Patents by Inventor David J. Odendahl

David J. Odendahl has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Manufacturing systems and methods
    Patent number: 9213786
    Abstract: Manufacturing systems and methods are disclosed. In one example, a computer based system comprises a non-transitory computer readable memory, a processor, and logic instructions stored in the non-transitory computer readable memory. When executed by the processor, the logic instructions configure the processor to perform operations, comprising receiving a first digital map of a first component and a second digital map of a second component, defining a first surface on the first component and a second surface on the second component, wherein at least a portion of the first surface is to adjoin at least a portion of the second surface in a manufactured assembly, updating a first part definition for the first component to include the first surface and, optionally, updating a second part definition for the second component to include the second surface.
    Type: Grant
    Filed: February 20, 2013
    Date of Patent: December 15, 2015
    Assignee: The Boeing Company
    Inventors: Alan D. Glasscock, Rich H. Morihara, David J. Odendahl, Frederick J. Richter, Chris Stedman, Sidlaghatta N. Venkatesh
  • Device and method for measuring a gap between members of a structure for manufacture of a shim
    Patent number: 7730789
    Abstract: An apparatus for measuring a gap between a first mating surface of a first component and a second mating surface of a second component has a substrate. A plurality of capacitive sensors is coupled to the substrate. A controller is coupled to the plurality of capacitive sensors. The controller is used to select each individual capacitive sensor to measure the gap between the first mating surface of the first component and the second mating surface of the second component.
    Type: Grant
    Filed: November 1, 2006
    Date of Patent: June 8, 2010
    Assignee: Boeing Management Company
    Inventor: David J. Odendahl
  • DEVICE AND METHOD FOR MEASURING A GAP BETWEEN MEMBERS OF A STRUCTURE FOR MANUFACTURE OF A SHIM
    Publication number: 20080110275
    Abstract: An apparatus for measuring a gap between a first mating surface of a first component and a second mating surface of a second component has a substrate. A plurality of capacitive sensors is coupled to the substrate. A controller is coupled to the plurality of capacitive sensors. The controller is used to select each individual capacitive sensor to measure the gap between the first mating surface of the first component and the second mating surface of the second component.
    Type: Application
    Filed: November 1, 2006
    Publication date: May 15, 2008
    Inventor: DAVID J. ODENDAHL