Patents by Inventor David I-Chun Lee

David I-Chun Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for factory calibration or reduced calibration of an indwelling sensor based on sensitivity profile and baseline model of sensors
    Patent number: 11974845
    Abstract: Systems and methods are disclosed which provide for a “factory-calibrated” sensor. In doing so, the systems and methods include predictive prospective modeling of sensor behavior, and also include predictive modeling of physiology. With these two correction factors, a consistent determination of sensitivity can be achieved, thus achieving factory calibration.
    Type: Grant
    Filed: July 6, 2021
    Date of Patent: May 7, 2024
    Assignee: Dexcom, Inc.
    Inventors: Rui Ma, Naresh C. Bhavaraju, Thomas Stuart Hamilton, Jonathan Hughes, Jeff Jackson, David I-Chun Lee, Peter C. Simpson, Stephen J. Vanslyke
  • Automatic analyte sensor calibration and error detection
    Patent number: 11714060
    Abstract: Systems and methods are provided that address the need to frequently calibrate analyte sensors, according to implementation. In more detail, systems and methods provide a preconnected analyte sensor system that physically combines an analyte sensor to measurement electronics during the manufacturing phase of the sensor and in some cases in subsequent life phases of the sensor, so as to allow an improved recognition of sensor environment over time to improve subsequent calibration of the sensor.
    Type: Grant
    Filed: May 2, 2019
    Date of Patent: August 1, 2023
    Assignee: Dexcom, Inc.
    Inventors: Naresh C. Bhavaraju, Becky L. Clark, Vincent P. Crabtree, Chris W. Dring, Arturo Garcia, Jason Halac, Jonathan Hughes, Jeff Jackson, Lauren Hruby Jepson, David I-Chun Lee, Ted Tang Lee, Rui Ma, Zebediah L. McDaniel, Jason Mitchell, Andrew Attila Pal, Daiting Rong, Disha B. Sheth, Peter C. Simpson, Stephen J. Vanslyke, Matthew D. Wightlin, Anna Leigh Davis, Hari Hampapuram, Aditya Sagar Mandapaka, Alexander Leroy Teeter, Liang Wang
  • Automatic analyte sensor calibration and error detection
    Patent number: 11656195
    Abstract: Systems and methods are provided that address the need to frequently calibrate analyte sensors, according to implementation. In more detail, systems and methods provide a preconnected analyte sensor system that physically combines an analyte sensor to measurement electronics during the manufacturing phase of the sensor and in some cases in subsequent life phases of the sensor, so as to allow an improved recognition of sensor environment over time to improve subsequent calibration of the sensor.
    Type: Grant
    Filed: May 2, 2019
    Date of Patent: May 23, 2023
    Assignee: Dexcom, Inc.
    Inventors: Naresh C. Bhavaraju, Becky L. Clark, Vincent P. Crabtree, Chris W. Dring, Arturo Garcia, Jason Halac, Jonathan Hughes, Jeff Jackson, Lauren Hruby Jepson, David I-Chun Lee, Ted Tang Lee, Rui Ma, Zebediah L. McDaniel, Jason Mitchell, Andrew Attila Pal, Daiting Rong, Disha B. Sheth, Peter C. Simpson, Stephen J. Vanslyke, Matthew D. Wightlin, Anna Leigh Davis, Hari Hampapuram, Aditya Sagar Mandapaka, Alexander Leroy Teeter, Liang Wang
  • SYSTEM AND METHOD FOR FACTORY CALIBRATION OR REDUCED CALIBRATION OF AN INDWELLING SENSOR BASED ON SENSITIVITY PROFILE AND BASELINE MODEL OF SENSORS
    Publication number: 20210330219
    Abstract: Systems and methods are disclosed which provide for a “factory-calibrated” sensor. In doing so, the systems and methods include predictive prospective modeling of sensor behavior, and also include predictive modeling of physiology. With these two correction factors, a consistent determination of sensitivity can be achieved, thus achieving factory calibration.
