Patents by Inventor David Jonathan Brown

David Jonathan Brown has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6734668
    Abstract: An eddy current probe comprising two solenoid coils wound around a common rectangular wafer base of high permeability material extending beyond the coils at wafer corners with the wafer becoming the solenoid core. Posts also of high permeability material depend from a wafer front at its corners with coils crossing orthogonally on the wafer. The coils are connected to alternating current to produce magnetic fields that have like magnetic poles at wafer corners diagonally opposed across the wafer, the coils switching in phase to alternate the magnetic field between posts at base diagonal corners. With the posts at the wafer base corners, the combined magnetic fields generated from the orthogonal coils conduct through the posts and emanate from post ends. The post ends have a curvature matching that of a material to be tested for better coupling the magnetic field into the material.
    Type: Grant
    Filed: October 2, 2002
    Date of Patent: May 11, 2004
    Assignee: Zetec, Inc.
    Inventors: Christopher Hils, David Jonathan Brown
  • Publication number: 20040066191
    Abstract: An eddy current probe comprising two solenoid coils wound around a common rectangular wafer base of high permeability material extending beyond the coils at wafer corners with the wafer becoming the solenoid core. Posts also of high permeability material depend from a wafer front at its corners with coils crossing orthogonally on the wafer. The coils are connected to alternating current to produce magnetic fields that have like magnetic poles at wafer corners diagonally opposed across the wafer, the coils switching in phase to alternate the magnetic field between posts at base diagonal corners. With the posts at the wafer base corners, the combined magnetic fields generated from the orthogonal coils conduct through the posts and emanate from post ends. The post ends have a curvature matching that of a material to be tested for better coupling the magnetic field into the material.
    Type: Application
    Filed: October 2, 2002
    Publication date: April 8, 2004
    Inventors: Christopher Hils, David Jonathan Brown