite the first end. The movable engagement element extends from the first end of the stabilizing element to the second end of the stabilizing element. The movable engagement element is movable between an unlocked configuration, in which the movable engagement element is closer to the stabilizing element and the locking head is insertable into the portable electronic device, and a locked configuration, in which the movable engagement element is further from the stabilizing element and the locking head is secured to the portable electronic device.
    Type: Application
    Filed: January 12, 2024
    Publication date: May 9, 2024
    Inventors: John Hung, Ryan White, Guillermo Andres, David Thomas Dobson, Jacque Gagne
  • Patent number: 11939594
    Abstract: The present application relates to plasma cells and plasma cell precursors that express a macromolecule, such as a protein, protein mimetic or a peptide and compositions comprising these plasma cells or plasma cell precursors. The application further relates to methods of using and making the plasma cells and plasma cell precursors that express the macromolecule. Methods of treatment comprising administering the plasma cells or plasma cell precursors are also contemplated.
    Type: Grant
    Filed: March 14, 2018
    Date of Patent: March 26, 2024
    Assignee: Seattle Children's Hospital
    Inventors: David J. Rawlings, Richard James, Shaun W. Jackson, Iram Khan, King Hung, Andrew M. Scharenberg
  • Patent number: 11941572
    Abstract: Various embodiments are disclosed for providing machine learning routines with peripheral device data to infer driver activity and location. Peripheral device data may be collected on a peripheral device having a machine learning routine executing thereon to infer driver activity and perform improved estimation of driver location. Using driver activity and location estimation, contextually relevant delivery workflow assistance may be automatically provided to a delivery driver or other individual without requiring manual input, thereby improving driver safety and operational efficiency.
    Type: Grant
    Filed: March 16, 2021
    Date of Patent: March 26, 2024
    Assignee: AMAZON TECHNOLOGIES, INC.
    Inventors: Ruth Ravichandran, Hebaallah Aly Abdelhalim Aly Ismail, Zheng Wang, Shao-Wen Yang, Yang Pan, David Hung Huynh, Andrey Li, Hoshgeldy Tagangeldyevich Tachmuradov, Steven Larson
  • Patent number: 11924104
    Abstract: This application relates to a distributed software-defined network (“DSDN”) for dynamically configuring and managing a wireless communication network. A plurality of DSDN nodes are connected to each other via a plurality of communication paths. Each communication path directly connects two DSDN nodes. Each DSDN node can provide DSDN configurations across diverse and disparate networks by normalizing its data plane network traffic through translation and packet encapsulation. Furthermore, the DSDN node can provide an architecture tolerant of network interruptions and network system fluctuations. For example, in the case of any one of the DSDN node's network interruptions from other DSDN nodes, the DSDN can provide network reconfiguration using network configuration rules stored in a control plane of each DSDN node.
    Type: Grant
    Filed: November 2, 2022
    Date of Patent: March 5, 2024
    Assignee: MIMYR, LLC
    Inventors: Robert Kunc, Andrew Hung, David Wang, Michael Mavraganis
  • Patent number: 11834458
    Abstract: The disclosure relates to anti-cancer compounds derived from nuclear steroid receptor binders, to products containing the same, as well as to methods of their use and preparation.
    Type: Grant
    Filed: March 22, 2022
    Date of Patent: December 5, 2023
    Assignee: NUVATION BIO INC.
    Inventors: David Hung, Jayakanth Kankanala, Christopher Paul Miller, Jeremy David Pettigrew, Son Minh Pham, Ihab S. Darwish
  • Patent number: 11826430
    Abstract: The disclosure relates to anti-cancer compounds derived from nuclear steroid receptor binders, to products containing the same, as well as to methods of their use and preparation.
    Type: Grant
    Filed: May 13, 2020
    Date of Patent: November 28, 2023
    Assignee: NUVATION BIO INC.
