Abstract: A vacuum-assisted arrangement for testing integrated circuits uses a first vacuum source to removably hold a test socket in place with respect to a test fixture. The socket further includes a plurality of alignment features to allow for the socket to be self-aligned with respect to the fixture. A second vacuum source is coupled through the combination of the fixture and the socket and is used to hold a device-under-test in place within the socket. The socket is formed to including a plurality of conductive elastomer contacts and the application of a consistent vacuum force allows for consistent testing of the integrated circuit devices.