    Type: Application
    Filed: July 6, 2021
    Publication date: October 28, 2021
    Inventors: Rui Ma, Naresh C. Bhavaraju, Thomas Stuart Hamilton, Jonathan Hughes, Jeff Jackson, David I-Chun Lee, Peter C. Simpson, Stephen J. Vanslyke
  • System and method for factory calibration or reduced calibration of an indwelling sensor based on sensitivity profile and baseline model of sensors
    Patent number: 11051731
    Abstract: Systems and methods are disclosed which provide for a “factory-calibrated” sensor. In doing so, the systems and methods include predictive prospective modeling of sensor behavior, and also include predictive modeling of physiology. With these two correction factors, a consistent determination of sensitivity can be achieved, thus achieving factory calibration.
    Type: Grant
    Filed: June 24, 2020
    Date of Patent: July 6, 2021
    Assignee: DexCom, Inc.
    Inventors: Rui Ma, Naresh C. Bhavaraju, Thomas Stuart Hamilton, Jonathan Hughes, Jeff Jackson, David I-Chun Lee, Peter C. Simpson, Stephen J. Vanslyke
  • SYSTEM AND METHOD FOR FACTORY CALIBRATION OR REDUCED CALIBRATION OF AN INDWELLING SENSOR BASED ON SENSITIVITY PROFILE AND BASELINE MODEL OF SENSORS
    Publication number: 20200323470
    Abstract: Systems and methods are disclosed which provide for a “factory-calibrated” sensor. In doing so, the systems and methods include predictive prospective modeling of sensor behavior, and also include predictive modeling of physiology. With these two correction factors, a consistent determination of sensitivity can be achieved, thus achieving factory calibration.
    Type: Application
    Filed: June 24, 2020
    Publication date: October 15, 2020
    Inventors: Rui Ma, Naresh C. Bhavaraju, Thomas Stuart Hamilton, Jonathan Hughes, Jeff Jackson, David I-Chun Lee, Peter C. Simpson, Stephen J. Vanslyke
  • System and method for factory calibration or reduced calibration of an indwelling sensor based on sensitivity profile and baseline model of sensors
    Patent number: 10729364
    Abstract: Systems and methods are disclosed which provide for a “factory-calibrated” sensor. In doing so, the systems and methods include predictive prospective modeling of sensor behavior, and also include predictive modeling of physiology. With these two correction factors, a consistent determination of sensitivity can be achieved, thus achieving factory calibration.
    Type: Grant
    Filed: May 8, 2019
    Date of Patent: August 4, 2020
    Assignee: DexCom, Inc.
    Inventors: Rui Ma, Naresh C. Bhavaraju, Thomas Stuart Hamilton, Jonathan Hughes, Jeff Jackson, David I-Chun Lee, Peter C. Simpson, Stephen J. Vanslyke
  • AUTOMATIC ANALYTE SENSOR CALIBRATION AND ERROR DETECTION
    Publication number: 20190339221
    Abstract: Systems and methods are provided that address the need to frequently calibrate analyte sensors, according to implementation. In more detail, systems and methods provide a preconnected analyte sensor system that physically combines an analyte sensor to measurement electronics during the manufacturing phase of the sensor and in some cases in subsequent life phases of the sensor, so as to allow an improved recognition of sensor environment over time to improve subsequent calibration of the sensor.
    Type: Application
    Filed: May 2, 2019
    Publication date: November 7, 2019
    Inventors: Naresh C. Bhavaraju, Becky L. Clark, Vincent P. Crabtree, Chris W. Dring, Arturo Garcia, Jason Halac, Jonathan Hughes, Jeff Jackson, Lauren Hruby Jepson, David I-Chun Lee, Ted Tang Lee, Rui Ma, Zebediah L. McDaniel, Jason Mitchell, Andrew Attila Pal, Daiting Rong, Disha B. Sheth, Peter C. Simpson, Stephen J. Vanslyke, Matthew D. Wightlin, Anna Leigh Davis, Hari Hampapuram, Aditya Sagar Mandapaka, Alexander Leroy Teeter, Liang Wang
  • AUTOMATIC ANALYTE SENSOR CALIBRATION AND ERROR DETECTION
    Publication number: 20190339222
    Abstract: Systems and methods are provided that address the need to frequently calibrate analyte sensors, according to implementation. In more detail, systems and methods provide a preconnected analyte sensor system that physically combines an analyte sensor to measurement electronics during the manufacturing phase of the sensor and in some cases in subsequent life phases of the sensor, so as to allow an improved recognition of sensor environment over time to improve subsequent calibration of the sensor.