    Inventors: David Hung, Son Minh Pham, Sarvajit Chakravarty, Jiyun Chen, Jayakanth Kankanala, Jeremy D. Pettigrew, Anup Barde, Anjan Kumar Nayak
  • Publication number: 20230122310
    Abstract: The disclosure relates to anti-cancer compounds derived from nuclear steroid receptor binders, to products containing the same, as well as to methods of their use and preparation.
    Type: Application
    Filed: November 22, 2022
    Publication date: April 20, 2023
    Inventors: David Hung, Son Minh Pham, Sarvajit Chakravarty, Jiyun Chen, Jayakanth Kankanala, Anup Barde, Anjan Kumar Nayak
  • Patent number: 11525668
    Abstract: A method of performing metrology analysis of a thin film includes coupling a radiation into an optical element disposed adjacent to a surface of the thin film. The radiation is coupled such that the radiation is totally internally reflected at an interface between the optical element and the thin film. An evanescent radiation generated at the interface penetrates the thin film. The method furthers include analyzing the evanescent radiation scattered by the thin film to obtain properties of the thin film.
    Type: Grant
    Filed: January 4, 2021
    Date of Patent: December 13, 2022
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Ji-Feng Ying, Baohua Niu, David Hung-I Su
  • Publication number: 20220380364
    Abstract: The disclosure relates to anti-cancer compounds derived from nuclear steroid receptor binders, to products containing the same, as well as to methods of their use and preparation.
    Type: Application
    Filed: May 2, 2022
    Publication date: December 1, 2022
    Inventors: David Hung, Jayakanth Kankanala, Christopher Paul Miller, Jeremy David Pettigrew, Son Minh Pham
  • Publication number: 20220340587
    Abstract: The disclosure relates to anti-cancer compounds derived from nuclear steroid receptor binders, to products containing the same, as well as to methods of their use and preparation.
    Type: Application
    Filed: March 22, 2022
    Publication date: October 27, 2022
    Inventors: David Hung, Jayakanth Kankanala, Christopher Paul Miller, Jeremy David Pettigrew, Son Minh Pham, Ihab S. Darwish
  • Publication number: 20210148695
    Abstract: A method of performing metrology analysis of a thin film includes coupling a radiation into an optical element disposed adjacent to a surface of the thin film. The radiation is coupled such that the radiation is totally internally reflected at an interface between the optical element and the thin film. An evanescent radiation generated at the interface penetrates the thin film. The method furthers include analyzing the evanescent radiation scattered by the thin film to obtain properties of the thin film.
    Type: Application
    Filed: January 4, 2021
    Publication date: May 20, 2021
    Inventors: Ji-Feng YING, Baohua NIU, David Hung-I SU
  • Patent number: 10883820
    Abstract: A method of performing metrology analysis of a thin film includes coupling a radiation into an optical element disposed adjacent to a surface of the thin film. The radiation is coupled such that the radiation is totally internally reflected at an interface between the optical element and the thin film. An evanescent radiation generated at the interface penetrates the thin film. The method furthers include analyzing the evanescent radiation scattered by the thin film to obtain properties of the thin film.
    Type: Grant
    Filed: February 28, 2018
    Date of Patent: January 5, 2021
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Baohua Niu, Ji-Feng Ying, David Hung-I Su
  • Publication number: 20200360523
    Abstract: The disclosure relates to anti-cancer compounds derived from nuclear steroid receptor binders, to products containing the same, as well as to methods of their use and preparation.
    Type: Application
    Filed: May 13, 2020
    Publication date: November 19, 2020
    Inventors: David Hung, Son Minh Pham, Sarvajit Chakravarty, Jiyun Chen, Jayakanth Kankanala, Jeremy D. Pettigrew, Anup Barde, Anjan Kumar Nayak
  • Patent number: 10679820
    Abstract: A method includes applying a voltage to a wafer or a device under test (DUT). The wafer or the DUT is illuminated with an electron beam after applying the voltage to the wafer or the DUT. Cathodoluminescent light emitted from the wafer or the DUT in response to the electron beam is detected. One or more characteristics of the wafer or the DUT are determined based on the detected cathodoluminescent light.
