Patents by Inventor David Laube

David Laube has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11901164
    Abstract: A method is disclosed, which comprises estimating a first value of a parameter of a component, prior to a use of the component in a reactor. In an example, the parameter of the component is to change during the use of the component in the reactor. The component may be treated, subsequent to the use of the component in the reactor. A second value of the parameter of the component may be estimated, subsequent to treating the component. The second value may be compared with the first value, where a reuse of the component in the reactor is to occur in response to the second value being within a threshold range of the first value.
    Type: Grant
    Filed: October 4, 2021
    Date of Patent: February 13, 2024
    Assignee: Intel Corporation
    Inventors: Patrick Whiting, Jeffrey L. Young, Ryan Wood, Eric Scott, David Laube, Alex Collins
  • Publication number: 20220028668
    Abstract: A method is disclosed, which comprises estimating a first value of a parameter of a component, prior to a use of the component in a reactor. In an example, the parameter of the component is to change during the use of the component in the reactor. The component may be treated, subsequent to the use of the component in the reactor. A second value of the parameter of the component may be estimated, subsequent to treating the component. The second value may be compared with the first value, where a reuse of the component in the reactor is to occur in response to the second value being within a threshold range of the first value.
    Type: Application
    Filed: October 4, 2021
    Publication date: January 27, 2022
    Applicant: Intel Corporation
    Inventors: Patrick Whiting, Jeffrey L. Young, Ryan Wood, Eric Scott, David Laube, Alex Collins
  • Patent number: 11139151
    Abstract: A method is disclosed, which comprises estimating a first value of a parameter of a component, prior to a use of the component in a reactor. In an example, the parameter of the component is to change during the use of the component in the reactor. The component may be treated, subsequent to the use of the component in the reactor. A second value of the parameter of the component may be estimated, subsequent to treating the component. The second value may be compared with the first value, where a reuse of the component in the reactor is to occur in response to the second value being within a threshold range of the first value.
    Type: Grant
    Filed: March 15, 2018
    Date of Patent: October 5, 2021
    Assignee: Intel Corporation
    Inventors: Patrick Whiting, Jeffrey L. Young, Ryan Wood, Eric Scott, David Laube, Alex Collins
  • Publication number: 20210265137
    Abstract: Following use of a reactive process chamber, a component of the chamber, such as an edge ring that is to surround a workpiece during an etching process, may be refurbished through one or more residue removal operations followed by a surface texturing operation. The texturing operation may entail media blasting with a gaseous media propellant comprising a smaller fraction of O2 than air, such as high purity dry N2. The more inert gaseous media propellant may advantageously control oxygen contamination of a bulk metal, such as aluminum. Reconditioning may further entail a chemical treatment, which thins or completely removes, a surface oxide present after the texturing operation. The conditioned surface may then have a surface composition and texture that is capable of matching the performance of a previously unused chamber component.
    Type: Application
    Filed: February 9, 2021
    Publication date: August 26, 2021
    Applicant: Intel Corporation
    Inventors: Jeffrey Young, Patrick Whiting, David Laube
  • Publication number: 20070207267
    Abstract: Disposable liners for shielding semiconductor reactor chamber components from erosion in the reactor chamber. More specifically, disposable metal liners and a method of forming such liners wherein the disposable liners have a dielectric material on a surface of the liners to protect semiconductor reactor chamber components from erosion. The disposable liners are formed from a metal sheet that conforms to a surface of a chamber component wherein the metal sheet is subsequently oxidized in an electrolyte free from contaminants using plasma electrolytic oxidation.
    Type: Application
    Filed: February 7, 2007
    Publication date: September 6, 2007
    Inventor: David Laube
  • Publication number: 20070111642
    Abstract: Described are methods of cleaning debris from semiconductor etch chambers or chamber components, one method comprising directing atomized abrasive slurry onto at least some internal surfaces of such a chamber or chamber components. Apparatus for carrying out the methods are also described.
    Type: Application
    Filed: November 14, 2005
    Publication date: May 17, 2007
    Inventors: Ian Davis, David Laube
  • Publication number: 20060151434
    Abstract: An improved process for predictably treating a substrate surface is provided comprising the use of a pre-selected thixotropic etchants to achieve a superior and predetermined substrate surface.
    Type: Application
    Filed: January 7, 2005
    Publication date: July 13, 2006
    Inventors: John Deem, David Laube
  • Publication number: 20050215059
    Abstract: A process of producing a clean substrate for use in semi-conductor processing in which the substrate is roughened to produce microfissures therein and then treated with a high concentration of a strong acid followed by coating with a material containing at least one metal oxide.
    Type: Application
    Filed: March 24, 2004
    Publication date: September 29, 2005
    Inventors: Ian Davis, David Laube