    Type: Application
    Filed: May 2, 2019
    Publication date: November 7, 2019
    Inventors: Naresh C. Bhavaraju, Becky L. Clark, Vincent P. Crabtree, Chris W. Dring, Arturo Garcia, Jason Halac, Jonathan Hughes, Jeff Jackson, Lauren Hruby Jepson, David I-Chun Lee, Ted Tang Lee, Rui Ma, Zebediah L. McDaniel, Jason Mitchell, Andrew Attila Pal, Daiting Rong, Disha B. Sheth, Peter C. Simpson, Stephen J. Vanslyke, Matthew D. Wightlin, Anna Leigh Davis, Hari Hampapuram, Aditya Sagar Mandapaka, Alexander Leroy Teeter, Liang Wang
  • AUTOMATIC ANALYTE SENSOR CALIBRATION AND ERROR DETECTION
    Publication number: 20190339223
    Abstract: Systems and methods are provided that address the need to frequently calibrate analyte sensors, according to implementation. In more detail, systems and methods provide a preconnected analyte sensor system that physically combines an analyte sensor to measurement electronics during the manufacturing phase of the sensor and in some cases in subsequent life phases of the sensor, so as to allow an improved recognition of sensor environment over time to improve subsequent calibration of the sensor.
    Type: Application
    Filed: May 2, 2019
    Publication date: November 7, 2019
    Inventors: Naresh C. Bhavaraju, Becky L. Clark, Vincent P. Crabtree, Chris W. Dring, Arturo Garcia, Jason Halac, Jonathan Hughes, Jeff Jackson, Lauren Hruby Jepson, David I-Chun Lee, Ted Tang Lee, Rui Ma, Zebediah L. McDaniel, Jason Mitchell, Andrew Attila Pal, Daiting Rong, Disha B. Sheth, Peter C. Simpson, Stephen J. Vanslyke, Matthew D. Wightlin, Anna Leigh Davis, Hari Hampapuram, Aditya Sagar Mandapaka, Alexander Leroy Teeter, Liang Wang
  • AUTOMATIC ANALYTE SENSOR CALIBRATION AND ERROR DETECTION
    Publication number: 20190339224
    Abstract: Systems and methods are provided that address the need to frequently calibrate analyte sensors, according to implementation. In more detail, systems and methods provide a preconnected analyte sensor system that physically combines an analyte sensor to measurement electronics during the manufacturing phase of the sensor and in some cases in subsequent life phases of the sensor, so as to allow an improved recognition of sensor environment over time to improve subsequent calibration of the sensor.
    Type: Application
    Filed: May 2, 2019
    Publication date: November 7, 2019
    Inventors: Naresh C. Bhavaraju, Becky L. Clark, Vincent P. Crabtree, Chris W. Dring, Arturo Garcia, Jason Halac, Jonathan Hughes, Jeff Jackson, Lauren Hruby Jepson, David I-Chun Lee, Ted Tang Lee, Rui Ma, Zebediah L. McDaniel, Jason Mitchell, Andrew Attila Pal, Daiting Rong, Disha B. Sheth, Peter C. Simpson, Stephen J. Vanslyke, Matthew D. Wightlin, Anna Leigh Davis, Hari Hampapuram, Aditya Sagar Mandapaka, Alexander Leroy Teeter, Liang Wang
  • SYSTEM AND METHOD FOR FACTORY CALIBRATION OR REDUCED CALIBRATION OF AN INDWELLING SENSOR BASED ON SENSITIVITY PROFILE AND BASELINE MODEL OF SENSORS
    Publication number: 20190261904
    Abstract: Systems and methods are disclosed which provide for a “factory-calibrated” sensor. In doing so, the systems and methods include predictive prospective modeling of sensor behavior, and also include predictive modeling of physiology. With these two correction factors, a consistent determination of sensitivity can be achieved, thus achieving factory calibration.
