Patents by Inventor David L. Hofeldt

David L. Hofeldt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230219274
    Abstract: A sensing system for measurement of a multilayered blown polymeric film. A feedblock supplies polymeric material streams to an annular blown film die to form a plurality of layers of different polymeric materials. A sensing system is positioned adjacent to a film bubble extruded from the blown film die, wherein the blown film bubble includes annular layers of at least two different polymeric materials. The sensing system emits a signal toward selected circumferential positions around the film bubble and receives a plurality of reflected signals at each circumferential position. Each reflected signal in the plurality of reflected signals is generated at an interface between annular layers that includes a refractive index change detectable by the sensing system. A processor processes the reflected signals from the sensing system, and for each circumferential position determines a layer thickness profile for each polymeric material in the film.
    Type: Application
    Filed: June 9, 2021
    Publication date: July 13, 2023
    Inventors: William W. Merrill, Pradeep P. Bhat, Francis T. Caruso, David L. Hofeldt, David D. Nguyen, Ziang Li
  • Publication number: 20220412723
    Abstract: Methods and systems of measurement for blown film lines are provided. The sensing system includes a terahertz (THz) sensor positioned adjacent to a film bubble extruded from a blown film die, and a sensor support configured to guide the THz sensor around the circumference of the film bubble to measure its film thickness.
    Type: Application
    Filed: September 24, 2020
    Publication date: December 29, 2022
    Inventors: Thomas J. Strey, David L. Hofeldt, Gregory J. McGill, Jay M. Krieger, Christopher J. Rother, Paul C. Thomas
  • Publication number: 20220011238
    Abstract: A method includes emitting light from a light source (12) onto an at least partially reflective surface (24). The reflected light (30) is collected from the surface at a screen (32) to capture the intensity distribution (34) of the reflected light with a camera (40) in a first image (42). The intensity distribution of the first image of the reflected light is processed (50) by performing suitable filtering of a Fourier transform of the intensity distribution of the reflected light so as to emphasize features having an intensity variation of interest. The features of the intensity distribution of the reflected light having the variation of interest are analyzed to determine a uniformity value for the surface.
    Type: Application
    Filed: November 13, 2019
    Publication date: January 13, 2022
    Inventors: Francis T. Caruso, Jeffrey K. Eliason, David L. Hofeldt, Joseph E. Hernandez, Joshua A. Gullickson
  • Patent number: 11143590
    Abstract: A time-domain terahertz (THz) measurement system includes a single reference surface. A reference beam providing the single reference surface is supported at two mounting points, at least one of which is a non-fixed mounting point to allow for thermal expansion of the reference beam. The system acquires an air scan profile of the single reference surface with no sample present at a first time, and a sample scan profile with the sample present at a second time. The system further performs a linear correction of the air scan profile using distance measurements at two reference points outside the boundaries of the sample collected at the time of acquisition of the air scan profile and the sample scan profile. The system measures one or more properties of a sample, including, for example, a thickness profile of the sample and an effective refractive index profile of the sample.
    Type: Grant
    Filed: March 14, 2019
    Date of Patent: October 12, 2021
    Assignee: 3M INNOVATIVE PROPERTIES COMPANY
    Inventor: David L. Hofeldt
  • Publication number: 20200408678
    Abstract: A time-domain terahertz (THz) measurement system includes a single reference surface. A reference beam providing the single reference surface is supported at two mounting points, at least one of which is a non-fixed mounting point to allow for thermal expansion of the reference beam. The system acquires an air scan profile of the single reference surface with no sample present at a first time, and a sample scan profile with the sample present at a second time. The system further performs a linear correction of the air scan profile using distance measurements at two reference points outside the boundaries of the sample collected at the time of acquisition of the air scan profile and the sample scan profile. The system measures one or more properties of a sample, including, for example, a thickness profile of the sample and an effective refractive index profile of the sample.
