Patents by Inventor David J. Bedwell

David J. Bedwell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20040249593
    Abstract: A method of calibrating pressure sensitive paint is provided comprising the steps of: illuminating the paint under a range of pressures and temperatures; measuring the intensity of light emitted by the paint following each illumination thereby measuring decay curves; and performing a curve fit of the decay curves to determine characteristic constants. These constants can then be used to generate a model of decay curves and a polynomial relating pressures and temperatures for ratios of intensities over gated areas of the model decay curves can be calculated. Pressure determination at the calibrated paint can then be performed by illuminating the paint, measuring the intensity of light emitted by the paint over two of the gated areas, determining the ratio of the gated area intensities and finally determining the pressure and/or temperature from the polynomial using the determined ratio of the gated area intensities.
    Type: Application
    Filed: April 6, 2004
    Publication date: December 9, 2004
    Inventors: Michael Dunleavy, Alan G Davies, David J Bedwell
  • Patent number: 5090020
    Abstract: Apparatus for controlling the composition of a laser gas or gas mixture includes a cryogenic gas-processor (2) connectible to a gas laser (1) selectively to receive gas or a gas mixture therefrom, remove impurities from the gas or gas mixture and selectively return the purified gas or gas mixture to the laser (1). A high temperature gas-purifier (3) is provided in gas flow connection with the processor (2) and with the laser (1) selectively to receive gas or a gas mixture therefrom, remove halogen and/or impurities from the gas or gas mixture and selectively return the dehalogenated or purified gas or gas mixture to the laser (1). Gas analysis means (4) is provided for receiving gas or gas mixture from the laser (1) to analyze it and produce output signals indicative of the actual composition of the laser gas or gas mixture.
    Type: Grant
    Filed: October 31, 1990
    Date of Patent: February 18, 1992
    Assignee: British Aerospace Public Limited Company
    Inventor: David J. Bedwell