Patents by Inventor David L. Platt

David L. Platt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8303079
    Abstract: A cleaning apparatus for use in an inkjet imaging device comprises a wiper filament carriage; a wiper filament; and a filament tensioning system supported by the wiper filament carriage. The filament tensioning system is operably coupled to opposing ends of the wiper filament and configured to tension the wiper filament to form a substantially straight line therebetween.
    Type: Grant
    Filed: August 11, 2008
    Date of Patent: November 6, 2012
    Assignee: Xerox Corporation
    Inventors: Isaac S. Frazier, David L. Platt, Debra Ranee Koehler, Dan Leo Massopust
  • Patent number: 7026827
    Abstract: A portable calibration unit for calibrating test equipment is disclosed that may incorporate a communication interface for connecting to a computer embedded within the test equipment, a variable signal source for producing a test signal, a processor in communication with the computer for controlling the variable signal source, and a test interface for communicating the test signal to the test equipment.
    Type: Grant
    Filed: September 30, 2003
    Date of Patent: April 11, 2006
    Assignee: Agilent Technologies, Inc.
    Inventors: Fred H. Ives, David L. Platt
  • Patent number: 6587671
    Abstract: An RF test set having a concurrent measurement architecture is provided. The RF test set is adapted for testing an RF communications device such as a cellular phone according to a set of RF tests. An RF source and an RF receiver are used to communicate with the cellular phone in order to perform the call processing operations to control the cellular phone while performing parametric measurements according to the RF tests. Concurrent measurements allow operation of concurrent measurement processes and call processing operations to take place in the RF test set in order to decrease the time required for each RF test and to increase measurement throughput of the RF test set.
    Type: Grant
    Filed: May 28, 1999
    Date of Patent: July 1, 2003
    Assignee: Agilent Technologies, Inc.
    Inventors: Kerwin D. Kanago, David L. Platt, James B. Summers, Melvin D. Humpherys, Richard P. Ryan, Matthew Johnson