    Type: Application
    Filed: March 14, 2019
    Publication date: December 31, 2020
    Inventor: David L. Hofeldt
  • Patent number: 9977154
    Abstract: A manufacturing system includes a sensing system that provides high-resolution feedback for web guiding and tension control. The system may be especially useful for web material that is manufactured to include micro-replicated structures with micron size scale. A micro-replication station forms a pattern of micro-replicated lenses on a web material. The sensing system illuminates a measurement area on the web material and detects an angular distribution of light exiting a set of the micro-replicated lenses within the first measurement area. A control system that adjusts at least one process control parameter of the transport system based on the detected angular distribution.
    Type: Grant
    Filed: March 30, 2011
    Date of Patent: May 22, 2018
    Assignee: 3M INNOVATIVE PROPERTIES COMPANY
    Inventors: David L. Hofeldt, Robert L. Brott, Daniel H. Carlson, James N. Dobbs, Andrzej P. Jaworski, Glen A. Jerry, John T. Strand, Michael J. Sykora, Karl K. Stensvad
  • Patent number: 9002072
    Abstract: A system is described for detecting the presence of non-uniformity patterns and providing output indicative of a severity of each type of non-uniformity pattern. The system includes a computerized rating tool that assists a user in efficiently and consistently assigning expert ratings (i.e., labels) to a large collection of training images representing samples of a given product. In addition, the rating software develops a model that allows a computerized inspection system to detect the presence of non-uniformity patterns in a manufactured web material in real time and provide output indicative of a severity level of each pattern on a continuous scale. The system also includes algorithmic and hardware approaches to significantly that increase the throughput of the inspection system.
    Type: Grant
    Filed: February 14, 2012
    Date of Patent: April 7, 2015
    Assignee: 3M Innovative Properties Company
    Inventors: Catherine P. Tarnowski, Kenneth G. Brittain, David L. Hofeldt, Andrzej P. Jaworski, Gregory D. Kostuch, John A. Ramthun, Evan J. Ribnick, Esa H. Vilkama, Derek H. Justice, Guillermo Sapiro
  • Patent number: 8965116
    Abstract: A computerized rating tool is described that assists a user in efficiently and consistently assigning expert ratings (i.e., labels) to a large collection of training images representing samples of a given product. The rating tool provides mechanisms for visualizing the training images in an intuitive and configurable fashion, including clustering and ordering the training images. In some embodiments, the rating tool provides an easy-to-use interface for exploring multiple types of defects represented in the data and efficiently assigning expert ratings. In other embodiments, the computer automatically assigns ratings (i.e., labels) to the individual clusters containing the large collection of digital images representing the samples.
    Type: Grant
    Filed: October 14, 2011
    Date of Patent: February 24, 2015
    Assignee: 3M Innovative Properties Company
    Inventors: Evan J. Ribnick, Kenneth G. Brittain, Gregory D. Kostuch, Catherine P. Tarnowski, Derek H. Justice, Guillermo Sapiro, Sammuel D. Herbert, David L. Hofeldt
  • Publication number: 20150009301
    Abstract: A method includes imaging a surface with at least one imaging sensor, wherein the surface and the imaging sensor are in relative translational motion. The imaging sensor includes a lens having a focal plane aligned at a non-zero angle with respect to an x-y plane of a surface coordinate system. A sequence of images of the surface is registered and stacked along a z direction of a camera coordinate system to form a volume. A sharpness of focus value is determined for each (x,y) location in the volume, wherein the (x,y) locations lie in a plane normal to the z direction of the camera coordinate system. Using the sharpness of focus values, a depth of maximum focus zm along the z direction in the camera coordinate system is determined for each (x,y) location in the volume, and based on the depths of maximum focus zm, a three dimensional location of each point on the surface may be determined.
    Type: Application
    Filed: January 30, 2013
    Publication date: January 8, 2015
    Inventors: Evan J. Ribnick, Yi Qiao, Jack W. Lai, David L. Hofeldt
  • Publication number: 20140362371
    Abstract: A method includes forming a two-dimensional interrogating beam on a selected sample region of a surface; collecting light transmitted through or reflected from the sample region with an array of lenses to form a sample array of focus spots; imaging the sample array of focus spots through an imaging lens on a sensor; and comparing an image of the sample array of focus spots to a reference array of focus spots to determine a level of non-uniformity in the sample region.
