Abstract: An integrated circuit that includes a digitally controlled oscillator (DCO) that adjusts a clock frequency of a critical path of the integrated circuit based on the variations in a power-supply voltage of the DCO and the critical path is described. This DCO may be included in a feedback control loop that includes a frequency-locked loop (FLL), and which determines an average clock frequency of the critical path based on a reference frequency. Furthermore, the DCO may have a selectable delay characteristic that specifies a delay sensitivity of the DCO as a function of the power-supply voltage, thereby approximately matching a manufactured delay characteristic of the critical path. Additionally, for variations in the power-supply voltage having frequencies greater than a resonance frequency associated with a chip package of the integrated circuit, adjustments of the clock frequency may be proportional to the variations in the power-supply voltage and the selectable delay characteristic.

Abstract: The described embodiments include a system that modulates the width of a high-speed link. The system includes a transmitter circuit coupled to a high-speed link that includes N serial lanes. During operation, while using a first number of lanes to transmit frames on the high-speed link, the transmitter circuit determines a second number of lanes to be used to transmit frames on the high-speed link based on a bandwidth demand on the high-speed link. The transmitter circuit then sends an indicator of the second number of lanes to a receiver on the high-speed link. Upon receiving an error-free acknowledgment of the indicator from the receiver, starting from a predetermined frame, the transmitter circuit transmits subsequent frames on the high-speed link using the second number of lanes.

Abstract: An integrated circuit that includes a digitally controlled oscillator (DCO) that adjusts a clock frequency of a critical path of the integrated circuit based on the variations in a power-supply voltage of the DCO and the critical path is described. This DCO may be included in a feedback control loop that includes a frequency-locked loop (FLL), and which determines an average clock frequency of the critical path based on a reference frequency. Furthermore, the DCO may have a selectable delay characteristic that specifies a delay sensitivity of the DCO as a function of the power-supply voltage, thereby approximately matching a manufactured delay characteristic of the critical path. Additionally, for variations in the power-supply voltage having frequencies greater than a resonance frequency associated with a chip package of the integrated circuit, adjustments of the clock frequency may be proportional to the variations in the power-supply voltage and the selectable delay characteristic.

Abstract: The described embodiments include a system that modulates the width of a high-speed link. The system includes a transmitter circuit coupled to a high-speed link that includes N serial lanes. During operation, while using a first number of lanes to transmit frames on the high-speed link, the transmitter circuit determines a second number of lanes to be used to transmit frames on the high-speed link based on a bandwidth demand on the high-speed link. The transmitter circuit then sends an indicator of the second number of lanes to a receiver on the high-speed link. Upon receiving an error-free acknowledgment of the indicator from the receiver, starting from a predetermined frame, the transmitter circuit transmits subsequent frames on the high-speed link using the second number of lanes.

Abstract: A system includes an input device, an output device, a mechanical chassis, a printed circuit board, and a semiconductor device. The semiconductor device includes a mechanical package, and a semiconductor die. The semiconductor die includes a semiconductor layer, a plurality of metal layers, a clock distribution network that distributes a clock signal within the die, and an economy precision pulse generating circuit. The economy precision pulse generating circuit includes a pre-charge circuit, a gate-to-the-partial-jam-latch-keeper circuit, a partial-jam-latch-keeper circuit, and a pull-down-against-the-up-keeper circuit. A source clock signal is derived from the clock signal. The source clock signal is provided to a first input of a logical AND circuit, the pre-charge circuit, and the gate-to-the-partial-jam-latch-keeper circuit. A common storage node is connected to a second input of the logical AND circuit. The logical AND circuit outputs an output pulse.

Abstract: A system includes an input device, an output device, a mechanical chassis, a printed circuit board, and a semiconductor device. The semiconductor device includes a mechanical package, and a semiconductor die. The semiconductor die includes a semiconductor layer, a plurality of metal layers, a clock distribution network that distributes a clock signal within the die, and an economy precision pulse generating circuit. The economy precision pulse generating circuit includes a pre-charge circuit, a gate-to-the-partial-jam-latch-keeper circuit, a partial-jam-latch-keeper circuit, and a pull-down-against-the-up-keeper circuit. A source clock signal is derived from the clock signal. The source clock signal is provided to a first input of a logical AND circuit, the pre-charge circuit, and the gate-to-the-partial-jam-latch-keeper circuit. A common storage node is connected to a second input of the logical AND circuit. The logical AND circuit outputs an output pulse.

Abstract: An integrated circuit test system. The test system includes a controller and an integrated circuit coupled to a voltage source and a current monitor. The controller causes the voltage source to supply a voltage to the integrated circuit, receives a signal from the current monitor indicating a power dissipation of the integrated circuit, and causes the voltage source to reduce the voltage until the signal from the current monitor indicates the power dissipation of the integrated circuit is less than a predetermined threshold. The controller stores in the integrated circuit in a non-volatile storage register that is accessible via a subset of access pins, a value corresponding to the voltage supplied to the integrated circuit when the power dissipation of the integrated circuit is less than the predetermined threshold. The subset of access pins provides at least one function in addition to accessing the non-volatile storage register.

