Abstract: Intermodule testing in a computer system including a plurality of modules interconnected via a system bus is performed by means of a serial test bus which is incorporated into the computer system for testing components, for example integrated circuits, used to construct the modules of the computer system. Intermodule test data is maintained in memory on each of the modules and is accessible through operations of the serial test bus. Intermodule test data is retrieved by the serial test bus and used to set up the modules so that one module drives the system bus with test signals defined by test vectors included within the intermodule test data. The remaining modules are set up to receive the test signals. Tables are developed in accordance with the intermodule test data to define which test signals drive which system bus leads and also which receiving modules receive the test signals.

Abstract: A method for detecting JTAG errors in which components in a boundary scan path of a JTAG serial test bus connect a single bit bypass register into the scan path rather than the expected register when errors are detected. JTAG instruction signals are shifted into the scan path to determine whether an instruction error was received by a component. Data scanned into the component is prefixed by a header which is monitored by the JTAG control circuitry to detect any instruction errors. The combined data and header are padded by bits preceding the header to be equal to a multiple of a data register contained within the JTAG control circuitry. The least significant bit positions of the header and the padding bits are shifted out of the data register prior to the time that the header or first byte of the header should have been in the data register of the JTAG control circuitry such that the least significant bit of the data register is a 1, if no single error occurred, and is a 0 if a single error occurred.

Abstract: A boundary-scan enable cell which includes critical and non-critical enable paths without adding an extra layer of logic. The boundary-scan cell includes a multiplexer, a critical enable path which transmits critical enable terms coupled to a first multiplexer input, a sampling circuit which transmits non-critical terms coupled to a second multiplexer input, and a non-critical term path which transmits non-critical masking terms, coupled to the shift input of the multiplexer. Non-critical terms at the shift input are mimicked at the second input. Provision is also made for a test control circuit and a circuit for monitoring critical and non-critical terms.

Abstract: System configuration, monitoring and control functions are performed in a computer system by means of a serial test bus which is incorporated into the computer system for testing components, for example integrated circuits, used to construct one or more modules of the system. The conventional serial test bus is modified to include register circuitry on modules of the computer system and/or within integrated circuits which are interconnected to construct the modules. These registers are written and read by the serial test bus for configuring the computer system as well as performing other operations such as monitoring and error logging within the computer system. To extend the amount of information which can be contained within these registers, preferably memory devices such as EEPROM, RAM, and the like, are associated with the registers and accessible therethrough.

Abstract: Nonvolatile memory is provided on each module of a computer system including one or more modules with each module including a plurality of components including JTAG technology. A test bus operable in accordance with the 1149.1 standard is included in the computer system and is arranged to access the nonvolatile memory. Boundary scan information for the components on a module and also additional information, preferably fully describing all JTAG related characteristics and operations, is stored in the nonvolatile memory. A JTAG bus system is then able to access the module memory and obtain all information required to fully implement JTAG operations for the module.

Abstract: A boundary-scan output cell which includes critical data term and non-critical masking term paths without adding an extra layer of logic. The boundary-scan cell includes a multiplexer, a critical data path which transmits critical data terms, coupled to a first multiplexer input, a sampling circuit which transmits non-critical terms, term circuit coupled to a second multiplexer input, and a non-critical term path which transmits non-critical masking terms, coupled to the shift input of the multiplexer. Non-critical masking terms at the shift input are mimicked at the second input. Provision is also made for a test control circuit and a circuit for monitoring critical and non-critical terms.

Abstract: A boundary-scan circuit for a system clock input pin of an integrated circuit which prevents the transmission of undesirable pulses into the clock inputs of the core logic circuits during switching to or from the test clock. This is accomplished by synchronizing the signal that controls the switching from or to the system clock to provide such switching during the inactive portion of the system clock cycle. The boundary-scan circuit uses plural switching elements to provide sufficient current drive to prevent degradation of a rise time of any clock pulse transmitted thereby without the use of additional current buffers.

Abstract: The subject invention is a FIFO memory system and method for buffering data between two data busses. The system comprises a RAM memory, write and read pointer registers, an offset generator, a programmable offset register, and a comparator. The write pointer register stores the address of the next data element to be written into the RAM memory, and the read pointer register stores the address of the next data element to be read from the RAM memory. The offset generator compares the contents of the registers, and generates at an output thereof an offset signal representing the amount of memory space occupied. The programmable offset register provides a programmed offset signal. The comparator compares the offset signal and the programmed offset signal, and provides a ready signal when the offset signal is greater than or equal to the programmed offset signal.

Abstract: A boundary-scan circuit method and apparatus for asserting an internal reset signal connected to core logic circuits of an electronic device in order to assure that testing will begin and end in a safe, known logic state. A safe end state is assured even if the system reset signal on an input pin of the electronic device is logically disconnected from the internal reset connection to the core logic, as often occurs in boundary-scan and related testing.

Abstract: A boundary-scan circuit for a bidirectional pin of an integrated circuit which uses fewer standard cells if a cell design is considered, or fewer devices if non-standard cell integrated circuits are considered. In either case, the present invention provides the same functionality as provided in of the bidirectional boundary-scan circuits shown in TEEE 1149.1 in a circuit that should be more compact for the same logic family and integration technology.

Abstract: The subject invention is a circuit and method of providing the sum of first and second n bit binary numbers having a difference of one or less. The method comprises combining the least significant bits of the numbers in a first coincidence gate to provide the least significant bit of the sum, combining the nth and (n-1)st bits of the numbers in a first logic network to provide the most significant bit of the sum, and combining solely the ith and (i-1)st bits of the numbers in an ith logic network to provide the ith bit of the sum, for all values of i where 1<i<n+1.