Abstract: Agitating a plurality of fluid packages in a tower. The housing tower may include a stationary tower as well as an agitation device. The agitation device may include an agitation chassis assembly and an agitation rack tower. The plurality of fluid packages may be received at the agitation rack tower. Once received, the plurality of fluid packages may be connected to a pump assembly, wherein the pump assembly is located at the agitation chassis assembly. In addition, the agitation rack tower may be agitated relative to the agitation chassis assembly about a pivot point located on the agitation rack tower.

Abstract: Agitating a plurality of fluid packages in a tower. The housing tower may include a stationary tower as well as an agitation device. The agitation device may include an agitation chassis assembly and an agitation rack tower. The plurality of fluid packages may be received at the agitation rack tower. Once received, the plurality of fluid packages may be connected to a pump assembly, wherein the pump assembly is located at the agitation chassis assembly. In addition, the agitation rack tower may be agitated relative to the agitation chassis assembly about a pivot point located on the agitation rack tower.

Abstract: In each configuration, at least one TDI sensor is used to image substrate portions of interest, with those portions illuminated with substantially uniform illumination. In one configuration, a substrate is compared to prestored expected characteristic features. In a second configuration, first and second patterns in a region of the surface of at least one substrate are inspected by comparing one pattern against the other and noting whether they agree with each other. This is accomplished by illuminating the two patterns, imaging the first pattern and storing its characteristics in a temporary memory, then imaging the second pattern and comparing it to the stored characteristics from the temporary memory. Then the comparisons continue sequentially with the second pattern becoming the first pattern in the next imaging/comparison sequence against a new second pattern.

Abstract: Substrate inspection apparatus and methods, and illumination apparatus. The inspection apparatus and method includes memory for storing the desired features of the surface of the substrate, focussed illuminator for substantially uniformly illuminating a region of the surface of the substrate to be inspected. Additionally there is a sensor for imaging the region of the substrate illuminated by the illuminator, and a comparator responsive to the memory and sensor for comparing the imaged region of the substrate with the stored desired features of the substrate. The illumination apparatus is designed to provide substantially uniform focussed illumination along a narrow linear region. This apparatus includes first, second and third reflectors elliptically cylindrical in shape, each with its long axis substantially parallel to the long axes of each of the others.

Abstract: Substrate inspection apparatus and methods, and illumination apparatus. The inspection apparatus and method includes memory for storing the desired features of the surface of the substrate, focussed illuminator for substantially uniformly illuminating a region of the surface of the substrate to be inspected. Additionally there is a sensor for imaging the region of the substrate illuminated by the illuminator, and a comparator responsive to the memory and sensor for comparing the imaged region of the substrate with the stored desired features of the substrate. The illumination apparatus is designed to provide substantially uniform focussed illumination along a narrow linear region. This apparatus includes first, second and third reflectors elliptically cylindrical in shape, each with its long axis substantially parallel to the long axes of each of the others.