Patents by Inventor David I. Golland

David I. Golland has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5834812
    Abstract: A process for stripping the outer edge of a bonded BESOI wafer. The bonded BESOI wafer comprises a handle wafer, an oxide layer on one surface of the handle wafer, a device layer bonded to the oxide layer, and a p.sup.+ etch-stop layer on the device layer having an exposed face. The process comprises masking the exposed face of the p.sup.+ etch-stop layer, and abrading the periphery of the BESOI wafer to remove edge margins of the p.sup.+ etch-stop layer and device layer.
    Type: Grant
    Filed: March 19, 1997
    Date of Patent: November 10, 1998
    Assignee: SiBond, L.L.C.
    Inventors: David I. Golland, Robert A. Craven, Ronald D. Bartram
  • Patent number: 5668045
    Abstract: A process for stripping the outer edge of a bonded BESOI wafer. The bonded BESOI wafer comprises a handle wafer, an oxide layer on one surface of the handle wafer, a device layer bonded to the oxide layer, and a p.sup.+ etch-stop layer on the device layer having an exposed face. The process comprises masking the exposed face of the p.sup.+ etch-stop layer, and abrading the periphery of the BESOI wafer to remove edge margins of the p.sup.+ etch-stop layer and device layer.
    Type: Grant
    Filed: November 30, 1994
    Date of Patent: September 16, 1997
    Assignee: SiBond, L.L.C.
    Inventors: David I. Golland, Robert A. Craven, Ronald D. Bartram
  • Patent number: 5422316
    Abstract: A semiconductor wafer polisher of the present invention for polishing at least one semiconductor wafer to flatten a first face of the wafer and reduce the thickness of the wafer from an initial thickness t.sub.1 to a predetermined final thickness t.sub.2. The polisher comprises a first surface including a polishing surface portion, a second surface including a second surface portion, and a wafer carrier for holding the semiconductor wafer between the polishing surface portion and the second surface portion. At least one polishing limiter is between the first and second surfaces for limiting the reduction in thickness of the wafer. The wafer carrier and polishing limiter are integrally formed such that the polishing limiter and wafer carrier constitute a single unitary piece.
    Type: Grant
    Filed: March 18, 1994
    Date of Patent: June 6, 1995
    Assignee: MEMC Electronic Materials, Inc.
    Inventors: Ankur H. Desai, Michael S. Wisnieski, David I. Golland
  • Patent number: 4011109
    Abstract: A method for producing steel filaments having a heat treated microstructure is disclosed. The method comprises the steps of providing a steel coil having a carbon content from about 0.30 to about 0.95, percent by weight, scoring the surface of the steel to form a plurality of grooves that delineate continuous longitudinal segments, heat treating the steel to develop an appropriate metallurgical structure, separating the segments into individual filaments by causing the steel to fracture at the grooves, and then passing the filaments through a mechanical straightener.
    Type: Grant
    Filed: November 10, 1975
    Date of Patent: March 8, 1977
    Assignee: Monsanto Company
    Inventors: David I. Golland, Charles J. Runkle, Milan F. Kozak, John A. Schey
  • Patent number: 3953250
    Abstract: A method for producing wire with a small cross-sectional area and good mechanical properties is disclosed. The method comprises the steps of providing metallic coil stock of blackplate thickness with a specific microstructure and an essentially uniform cross-section, positioning in engaging relationship a pair of monolithic cutting rolls, feeding the stock into the nip formed by the rolls and then slitting the stock by shear fracture into wire with an aspect ratio of less than about 25. The method is characterized by an extended life of the cutting rolls.
    Type: Grant
    Filed: October 30, 1974
    Date of Patent: April 27, 1976
    Assignee: Monsanto Company
    Inventors: David I. Golland, Bernhard T. Junker, Gary E. O'Connor, Charles J. Runkle
  • Patent number: 3950192
    Abstract: An improved method for continuously carburizing low carbon cold rolled coil stock is disclosed. The carburized product is characterized by the absence of proeutectoid ferrite. The method comprises heating low carbon steel stock in the austenitizing range of 950.degree.-1150.degree.C. (1750.degree.-2100.degree.F.) in a continuous heat treating furnace wherein the furnace contains a high carbon availability so that residence time is of a short duration; homogenizing the stock so as to attain uniform macro distribution of carbon across the length, width and thickness of the stock and quenching the stock so that a uniform micro distribution of carbon is attained.
    Type: Grant
    Filed: October 30, 1974
    Date of Patent: April 13, 1976
    Assignee: Monsanto Company
    Inventors: David I. Golland, Nicholas K. Harakas, John W. Mottern, Gary E. O'Connor, Charles J. Runkle