Patents by Inventor David J. O'Brien

David J. O'Brien has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240139512
    Abstract: An example system includes a first lead configured to be positioned in or beside a left internal jugular vein (IJV) of a patient to deliver a first stimulation signal to a first vagus nerve, the first lead including one or more first segmented electrodes positioned on a distal portion of the first lead and a first anchoring mechanism; a second lead configured to be positioned in or beside a right IJV of the patient to deliver a second stimulation signal to a second vagus nerve, the second lead including one or more second segmented electrodes positioned on a distal portion of the second lead and a second anchoring mechanism; and circuitry configured to deliver electrical energy to the first lead to deliver the first stimulation signal and the second lead to deliver the second stimulation signal to provide bilateral stimulation to the first vagus nerve and the second vagus nerve.
    Type: Application
    Filed: October 28, 2022
    Publication date: May 2, 2024
    Inventors: Randal C. Schulhauser, Richard J. O'Brien, Scott R. Stanslaski, Mark P. Ashby, Avram Scheiner, Becky L. Dolan, William Valls, JR., David J. Miller, Varun Umesh Kashyap, Peter N. Braido, Lilian Kornet
  • Publication number: 20140156892
    Abstract: A link latency management for a high-speed point-to-point network (pTp) is described The link latency management facilitates calculating latency of a serial interface by tracking a round trip delay of a header that contains latency information. Therefore, the link latency management facilitates testers, logic analyzers, or test devices to accurately measure link latency for a point-to-point architecture utilizing a serial interface.
    Type: Application
    Filed: June 10, 2013
    Publication date: June 5, 2014
    Inventors: Tim Frodsham, Michael J. Tripp, David J. O'Brien, Navada Herur Muraleedhara, Naveen Cherukuri, Sanjay Dabral, David S. Dunning, Theodore Z. Schoenborn
  • Patent number: 7747888
    Abstract: A technique for promoting determinism among bus agents within a point-to-point (PtP) network. More particularly, embodiments of the invention relate to techniques to compensate for link latency, data skew, and clock shift within a PtP network of common system interface (CSI) bus agents.
    Type: Grant
    Filed: October 30, 2007
    Date of Patent: June 29, 2010
    Assignee: Intel Corporation
    Inventors: Tim Frodsham, Michael J. Tripp, David J. O'Brien, Muraleedhara Navada, Naveen Cherukuri, Sanjay Dabral, David S. Dunning, Theodore Z. Schoenborn
  • Patent number: 7677751
    Abstract: A hands free magnification device is provided that is capable of illuminating an area adjacent the user. A method of use of the device is also provided.
    Type: Grant
    Filed: November 13, 2006
    Date of Patent: March 16, 2010
    Inventors: William E. Kinsman, Robert E. O'Brien, David J. O'Brien
  • Patent number: 7328359
    Abstract: A technique for promoting determinism among bus agents within a point-to-point (PtP) network. More particularly, embodiments of the invention relate to techniques to compensate for link latency, data skew, and clock shift within a PtP network of common system interface (CSI) bus agents.
    Type: Grant
    Filed: July 21, 2004
    Date of Patent: February 5, 2008
    Assignee: Intel Corporation
    Inventors: Tim Frodsham, Michael J. Tripp, David J. O'Brien, Muraleedhara Navada, Naveen Cherukuri, Sanjay Dabral, David S. Dunning, Theodore Z. Schoenborn
  • Publication number: 20040130889
    Abstract: A hands free magnification device is provided that is capable of illuminating an area adjacent the user. A method of use of the device is also provided.
    Type: Application
    Filed: September 17, 2003
    Publication date: July 8, 2004
    Inventors: William E. Kinsman, Robert E. O'Brien, David J. O'Brien
  • Patent number: 6704892
    Abstract: In a bypass mode, a tester may bypass the core and input/output phase locked loops (PLLs) utilized by a processor to develop internal clock signals. External, tester-generated, phase shifted clock signals may be used to generate aligned high frequency signals to replace those generated by the phase locked loops. A plurality of phase shifted, tester generated clock signals may be subjected to an exclusive OR operation for generating input/output and core clock replacement signals. The clock signals received from the tester may also be aligned. Thus, a variety of skews may be compensated before entering the bypass mode. In some embodiments of the present invention, the core and I/O PLL clocks are used to establish alignment in a set-up phase and in other embodiments, the core and I/O PLL need not be utilized at all to generate appropriate internal clock signals from an external tester.
    Type: Grant
    Filed: May 31, 2000
    Date of Patent: March 9, 2004
    Assignee: Intel Corporation
    Inventors: Nasser A. Kurd, Javed S. Barkatullah, Tim Frodsham, David J. O'Brien
  • Patent number: 6477674
    Abstract: In one embodiment, an integrated circuit including a plurality of input/output (I/O) buffers is disclosed. The integrated circuit contains a plurality of I/O buffers. Each of the I/O buffers include an I/O test circuit that generates test pattern signals whenever the integrated circuit is operating in a loopback test mode. According to a further embodiment, the integrated circuit includes one or more programmable delay circuits coupled to the I/O buffers that permit switching state (AC) loopback timing tests to be conducted.
    Type: Grant
    Filed: December 29, 1999
    Date of Patent: November 5, 2002
    Assignee: Intel Corporation
    Inventors: Sarah E. Bates, R. Tim Frodsham, Nasser A. Kurd, Anne Meixner, David J. O'Brien, Rajay R. Pai, Mike Tripp, Jeff Wight
  • Patent number: 6262585
    Abstract: According to one embodiment, an integrated circuit is disclosed that includes a first input/output (I/O) circuit and a leakage detection circuit coupled to the first I/O circuit. In a test mode of operation, the leakage detection circuit tests the first I/O circuit for excessive leakage current. According to another embodiment, the integrated circuit also includes a first resistor coupled between a line voltage and the first I/O circuit and a second resistor coupled between the first I/O circuit and ground. Further, the integrated circuit includes a second I/O circuit coupled to the leakage detection circuit and the first and second resistors. The leakage circuit also tests the second I/O circuit for excessive leakage current in the test mode of operation.
    Type: Grant
    Filed: June 14, 1999
    Date of Patent: July 17, 2001
    Assignee: Intel Corporation
    Inventors: R. Tim Frodsham, David J. O'Brien