Patents by Inventor David J. Tasker

David J. Tasker has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Graphical automated machine control and metrology
    Patent number: 8095231
    Abstract: A graphical programming system allows a user to place geometric shapes onto a scaled image, the shape having associated behavior that operates on the image or on the object of which the image is formed. In a preferred embodiment, the shapes are objects in the Visio program by Microsoft Corporation. The shapes are dragged from a stencil onto an image provided by ion beam or electron microscope image. The shape invokes software or hardware to locate and measure features on the image or to perform operations, such as ion beam milling, on the object that is imaged.
    Type: Grant
    Filed: February 1, 2010
    Date of Patent: January 10, 2012
    Assignee: FEI Company
    Inventors: David J. Tasker, Henri J. Lezec, David A. Head
  • GRAPHICAL AUTOMATED MACHINE CONTROL AND METROLOGY
    Publication number: 20100138028
    Abstract: A graphical programming system allows a user to place geometric shapes onto a scaled image, the shape having associated behavior that operates on the image or on the object of which the image is formed. In a preferred embodiment, the shapes are objects in the Visio program by Microsoft Corporation. The shapes are dragged from a stencil onto an image provided by ion beam or electron microscope image. The shape invokes software or hardware to locate and measure features on the image or to perform operations, such as ion beam milling, on the object that is imaged.
    Type: Application
    Filed: February 1, 2010
    Publication date: June 3, 2010
    Applicant: FEI COMPANY
    Inventors: DAVID J. TASKER, Henri J. Lezec, David A. Head
  • Graphical automated machine control and metrology
    Patent number: 7664566
    Abstract: A graphical programming system allows a user to place geometric shapes onto a scaled image, the shape having associated behavior that operates on the image or on the object of which the image is formed. In a preferred embodiment, the shapes are objects in the Visio program by Microsoft Corporation. The shapes are dragged from a stencil onto an image provided by ion beam or electron microscope image. The shape invokes software or hardware to locate and measure features on the image or to perform operations, such as ion beam milling, on the object that is imaged.
    Type: Grant
    Filed: October 31, 2007
    Date of Patent: February 16, 2010
    Assignee: FEI Company
    Inventors: David J. Tasker, Henri J. Lezec, David A. Head
  • Graphical automated machine control and metrology
    Patent number: 7308334
    Abstract: A graphical programming system allows a user to place geometric shapes onto a scaled image, the shape having associated behavior that operates on the image or on the object of which the image is formed. In a preferred embodiment, the shapes are objects in the Visio program by Microsoft Corporation. The shapes are dragged from a stencil onto an image provided by ion beam or electron microscope image. The shape invokes software or hardware to locate and measure features on the image or to perform operations, such as ion beam milling, on the object that is imaged.
    Type: Grant
    Filed: April 27, 2005
    Date of Patent: December 11, 2007
    Assignee: FEI Company
    Inventors: David J. Tasker, Henri J. Lezec, David A. Head
  • Graphical automated machine control and metrology
    Patent number: 6889113
    Abstract: A graphical programming system allows a user to place geometric shapes onto a scaled image, the shape having associated behavior that operates on the image or on the object of which the image is formed. In a preferred embodiment, the shapes are objects in the Visio program by Microsoft Corporation. The shapes are dragged from a stencil onto an image provided by ion beam or electron microscope image. The shape invokes software or hardware to locate and measure features on the image or to perform operations, such as ion beam milling, on the object that is imaged.
    Type: Grant
    Filed: August 23, 2002
    Date of Patent: May 3, 2005
    Assignee: FEI Company
    Inventors: David J. Tasker, Henri J. Lezec, David A. Head
  • Graphical automated machine control and metrology
    Publication number: 20030067496
    Abstract: A graphical programming system allows a user to place geometric shapes onto a scaled image, the shape having associated behavior that operates on the image or on the object of which the image is formed. In a preferred embodiment, the shapes are objects in the Visio program by Microsoft Corporation. The shapes are dragged from a stencil onto an image provided by ion beam or electron microscope image. The shape invokes software or hardware to locate and measure features on the image or to perform operations, such as ion beam milling, on the object that is imaged.
    Type: Application
    Filed: August 23, 2002
    Publication date: April 10, 2003
    Inventors: David J. Tasker, Henri Lezec, David A. Head