    Type: Grant
    Filed: November 15, 2018
    Date of Patent: June 9, 2020
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Bao-Hua Niu, Jung-Hsiang Chuang, David Hung-I Su
  • Publication number: 20190375732
    Abstract: The disclosure relates to anti-cancer compounds derived from nuclear steroid receptor binders, to products containing the same, as well as to methods of their use and preparation.
    Type: Application
    Filed: May 14, 2019
    Publication date: December 12, 2019
    Inventor: David Hung
  • Publication number: 20190145756
    Abstract: A method of performing metrology analysis of a thin film includes coupling a radiation into an optical element disposed adjacent to a surface of the thin film. The radiation is coupled such that the radiation is totally internally reflected at an interface between the optical element and the thin film. An evanescent radiation generated at the interface penetrates the thin film. The method furthers include analyzing the evanescent radiation scattered by the thin film to obtain properties of the thin film.
    Type: Application
    Filed: February 28, 2018
    Publication date: May 16, 2019
    Inventors: Baohua NIU, Ji-Feng YING, David Hung-I SU
  • Publication number: 20190103248
    Abstract: A method includes applying a voltage to a wafer or a device under test (DUT). The wafer or the DUT is illuminated with an electron beam after applying the voltage to the wafer or the DUT. Cathodoluminescent light emitted from the wafer or the DUT in response to the electron beam is detected. One or more characteristics of the wafer or the DUT are determined based on the detected cathodoluminescent light.
    Type: Application
    Filed: November 15, 2018
    Publication date: April 4, 2019
    Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Bao-Hua NIU, Jung-Hsiang CHUANG, David Hung-I SU
  • Patent number: 10141158
    Abstract: A wafer and DUT inspection apparatus and a wafer and DUT inspection method using thereof are provided. The apparatus includes a vacuum chamber, a stage, an electron gun, a lens system, an optical mirror and a detector. In the vacuum chamber, the stage is disposed near a first end, and the electron gun is disposed near a second end opposite to the first end. The lens system disposed between the stage and the electron gun is a total reflective achromatic lens system including a first lens and a second lens. The second lens having a second aperture is disposed between the electron gun and the first lens having a first aperture aligned with the second aperture. The optical mirror is disposed between the lens system and the electron gun. The detector is horizontally aligned with the optical mirror and configured to detect cathodoluminescence reflected from the optical mirror.
    Type: Grant
    Filed: March 21, 2017
    Date of Patent: November 27, 2018
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Bao-Hua Niu, Jung-Hsiang Chuang, David Hung-I Su
  • Publication number: 20180158647
    Abstract: A wafer and DUT inspection apparatus and a wafer and DUT inspection method using thereof are provided. The apparatus includes a vacuum chamber, a stage, an electron gun, a lens system, an optical mirror and a detector. In the vacuum chamber, the stage is disposed near a first end, and the electron gun is disposed near a second end opposite to the first end. The lens system disposed between the stage and the electron gun is a total reflective achromatic lens system including a first lens and a second lens. The second lens having a second aperture is disposed between the electron gun and the first lens having a first aperture aligned with the second aperture. The optical mirror is disposed between the lens system and the electron gun. The detector is horizontally aligned with the optical mirror and configured to detect cathodoluminescence reflected from the optical mirror.
    Type: Application
    Filed: March 21, 2017
    Publication date: June 7, 2018
    Inventors: Bao-Hua Niu, Jung-Hsiang Chuang, David Hung-I Su
  • Publication number: 20170119907
    Abstract: This disclosure describes compositions and methods for delivering and localizing therapeutic agents to therapeutic targets. This disclosure also provides multivalent forms of cationic dyes (“cationic dye multimers”) and methods by which these compounds can be used to treat joint injuries.
    Type: Application
    Filed: January 28, 2015
    Publication date: May 4, 2017
    Applicant: Medivation Technologies, Inc.
    Inventors: David Hung, Sarvajit Chakravarty, Roopa Rai, Sebastian Bernales, Balaji Dashrath Sathe, Gonzalo Ureta, Emma McCullagh