Patents by Inventor David John Lind

David John Lind has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10776233
    Abstract: In general, a test instrument includes a first processing system that is programmable to run one or more test programs to test a device interfaced to a test instrument, and that is programmed to control operation of the test instrument, and a second processing system that is dedicated to device testing. The second processing system being programmable to run one or more test programs to test the device, and the first processing system has a first application programming interface (API) and the second processing system has a second API, the first API and the second API being different APIs, the first API and the second API having at least some duplicate functions.
    Type: Grant
    Filed: October 28, 2011
    Date of Patent: September 15, 2020
    Assignee: Teradyne, Inc.
    Inventors: Lloyd K. Frick, David John Lind
  • Publication number: 20130111505
    Abstract: In general, a test instrument includes a first processing system that is programmable to run one or more test programs to test a device interfaced to a test instrument, and that is programmed to control operation of the test instrument, and a second processing system that is dedicated to device testing. The second processing system being programmable to run one or more test programs to test the device, and the first processing system has a first application programming interface (API) and the second processing system has a second API, the first API and the second API being different APIs, the first API and the second API having at least some duplicate functions.
    Type: Application
    Filed: October 28, 2011
    Publication date: May 2, 2013
    Applicant: Teradyne, Inc.
    Inventors: Lloyd K. Frick, David John Lind