Abstract: A time differential digital circuit can detect a time difference between first and second event signals. The time difference measurement can be calibrated to account for transmission path delays. The time differential digital circuit can be implemented using field programmable gate array transceivers.

Abstract: A time differential digital circuit can detect a time difference between first and second event signals. The time difference measurement can be calibrated to account for transmission path delays. The time differential digital circuit can be implemented using field programmable gate array transceivers.

Abstract: A serializer device is used for generation, from a parallel digital signal, of a clock signal or a serial binary data signal having a pre-determined amount of jitter. A binary number having consecutive groups of ones and zeroes, when serialized by the serializer device, produces a clock signal. By varying the number of ones and zeroes on the binary number, a pre-determined amount of jitter can be generated. Use of sigma-delta modulation in combination with a phase-locked loop circuitry allows one to obtain a smoothly varying jitter of the output signal.

Abstract: A serializer device is used for generation, from a parallel digital signal, of a clock signal or a serial binary data signal having a pre-determined amount of jitter. A binary number having consecutive groups of ones and zeroes, when serialized by the serializer device, produces a clock signal. By varying the number of ones and zeroes on the binary number, a pre-determined amount of jitter can be generated. Use of sigma-delta modulation in combination with a phase-locked loop circuitry allows one to obtain a smoothly varying jitter of the output signal.

Abstract: The invention relates to a transceiver optical system in which a single serializer/deserializer (SERDES) chip is used to drive a plurality of transceiver modules.

Abstract: Printed circuit boards (PCB's) with edge connectors undergo bending stresses whenever the edge connectors are plugged into mating connectors. The bending stresses causes deformation of the printed circuit board, which can have deleterious effects on electrical components thereon. Slots are provided on the PCB to enable the portion of the PCB surrounding the edge connector to bend relative to the remainder of the PCB, thereby confine the bending to a localized area between the ends of the slots, and isolate the electrical components from any stresses caused thereby.

Abstract: Printed circuit boards (PCB's) with edge connectors undergo bending stresses whenever the edge connectors are plugged into mating connectors. The bending stresses causes deformation of the printed circuit board, which can have deleterious effects on electrical components thereon. Slots are provided on the PCB to enable the portion of the PCB surrounding the edge connector to bend relative to the remainder of the PCB, thereby confine the bending to a localized area between the ends of the slots, and isolate the electrical components from any stresses caused thereby.

Abstract: The invention relates to a transceiver optical system in which a single serializer/deserializer (SERDES) chip is used to drive a plurality of transceiver modules.

Abstract: A modular test instrument comprises a base unit and one of a selection of application modules, neither being capable of performing end-user functions without the other. When physically assembled to one another, the base unit and application module comprise a structurally unitary device specialized for performance of application-specific end-user functions.

Abstract: A method for testing various types of devices or systems employs a modular test instrument comprising a base unit and one of a selection of application modules, neither being capable of performing end-user functions without the other. When physically assembled to one another, the base unit and application module comprise a structurally unitary device specialized for performance of application-specific end-user functions. The base unit is generic to all types of test to be provided, and comprises a display, a power supply, a user interface, and generic software to operate the display and user interface. Each application module is connected to the base unit in the same manner, so that the same base unit can be employed with a wide variety of application modules. The application modules can be readily and conveniently removed from and assembled to the base unit.

Abstract: A modular test instrument comprises a base unit and one of a selection of application modules, neither being capable of performing end-user functions without the other. When physically assembled to one another, the base unit and application module comprise a structurally unitary device specialized for performance of application-specific end-user functions.

Abstract: A modular test instrument comprises a base unit and one of a selection of application modules, neither being capable of performing end-user functions without the other. When physically assembled to one another, the base unit and application module comprise a structurally unitary device specialized for performance of application-specific end-user functions. The base unit is generic to all types of test to be provided, and comprises a display, a power supply, a user interface, and generic software to operate the display and user interface. Each application module is connected to the base unit in the same manner, so that the same base unit can he employed with a wide variety of application modules. The application modules can be readily and conveniently removed from and assembled to the base unit.

Abstract: A modular test instrument comprises a base unit and one of a selection of application modules, neither being capable of performing end-user functions without the other. When physically assembled to one another, the base unit and application module comprise a structurally unitary device specialized for performance of application-specific end-user functions.

Abstract: A modular test instrument comprises a base unit and one of a selection of application modules, neither being capable of performing end-user functions without the other. When physically assembled to one another, the base unit and application module comprise a structurally unitary device specialized for performance of application-specific end-user functions. The base unit is generic to all types of test to be provided, and comprises a display, a power supply, a user interface, and generic software to operate the display and user interface. Each application module is connected to the base unit in the same manner, so that the same base unit can be employed with a wide variety of application modules. The application modules can be readily and conveniently removed from and assembled to the base unit.

Abstract: A modular test instrument comprises a base unit and one of a selection of application modules, neither being capable of performing end-user functions without the other. When physically assembled to one another, the base unit and application module comprise a structurally unitary device specialized for performance of application-specific end-user functions.The base unit is generic to all types of test to be provided, and comprises a display, a power supply, a user interface, and generic software to operate the display and user interface. Each application module is connected to the base unit in the same manner, so that the same base unit can be employed with a wide variety of application modules. The application modules can be readily and conveniently removed from and assembled to the base unit.