    Type: Application
    Filed: December 11, 2012
    Publication date: December 11, 2014
    Inventors: Yi Qiao, Jack W. Lai, Evan J. Ribnick, David L. Hofeldt
  • Publication number: 20140240720
    Abstract: A method includes passing an interrogating light beam through a Fourier transform lens and onto the surface of a material to form a Fraunhofer diffraction pattern of one or more surface features of the material. An image of the diffraction pattern is processed to determine the dimensions of the feature.
    Type: Application
    Filed: September 13, 2012
    Publication date: August 28, 2014
    Inventors: Yi Qiao, Michael W. Dolezal, David L. Hofeldt, Jack W. Lai, Catherine P. Tarnowski
  • Publication number: 20130322733
    Abstract: A system is described for detecting the presence of non-uniformity patterns and providing output indicative of a severity of each type of non-uniformity pattern. The system includes a computerized rating tool that assists a user in efficiently and consistently assigning expert ratings (i.e., labels) to a large collection of training images representing samples of a given product. In addition, the rating software develops a model that allows a computerized inspection system to detect the presence of non-uniformity patterns in a manufactured web material in real time and provide output indicative of a severity level of each pattern on a continuous scale. The system also includes algorithmic and hardware approaches to significantly that increase the throughput of the inspection system.
    Type: Application
    Filed: February 14, 2012
    Publication date: December 5, 2013
    Applicant: 3M Innovative Properties Company
    Inventors: Catherine P. Tarnowski, Kenneth G. Brittain, David L. Hofeldt, Andrzej P. Jaworski, Gregory D. Kostuch, John A. Ramthun, Evan J. Ribnick, Esa H. Vilkama, Derek H. Justice, Guillermo Sapiro
  • Publication number: 20130208978
    Abstract: A computerized inspection system is described for detecting the presence of non-uniformity defects in a manufactured web material and for providing output indicative of a severity level of each defect. The system provides output that provides the severity levels of the non-uniformity defects in real-time on a continuous scale. Training software processes a plurality of training samples to generate a model, where each of the training samples need only be assigned one of a set of discrete rating labels for the non-uniformity defects. The training software generates the model to represent a continuous ranking of the training images, and the inspection system utilizes the model to compute the severity levels of the web material on a continuous scale in real-time without limiting the output to the discrete rating labels assigned to the training samples.
    Type: Application
    Filed: October 4, 2011
    Publication date: August 15, 2013
    Applicant: 3M INNOVATIVE PROPERTIES COMPANY
    Inventors: Evan J. Ribnick, David L. Hofeldt, Derek H. Justice, Guillermo Sapiro
  • Publication number: 20130202200
    Abstract: A computerized rating tool is described that assists a user in efficiently and consistently assigning expert ratings (i.e., labels) to a large collection of training images representing samples of a given product. The rating tool provides mechanisms for visualizing the training images in an intuitive and configurable fashion, including clustering and ordering the training images. In some embodiments, the rating tool provides an easy-to-use interface for exploring multiple types of defects represented in the data and efficiently assigning expert ratings. In other embodiments, the computer automatically assigns ratings (i.e., labels) to the individual clusters containing the large collection of digital images representing the samples.
    Type: Application
    Filed: October 14, 2011
    Publication date: August 8, 2013
    Applicant: 3M Innovative Properties Company
    Inventors: Evan J. Ribnick, Kenneth G. Brittain, Gregory D. Kostuch, Catherine P. Tarnowski, Derek H. Justice, Guillermo Sapiro, Sammuel D. Herbert, David L. Hofeldt
  • Publication number: 20130113919
    Abstract: An inspection device comprises a camera assembly including an objective lens that captures and collimates light associated with an object being inspected, an image forming lens that forms an image of the object based on the collimated light, and a camera that renders the image. The camera assembly defines a focal point distance from the objective lens that defines a focal point of the camera assembly. The inspection device comprises an optical sensor positioned to detect an actual distance between the objective lens and the object, an actuator that controls positioning of the objective lens to control the actual distance between the objective lens and the object, and a control unit that receives signals from the optical sensor indicative of the actual distance. Control signals from the control unit can control the actuator to adjust the actual distance such that the actual distance substantially equals the focal point distance.
