Abstract: Preamble release training in a double data-rate dynamic random access memory interface uses feedback from read operations to adjust the preamble release signal so that the preamble release signal continues to be activated close to the middle of the preamble. A first signal, and then a second signal, are generated in response to an initiation of a read operation. The first and second signals are characterized by a delay from the initiation of the read operation of one or more clock cycles plus a fine delay contributed by an adjustable delay circuit. The first signal is provided to a data strobe parking circuit that uses it to release or un-park the data strobe signal lines. The second signal is phase-compared with the data strobe signal associated with incoming data during the read operation. The adjustable delay circuit is adjusted in response to the result of the comparison.

Abstract: A write leveling calibration system and method for double data-rate dynamic random access memory includes performing write leveling at two different frequencies to determine to which of two successive rising clock cycle edges each data strobe signal would be aligned as a result of applying the write leveling delay determined by the write-leveling procedure. The determination can then be used to ensure that the data strobe signals of all source synchronous groups are aligned with the same edge of the clock signal.

Abstract: Preamble release training in a double data-rate dynamic random access memory interface uses feedback from read operations to adjust the preamble release signal so that the preamble release signal continues to be activated close to the middle of the preamble. A first signal, and then a second signal, are generated in response to an initiation of a read operation. The first and second signals are characterized by a delay from the initiation of the read operation of one or more clock cycles plus a fine delay contributed by an adjustable delay circuit. The first signal is provided to a data strobe parking circuit that uses it to release or un-park the data strobe signal lines. The second signal is phase-compared with the data strobe signal associated with incoming data during the read operation. The adjustable delay circuit is adjusted in response to the result of the comparison.

Abstract: Circuits and methods for reducing noise in the power supply of circuits coupled to a bidirectional bus are presented. The circuits and methods are responsive to an idle condition on the bidirectional bus. The control signal is applied to and changes an electrical characteristic within the receiver to generate a voltage offset. The voltage offset prevents unintended voltage transitions in the power supply of circuits coupled to the bidirectional bus from generating a signal transition on an output signal connection of the receiver.

Abstract: An input/output interface reads data from and writes data to a DDR memory. The interface includes data and strobe circuits. The strobe circuit includes preamble logic, a first counter operating with a strobe clock, a second counter operating with an ASIC-generated clock, a strobe park circuit and a first synchronizer. The preamble logic receives strobe signals from the DDR memory and generates a preamble signal. The first counter generates a first input of the strobe park circuit. The second counter generates a second input of the strobe park circuit. The strobe park circuit controllably replaces the strobe signals from the DDR memory with respective non-transitioning signals when data is not being read. The data circuit includes a FIFO buffer and a second synchronizer. The FIFO buffer receives data with the strobe clock. The second synchronizer generates a representation of the data in response to the ASIC-generated clock.

Abstract: Circuits and methods for reducing noise in the power supply of circuits coupled to a bidirectional bus are presented. The circuits and methods are responsive to an idle condition on the bidirectional bus. The control signal is applied to and changes an electrical characteristic within the receiver to generate a voltage offset. The voltage offset prevents unintended voltage transitions in the power supply of circuits coupled to the bidirectional bus from generating a signal transition on an output signal connection of the receiver.

Abstract: An input/output interface reads data from and writes data to a DDR memory. The interface includes data and strobe circuits. The strobe circuit includes preamble logic, a first counter operating with a strobe clock, a second counter operating with an ASIC-generated clock, a strobe park circuit and a first synchronizer. The preamble logic receives strobe signals from the DDR memory and generates a preamble signal. The first counter generates a first input of the strobe park circuit. The second counter generates a second input of the strobe park circuit. The strobe park circuit controllably replaces the strobe signals from the DDR memory with respective non-transitioning signals when data is not being read. The data circuit includes a FIFO buffer and a second synchronizer. The FIFO buffer receives data with the strobe clock. The second synchronizer generates a representation of the data in response to the ASIC-generated clock.

Abstract: A hybrid binary/thermometer code is employed to adjust the output impedance of a variable impedance output driver circuit having an impedance network comprising a plurality of impedance legs each programmably electrically connectable according to the hybrid binary/thermometer code in parallel between a voltage source and the signal pad. The plurality of impedance legs are partitioned into one or more set pairs of binary stepped impedance legs and corresponding thermometer stepped impedance legs. A binary set of calibration signals in the hybrid binary/thermometer code steps a given set of binary stepped impedance legs according to a binary code and a thermometer set of calibration signals in the hybrid binary/thermometer code steps the corresponding set of thermometer stepped impedance legs according to a thermometer code once per full count iteration of the binary set of calibration signals.

Abstract: A method and apparatus for testing an integrated circuit interconnect comprises an IC having circuitry embedded in the IC capable of providing a pseudo time domain reflectometry test by launching a test transition onto the interconnect and capturing a reflection of the test transition.

Abstract: A novel output driver for an integrated circuit, and method for controlling the slew rate of output signals driven by the output driver, is presented. The output driver employs a delayed activation of a succession of weak impedance zip legs followed by a preferably delayed activation of a succession of strong impedance drive legs. During a transition of an output signal on an output node of the driver from a first drive state to a second drive state, each zip leg, in its turn, turns off driving the output node to the first drive state and then turns on driving the output node to the second drive state. Once all zip legs have been activated, the activation of the succession of strong drive legs supplements the combined current provided by the zip legs to provide the full required drive current of the driver driving the output node to the second drive state.

Abstract: A hybrid binary/thermometer code is employed to adjust the output impedance of a variable impedance output driver circuit having an impedance network comprising a plurality of impedance legs each programmably electrically connectable according to the hybrid binary/thermometer code in parallel between a voltage source and the signal pad. The plurality of impedance legs are partitioned into one or more set pairs of binary stepped impedance legs and corresponding thermometer stepped impedance legs. A binary set of calibration signals in the hybrid binary/thermometer code steps a given set of binary stepped impedance legs according to a binary code and a thermometer set of calibration signals in the hybrid binary/thermometer code steps the corresponding set of thermometer stepped impedance legs according to a thermometer code once per full count iteration of the binary set of calibration signals.

Abstract: A CMOS buffer with hysteresis is implemented. In one embodiment, an upper-trip circuit (102) and a lower-trip circuit (104) are implemented with CMOS inverters. The upper-trip circuit (102) and the lower-trip circuit (104) provides output to a pull-up device (110) and a pull-down device (111), respectively. The pull-up device (110) and the pull-down device (111) both generate an output signal onto a net (112). A bus holder (114) is coupled to the net (112) and maintains the output signal. In addition, an output circuit (116) is coupled to the net (112) and processes the output signal. In one embodiment, the output circuit is implemented with a CMOS buffer and functions as a buffer with hysteresis. In another embodiment, the output circuit is implemented with an inverter and functions as an inverting buffer with hysteresis. In a third embodiment, the output circuit is implemented with a connection (i.e., signal conveyance) and functions as a non-inverting buffer with hysteresis.

Abstract: A differential register slave structure is presented. In one embodiment, a differential register includes a storage node (218, 318). The storage node (218, 318) stores and holds the differential values generated by the differential register. In one embodiment of the present invention, on power-up, when the state of various clocks (i.e., master, slave) in the differential register may be indeterminate, the storage node (218, 318) will discharge the differential values and the differential register will produce a differential output.