Abstract: A method for data analysis of power modeling for a microprocessor has been developed. The method takes multiple values of power data from a power modeling simulator and generates summary data to characterize the power data behavior. Summary data views include results characterizing behavior in a single cycle and behavior across multiple cycles. Data is viewed both at an absolute level to characterize total power and relative to previous levels to characterize power derivatives. Summary data is derived from power generated every cycle when running specific benchmark programs on the power simulator.

Abstract: A method for optimizing a register file hierarchy in a multithreaded processor. The method includes providing a register file hierarchy with a plurality of register file cells, associating the plurality of register file cells with respective threads when the processor is operating in a multithreaded mode and flattening the plurality of register file cells with a single thread when the processor is operating in a single threaded mode. The register file cells correspond to threads of the multithreaded processor.

Abstract: A system and method is provided for scan control and observation of a logical circuit that does not halt the operation of the system clock. Thus, all dynamic circuits within the system continue to evaluate and precharge normally. Moreover, the traditional method of placing a multiplexer before the data input of a clocked storage element to perform scan control and observation is no longer required. Consequently, the system and method provide a more efficient manner in which to perform scan control and observation of a logical circuit.

Abstract: A method for synchronizing a data signal and a clock signal has been developed. The method first generates two separate intermediate data signals. The intermediate data signals lag the input data signal. The separate durations of the two lagging signals are combined to form an output data signal that is synchronized with the system clock signal.

Abstract: A method for modeling the power behavior of a pipelined processor has been developed. The method uses a power model integrated into a cycle accurate simulator. To create the power model, design blocks of the processor are divided into sub-blocks. Power modeling equations for each sub-block are developed by collaboration between the sub-block circuit designer and the simulator developer, using activity information relevant to the sub-block that is available in the simulator model. Each equation is calculated multiple times with different sets of power parameters to represent varying power conditions. Every simulation cycle, sub-block power is summed to generate full-chip power for multiple power conditions.

Abstract: A system and method is provided for scan control and observation of a logical circuit that does not halt the operation of the system clock. Thus, all dynamic circuits within the system continue to evaluate and precharge normally. Moreover, the traditional method of placing a multiplexer before the data input of a clocked storage element to perform scan control and observation is no longer required. Consequently, the system and method provide a more efficient manner in which to perform scan control and observation of a logical circuit.

Abstract: A method for data analysis of power modeling for a microprocessor has been developed. The method takes multiple values of power data from a power modeling simulator and generates summary data to characterize the power data behavior. Summary data views include results characterizing behavior in a single cycle and behavior across multiple cycles. Data is viewed both at an absolute level to characterize total power and relative to previous levels to characterize power derivatives. Summary data is derived from power generated every cycle when running specific benchmark programs on the power simulator.

Abstract: A method for modeling the power behavior of a pipelined processor has been developed. The method uses a power model integrated into a cycle accurate simulator. To create the power model, design blocks of the processor are divided into sub-blocks. Power modeling equations for each sub-block are developed by collaboration between the sub-block circuit designer and the simulator developer, using activity information relevant to the sub-block that is available in the simulator model. Each equation is calculated multiple times with different sets of power parameters to represent varying power conditions. Every simulation cycle, sub-block power is summed to generate full-chip power for multiple power conditions.

Abstract: A method for synchronizing a data signal and a clock signal has been developed. The method first generates two separate intermediate data signals. The intermediate data signals lag the input data signal. The separate durations of the two lagging signals are combined to form an output data signal that is synchronized with the system clock signal.

Abstract: A method and apparatus for performing logic operations using dual-edge triggered dynamic logic families is provided. Further, a method for performing logic operations using a self-resetting mechanism within dual-edge triggered dynamic logic blocks is provided. Further, a dual-edge triggered dynamic circuit that maintains a duty cycle of an input signal at its output is provided. Further, a method for providing a buffer mechanism for clock distribution purposes is provided.

Abstract: Circuits and methods for eliminating hold time violations are disclosed. A DE-type flip-flop latches a data input signal on a data input terminal a fraction of a clock period before a triggering edge of the clock signal. The DE-type flip-flop provides a data output signal for a full clock period beginning after the triggering edge of the clock signal. The DE-type flip-flop includes a latch having its data output terminal coupled to the data input terminal of a flip-flop. The flip-flop clock input pin and the latch enable terminal of the latch are connected to a clock line. The DE-type flip-flop used in place of a standard flip-flop, in which a hold time violation occurs, eliminates the hold time violation.