Abstract: This invention relates to adaptively compensating for variations in integrated chip circuitry due to delays caused by multiple thresholds. The multi-threshold adaptive dynamic scaling system disclosed compensates for normal on-chip variations which affect system process and voltage variability, as well as overall performance. This system regulates a voltage control and provides high voltage thresholds, regular voltage thresholds, and low voltage thresholds to compensate for threshold voltage variations.

Abstract: A method for reticle design correction and electrical parameter extraction of a multi-cell reticle design. The method including: selecting a subset of cell designs of a multi-cell reticle design, each cell design of the subset of cell designs having a corresponding shape to process, for each cell design of the subset of cell designs determining a respective cell design location of the corresponding shape; determining a common shapes processing rule for all corresponding shapes of each cell design based on the respective cell design locations of each of the corresponding shapes; and performing shapes processing of the corresponding shape only of a single cell design of the subset of cell designs to generate resulting data for the subset of cell designs. Also a computer usable medium including computer readable program code having an algorithm adapted to implement the method for reticle design correction and electrical extraction.

Abstract: A method for and an apparatus in which the FSOURCE connection in a fuse domain is split into multiple nets, allowing flexible placement of primary fuses in the floorplan, is provided. In particular, multiple FSOURCE connections (e.g. C4 pads or wire pads) are provided in the floorplan, allowing flexible placement of primary fuses without additional overhead.

Abstract: A method and system for performing fault tolerant static timing analysis for an electronic network. A composite timing graph is generated by making K+1 copies of the zero-defect timing graph of the network, where K is a predetermined maximum number of defects present on a path of the network, and static timing analysis is performed on the composite timing graph.

Abstract: A system and method for providing on-chip voltage distribution and regulation. In accordance with the system of the present invention, an IC chip includes a source voltage plane having a source supply rail for supplying power to the IC chip and a source ground rail for sinking power supplied therefrom. At least one intermediate ground rail is connected between the source supply rail and the source ground rail to divide the source voltage plane into multiple intermediate voltage planes. The intermediate ground rail serves as a supply rail for a subsequent intermediate voltage plane such that the intermediate voltage planes are series-connected.

Abstract: A method and system for performing fault tolerant static timing analysis for an electronic network. A composite timing graph is generated by making K+1 copies of the zero-defect timing graph of the network, where K is a predetermined maximum number of defects present on a path of the network, and static timing analysis is performed on the composite timing graph.

Abstract: A system and method for providing on-chip voltage distribution and regulation. In accordance with the system of the present invention, an IC chip includes a source voltage plane having a source supply rail for supplying power to the IC chip and a source ground rail for sinking power supplied therefrom. At least one intermediate ground rail is connected between the source supply rail and the source ground rail to divide the source voltage plane into multiple intermediate voltage planes. The intermediate ground rail serves as a supply rail for a subsequent intermediate voltage plane such that the intermediate voltage planes are series-connected.

Abstract: An integrated circuit chip having at least one source pin and a plurality of sink pins. A wire segment connects the source pin to at least one of the sink pins and includes at least two segments where one of the segments is larger than the other where electromigration is likely to occur.

Abstract: An apparatus comprising a clock for providing a clock signal, means for providing a delayed version of the clock signal, two transparent latches having clock inputs controlled by opposite polarities of the delayed clock signal, a multiplexer having (i) inputs fed by outputs of the latches, and (ii) a select input fed by the clock signal, and means for providing a select signal for selecting the latch whose clock is inactive. Preferably, each of the latches has a scan input gate and a scan output gate, and the scan output of the first latch is applied to the scan input of the second latch to form a scannable latch pair. Also, preferably, the apparatus further comprises a data port for applying data to the first and second latches, and an exclusive OR gate at the data port, whereby the apparatus produces a gated clock signal. Also disclosed is a method of operating this apparatus.

Abstract: A method of designing the clocking circuitry of an integrated circuit chip. The load sinks are assigned to clock nets, each clock net having less then a maximum load. The first step is selecting a pair of clock nets for improvement. Next, a subset of the load sinks of the pair of clock nets are assigned to each clock net. Thereafter, the unassigned load sinks are assigned in all possible combinations to each of the pair of clock nets. A penalty function for each load sink assignment, and the assignment having the best penalty function is kept.

Abstract: A computer implemented method incrementally updates a design placement in a very large scale integrated (VLSI) chip. A data structure is generated which defines a chosen specification and initial placement of circuits is input to a computer aided design (CAD) system. The CAD system divides a design area into placement cells. Local constraint values and limits are computed and changes made in the design specification. Replacement regions are then identified, expanded, and replaced. Constraint values are recomputed and the steps of the method are repeated until no more changes are required.

Abstract: According to the present invention, a method of optimization by simulated annealing is provided that uses a spatial metric to localize the simulated annealing temperature, the move set, and the objects which the moves operate on. The method keeps a local history of the optimization process. The localization allows the simulated annealing process to adaptively control the annealing schedule of each local region independently. This allows the annealing temperature, move set, and the objects upon which the move set operates to each be adjusted for each region independently to maximize efficiency. This results in optimization of all regions in a quick and efficient manner.

Abstract: The present invention provides a method of computing the cost of a proposed clock tree change in the context of a clock skew optimization routine. According to the present invention, a recalculation of the clock skew cost due to a proposed change in the clock tree can be done without having to recompute the effect of the change to all of the sinks of that clock tree. The method stores the effects of past delay changes as unpropagated incremental changes until future changes make it necessary to propagate those changes. Thus, in this method only the parameters of the ancestors of the delayed node need to be recalculated to determine the cost of a proposed change in the clock tree. Not having to recalculate the rest of the tree greatly reduces the computational complexity and time required for the process, allowing the required iterations to be completed in a much shorter time period.

Abstract: A method for wiring IC chips such that electromigration criteria are met while minimizing the effect on overall chip wireability. A technique to optimize the width of automatically routed wire segments so that these widths are adequate to support the electromigration current on that net as a function of the capacitive loading of the net itself.