    Type: Application
    Filed: July 13, 2011
    Publication date: May 9, 2013
    Applicant: 3M INNOVATIVE PROPERTIES COMPANY
    Inventors: Yi Qiao, Jack W. Lai, Jeffrey J. Fontaine, Steven C. Reed, Catherine P. Tarnowski, David L. Hofeldt
  • Publication number: 20130009329
    Abstract: A manufacturing system includes a sensing system that provides high-resolution feedback for web guiding and tension control. The system may be especially useful for web material that is manufactured to include micro-replicated structures with micron size scale. A micro-replication station forms a pattern of micro-replicated lenses on a web material. The sensing system illuminates a measurement area on the web material and detects an angular distribution of light exiting a set of the micro-replicated lenses within the first measurement area. A control system that adjusts at least one process control parameter of the transport system based on the detected angular distribution.
    Type: Application
    Filed: March 30, 2011
    Publication date: January 10, 2013
    Inventors: David L. Hofeldt, Robert L. Brott, Daniel H. Carlson, James N. Dobbs, Andrzej P. Jaworski, Glen A. Jerry, John T. Strand, Michael J. Sykora, Karl K. Stensvad
  • Patent number: 8339573
    Abstract: A method includes providing a substrate having a layer of photosensitive material thereon and a mask having contiguous first, second, and third portions; and sequentially: i) scanning the first portion with a light beam at a first rate and subsequently impinges on the photosensitive material at an exposure zone; ii) fixing the scanning within the second portion; and iii) resuming scanning through the third portion. Throughout the process the substrate moves through the exposure zone. An apparatus for carrying out the process includes a light beam source, a mask mount, a mask stage, a conveyor assembly, and at least one optical element for manipulating the light beam into a rectangular light beam.
    Type: Grant
    Filed: May 27, 2009
    Date of Patent: December 25, 2012
    Assignee: 3M Innovative Properties Company
    Inventors: Daniel J. Theis, Levent Biyikli, Jeffrey H. Tokie, David L. Hofeldt
  • Patent number: 7969560
    Abstract: An apparatus that can measure both haze and clarity on a web moving at conventional manufacturing speeds. The apparatus uses an integrating sphere and a novel mirror arrangement. With this arrangement, the invention can utilize a calibration curve created using known samples over the range of measurement desired to convert in real time, and the response of two photo detectors that measure the wide and low angle scattering signals, to deduce the desired optical property values. This approach significantly increases the speed and response of sensor and enables either on-line single point or full web scanning for uniformity measurement and control.
    Type: Grant
    Filed: July 1, 2008
    Date of Patent: June 28, 2011
    Assignee: 3M Innovative Properties Company
    Inventors: Gregory D. Kostuch, David L. Hofeldt
  • Patent number: 7957000
    Abstract: Systems and methods for calibrating a web inspection system.
    Type: Grant
    Filed: May 25, 2010
    Date of Patent: June 7, 2011
    Assignee: 3M Innovative Properties Company
    Inventors: David L. Hofeldt, Derek H. Justice, John A. Ramthun, Catherine P. Tarnowski, Wenyuan Xu
  • Publication number: 20100304309
    Abstract: A method includes providing a substrate having a layer of photosensitive material thereon and a mask having contiguous first, second, and third portions; and sequentially: i) scanning the first portion with a light beam at a first rate and subsequently impinges on the photosensitive material at an exposure zone; ii) fixing the scanning within the second portion; and iii) resuming scanning through the third portion. Throughout the process the substrate moves through the exposure zone. An apparatus for carrying out the process includes a light beam source, a mask mount, a mask stage, a conveyor assembly, and at least one optical element for manipulating the light beam into a rectangular light beam.
    Type: Application
    Filed: May 27, 2009
    Publication date: December 2, 2010
    Inventors: Daniel J. Theis, Levent Biyikli, Jeffrey H. Tokie, David L. Hofeldt