Patents by Inventor David Jez

David Jez has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8378304
    Abstract: An apparatus for incorporation into time-domain spectroscopy systems that creates a continuous reference whereby a sample pulses' phase and amplitude can be tracked and corrected employs a beam splitter to generate sample and reference pulses. A detector is positioned for receiving the reference radiation pulses that do not interact with the sample. The same detector is also positioned for receiving the sample radiation pulses that emerge from the sample. The apparatus can be readily implemented by being configured between the emitter and detector of a terahertz time-domain spectrometer. The reference pulse is used to trace the changes in time and amplitude of the sample pulse. Since any changes in the reference pulse will most likely manifest in the sample pulse, the reference pulse is monitored and used to correct the sample pulse and thereby reduce the effects of jitter.
    Type: Grant
    Filed: August 24, 2010
    Date of Patent: February 19, 2013
    Assignee: Honeywell ASCa Inc.
    Inventors: Payam Mousavi, Steven Dodge, Frank Martin Haran, Stephane Savard, David Jez, Stuart James Heath
  • Patent number: 8314391
    Abstract: A terahertz time-domain spectrometer scanning sensor system includes a transmitter and a receiver that are secured to a mobile scanner head. Optical pump light, in the form of short pulses launched from a stationary laser located remotely from the scanner head, is delivered to the transmitter and receiver through a controlled fiber optic cable arrangement so that variations in temporal pulse relays that are associated fiber optic transmission are minimized. In this fashion, the movement of the fiber optic cable is maneuvered along a defined path so as to control the bends in the cable and thus minimize variations in temporal delays that can otherwise arise as the pulses of light are transmitted through the fiber. Pulses of laser light launched from the laser into the optical fiber will exit the cable with consistent (i) time of arrival, (ii) phase duration, and (iii) polarization state and energy.
    Type: Grant
    Filed: January 9, 2008
    Date of Patent: November 20, 2012
    Assignee: Honeywell ASCa Inc.
    Inventors: Frank Martin Haran, Ross MacHattie, Ron E Beselt, David Jez
  • Patent number: 8187424
    Abstract: An in-situ time domain spectroscopy (TDS)-based method (200) for non-contact characterization of properties of a sheet material while being produced by a manufacturing system (700). A time domain spectrometry system (100) and calibration data for the system is provided. The calibration data includes data for transmitted power through or reflected power from the sheet material as a function of a moisture content of the sheet material. At least one pulse of THz or near THz radiation from a transmitter (111) is directed at a location on a sheet material sample (130) while being processed by the manufacturing system (700). Transmitted or reflected radiation associated with at least one transmitted or reflected pulse from the sample location is synchronously detected by a detector (110) to obtain the sample data.
    Type: Grant
    Filed: August 1, 2008
    Date of Patent: May 29, 2012
    Assignee: Honeywell ASCA Inc.
    Inventors: Frank M. Haran, Payam Mousavi, David Jez, Steven Dodge
  • Publication number: 20120049070
    Abstract: An apparatus for incorporation into time-domain spectroscopy systems that creates a continuous reference whereby a sample pulses' phase and amplitude can be tracked and corrected employs a beam splitter to generate sample and reference pulses. A detector is positioned for receiving the reference radiation pulses that do not interact with the sample. The same detector is also positioned for receiving the sample radiation pulses that emerge from the sample. The apparatus can be readily implemented by being configured between the emitter and detector of a terahertz time-domain spectrometer. The reference pulse is used to trace the changes in time and amplitude of the sample pulse. Since any changes in the reference pulse will most likely manifest in the sample pulse, the reference pulse is monitored and used to correct the sample pulse and thereby reduce the effects of jitter.
    Type: Application
    Filed: August 24, 2010
    Publication date: March 1, 2012
    Applicant: Honeywell ASCa Inc.
    Inventors: Payam Mousavi, Steven Dodge, Frank Martin Haran, Stephane Savard, David Jez, Stuart James Heath
  • Publication number: 20100282970
    Abstract: A terahertz time-domain spectrometer scanning sensor system includes a transmitter and a receiver that are secured to a mobile scanner head. Optical pump light, in the form of short pulses launched from a stationary laser located remotely from the scanner head, is delivered to the transmitter and receiver through a controlled fiber optic cable arrangement so that variations in temporal pulse relays that are associated fiber optic transmission are minimized. In this fashion, the movement of the fiber optic cable is maneuvered along a defined path so as to control the bends in the cable and thus minimize variations in temporal delays that can otherwise arise as the pulses of light are transmitted through the fiber. Pulses of laser light launched from the laser into the optical fiber will exit the cable with consistent (i) time of arrival, (ii) phase duration, and (iii) polarization state and energy.
    Type: Application
    Filed: January 9, 2008
    Publication date: November 11, 2010
    Inventors: Frank Martin Haran, Ross MacHattie, Ron E. Beselt, David Jez
  • Publication number: 20100024999
    Abstract: An in-situ time domain spectroscopy (TDS)-based method (200) for non-contact characterization of properties of a sheet material while being produced by a manufacturing system (700). A time domain spectrometry system (100) and calibration data for the system is provided. The calibration data includes data for transmitted power through or reflected power from the sheet material as a function of a moisture content of the sheet material. At least one pulse of THz or near THz radiation from a transmitter (111) is directed at a location on a sheet material sample (130) while being processed by the manufacturing system (700). Transmitted or reflected radiation associated with at least one transmitted or reflected pulse from the sample location is synchronously detected by a detector (110) to obtain the sample data.
    Type: Application
    Filed: August 1, 2008
    Publication date: February 4, 2010
    Inventors: Frank Martin Haran, Payam Mousavi, David Jez, Steven Dodge