Abstract: A method and circuit are provided for measuring frequency response performance of an integrated circuit by providing a pulse having a rising edge and a falling edge where the pulse is provided to a plurality of serially connected components. The number of these components which have propagated the leading edge of the pulse before the occurrence of the falling edge provide a numeric indication of the circuit's frequency response and performance.

Abstract: Measurement circuit components are included in an integrated circuit fabricated on a semiconductor substrate. These measurement circuits include registers that are connected to a voltage regulation circuit that provides the integrated circuit voltage source and to a power management circuit. These measurement circuits provide signals to control the voltage regulation circuit for adjusting the voltage output to the integrated circuit based upon a measurement values obtained on the semiconductor device. These measurements include temperature, IR drop at locations on the semiconductor substrate, along with the frequency response of integrated circuit.

Abstract: A method and circuit are provided for measuring frequency response performance of an integrated circuit by providing a pulse having a rising edge and a falling edge where the pulse is provided to a plurality of serially connected components. The number of these components which have propagated the leading edge of the pulse before the occurrence of the falling edge provide a numeric indication of the circuit's frequency response and performance.

Abstract: Measurement circuit components are included in an integrated circuit fabricated on a semiconductor substrate. These measurement circuits include registers that are connected to a voltage regulation circuit that provides the integrated circuit voltage source and to a power management circuit. These measurement circuits provide signals to control the voltage regulation circuit for adjusting the voltage output to the integrated circuit based upon a measurement values obtained on the semiconductor device. These measurements include temperature, IR drop at locations on the semiconductor substrate, along with the frequency response of integrated circuit.

Abstract: The present invention discloses a lock indicator circuit used to indicate a phase lock condition between logic signals. The lock indicator circuit uses a phase detector that generates a pulse width proportional to the phase difference between a reference signal and a feedback signal. Another circuit generates, on each positive edge of the reference and the feedback signals, pulses whose widths are primarily dependent on fixed delay elements. These fixed pulse determine a window in which the pulse from the phase detector will fall as the two signals approach phase lock. Phase lock is signaled by the logic AND of the window pulse and the phase detector pulse. Other circuitry generates a phase lock indication signal if the phase lock signal remains true for a number of consecutive transitions of the reference signal. Likewise a phase unlock indication signal is generated if after phase lock indication, phase unlock occurs and remains for a number of consecutive transitions of the reference signal.

Abstract: The present invention provides a delay-locked loop (DLL). The DLL comprises a phase-frequency detector (PFD) for receiving a reference signal. The DLL further includes a charge pump which is coupled to the PFD. The DLL also includes a loop filter which is coupled to the charge pump and the PFD. Additionally in the DLL, delay line means is coupled to the charge pump and the loop filter. The delay line means provides a feedback signal to the PFD. The DLL further includes monitor means coupled to the PFD, the charge pump and the loop filter. The monitor means is for detecting when a voltage across the loop filter is at a predetermined level, wherein when the voltage is at the predetermined level the monitor means causes the PFD to enter a pump-down mode until the feedback signal is aligned with the reference signal. An advantage of the present invention is that DLL loop tracking failures based upon a stuck condition are reliably avoided.