Patents by Inventor David Lorenz Gardner

David Lorenz Gardner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9196467
    Abstract: A mass spectrometer comprising a controller configured to generate an RF signal to be applied to an electrode during the mass scan, wherein the electrode generates, based on the RF signal, an electric field to be applied to sample ions during a mass scan; an ion detector configured to detect sample ions passing through the electric field and generate a corresponding ion detection signal; and a sampling circuit configured to sample the ion detection signal; wherein the controller is configured to adjust a phase of the at least one RF signal relative to a sample timing of the sampling circuit and average successive mass scans to cancel a portion of the RF signal present in the ion detection signal.
    Type: Grant
    Filed: March 11, 2013
    Date of Patent: November 24, 2015
    Assignee: 1st DETECT CORPORATION
    Inventors: David Rafferty, David Lorenz Gardner, James Wylde
  • Patent number: 9035244
    Abstract: A method and apparatus for performing mass spectrometry using an electron source, an ion trap, and a voltage-controlled lens located between the electron source and the ion trap. A controller applies a voltage to the lens. Features of the resulting output spectrum can be analyzed to determine whether to adjust the lens voltage.
    Type: Grant
    Filed: March 10, 2014
    Date of Patent: May 19, 2015
    Assignee: 1st Detect Corporation
    Inventors: David Rafferty, Michael Spencer, James Wylde, David Lorenz Gardner, Warren Mino
  • Publication number: 20140252222
    Abstract: A method and apparatus for performing mass spectrometry using an electron source, an ion trap, and a voltage-controlled lens located between the electron source and the ion trap. A controller applies a voltage to the lens. Features of the resulting output spectrum can be analyzed to determine whether to adjust the lens voltage.
    Type: Application
    Filed: March 10, 2014
    Publication date: September 11, 2014
    Applicant: 1st Detect Corporation
    Inventors: David RAFFERTY, Michael SPENCER, James WYLDE, David Lorenz GARDNER, Warren MINO
  • Publication number: 20140252220
    Abstract: A mass spectrometer comprising a controller configured to generate an RF signal to be applied to an electrode during the mass scan, wherein the electrode generates, based on the RF signal, an electric field to be applied to sample ions during a mass scan; an ion detector configured to detect sample ions passing through the electric field and generate a corresponding ion detection signal; and a sampling circuit configured to sample the ion detection signal; wherein the controller is configured to adjust a phase of the at least one RF signal relative to a sample timing of the sampling circuit and average successive mass scans to cancel a portion of the RF signal present in the ion detection signal.
    Type: Application
    Filed: March 11, 2013
    Publication date: September 11, 2014
    Applicant: 1st Detect Corporation
    Inventors: David Rafferty, David Lorenz Gardner, James Wylde