Abstract: A method for determining residue length within a field includes receiving, with a computing system, a captured image depicting an imaged portion of the field from one or more imaging devices. Furthermore, the method includes determining, with the computing system, an image gradient orientation at each of a plurality of pixels within the captured image. Additionally, the method includes identifying, with the computing system, a residue piece present within the image portion of the field based at least in part on the determined image gradient orientations. Moreover, the method includes determining, with the computing system, a length of the identified residue piece.

Abstract: A method for determining residue length within a field includes receiving, with a computing system, a captured image depicting an imaged portion of the field from one or more imaging devices. Furthermore, the method includes determining, with the computing system, an image gradient orientation at each of a plurality of pixels within the captured image. Additionally, the method includes identifying, with the computing system, a residue piece present within the image portion of the field based at least in part on the determined image gradient orientations. Moreover, the method includes determining, with the computing system, a length of the identified residue piece.

Abstract: A method for determining residue coverage of a field includes receiving, with a computing system, a captured image depicting an imaged portion of a field from one or more imaging devices. Furthermore, the method includes determining, with the computing system, an image gradient orientation at each of a plurality of pixels within the captured image. Additionally, the method includes determining, with the computing system, a plurality of image gradient orientation densities associated with the captured image based on the determined image gradient orientations. Moreover, the method includes determining, with the computing system, a residue coverage parameter associated with the imaged portion of the field based on the determined plurality of image gradient orientation densities.

Abstract: The present invention provides a fast and accurate method of measuring the vacuum pressure in a sealed glass vial or other electrically non-conductive vessel. In the method the vial or vessel to be tested is placed between a pair of electrodes. The gas contained within the vial or vessel is ionized by applying a high frequency, high voltage potential across the electrodes. The voltage is progressively decreased once ionization has occurred and the termination of ionization is detected by registering either the sudden drop in electrode current or the termination of light emission from the vial. The gas pressure within the vial or vessel is derived as a function of the electrode voltage at the point at which ionization terminates.

Abstract: The present invention provides a fast and accurate method of measuring the vacuum pressure in a sealed glass vial or other electrically non-conductive vessel. In the method the vial or vessel to be tested is placed between a pair of electrodes. The gas contained within the vial or vessel is ionized by applying a high frequency, high voltage potential across the electrodes. The voltage is progressively decreased once ionization has occurred and the termination of ionization is detected by registering either the sudden drop in electrode current or the termination of light emission from the vial. The gas pressure within the vial or vessel is derived as a function of the electrode voltage at the point at which ionization terminates.