    Type: Application
    Filed: May 8, 2019
    Publication date: August 29, 2019
    Inventors: Rui Ma, Naresh C. Bhavaraju, Thomas Stuart Hamilton, Jonathan Hughes, Jeff Jackson, David I-Chun Lee, Peter C. Simpson, Stephen J. Vanslyke
  • System and method for factory calibration or reduced calibration of an indwelling sensor based on sensitivity profile and baseline model of sensors
    Patent number: 10362975
    Abstract: Systems and methods are disclosed which provide for a “factory-calibrated” sensor. In doing so, the systems and methods include predictive prospective modeling of sensor behavior, and also include predictive modeling of physiology. With these two correction factors, a consistent determination of sensitivity can be achieved, thus achieving factory calibration.
    Type: Grant
    Filed: December 29, 2016
    Date of Patent: July 30, 2019
    Assignee: DexCom, Inc.
    Inventors: Rui Ma, Naresh C. Bhavaraju, Thomas Stuart Hamilton, Jonathan Hughes, Jeff Jackson, David I-Chun Lee, Peter C. Simpson, Stephen J. Vanslyke
  • System and method for factory calibration or reduced calibration of an indwelling sensor based on sensitivity profile and baseline model of sensors
    Patent number: 10327687
    Abstract: Systems and methods are disclosed which provide for a “factory-calibrated” sensor. In doing so, the systems and methods include predictive prospective modeling of sensor behavior, and also include predictive modeling of physiology. With these two correction factors, a consistent determination of sensitivity can be achieved, thus achieving factory calibration.
    Type: Grant
    Filed: December 29, 2016
    Date of Patent: June 25, 2019
    Assignee: DexCom, Inc.
    Inventors: Rui Ma, Naresh C. Bhavaraju, Thomas Stuart Hamilton, Jonathan Hughes, Jeff Jackson, David I-Chun Lee, Peter C. Simpson, Stephen J. Vanslyke
  • SYSTEM AND METHOD FOR FACTORY CALIBRATION OR REDUCED CALIBRATION OF AN INDWELLING SENSOR BASED ON SENSITIVITY PROFILE AND BASELINE MODEL OF SENSORS
    Publication number: 20170188906
    Abstract: Systems and methods are disclosed which provide for a “factory-calibrated” sensor. In doing so, the systems and methods include predictive prospective modeling of sensor behavior, and also include predictive modeling of physiology. With these two correction factors, a consistent determination of sensitivity can be achieved, thus achieving factory calibration.
    Type: Application
    Filed: December 29, 2016
    Publication date: July 6, 2017
    Inventors: Rui Ma, Naresh C. Bhavaraju, Thomas Stuart Hamilton, Jonathan Hughes, Jeff Jackson, David I-Chun Lee, Peter C. Simpson, Stephen J. Vanslyke
  • SYSTEM AND METHOD FOR FACTORY CALIBRATION OR REDUCED CALIBRATION OF AN INDWELLING SENSOR BASED ON SENSITIVITY PROFILE AND BASELINE MODEL OF SENSORS
    Publication number: 20170188907
    Abstract: Systems and methods are disclosed which provide for a “factory-calibrated” sensor. In doing so, the systems and methods include predictive prospective modeling of sensor behavior, and also include predictive modeling of physiology. With these two correction factors, a consistent determination of sensitivity can be achieved, thus achieving factory calibration.
    Type: Application
    Filed: December 29, 2016
    Publication date: July 6, 2017
    Inventors: Rui Ma, Naresh C. Bhavaraju, Thomas Stuart Hamilton, Jonathan Hughes, Jeff Jackson, David I-Chun Lee, Peter C. Simpson, Stephen J. Vanslyke