Abstract: A clinical grid electrode system for seizure control through local cooling, mapping brain function and me provision of reversible functional ablation. The system includes a modular, scalable, cooling and sensing array composed of a plurality of cooling sensing elements. The system also includes a control system to which die cooling and sensing array is coupled for providing for control and monitoring of die cooling sensing elements making up the cooling and sensing array.

Abstract: A clinical grid electrode system for seizure control through local cooling, mapping brain function and me provision of reversible functional ablation. The system includes a modular, scalable, cooling and sensing array composed of a plurality of cooling sensing elements. The system also includes a control system to which die cooling and sensing array is coupled for providing for control and monitoring of die cooling sensing elements making up the cooling and sensing array.

Abstract: Methods and apparatus are provided for testing to determine the existence of defects and faults in circuits, devices, and systems such as digital integrated circuits, SRAM memory, mixed signal circuits, and the like. In particular, methods and apparatus are provided for detecting faults in circuits, devices, and systems using input control signals to generate controlled-duration, controlled pulse-width, transient power supply currents in a device under test, where said transient power supply currents are of controllable bandwidth and can be used as observables to determine faulty or defective operation. Additionally, methods and apparatus are provided to permit high bandwidth sensing of transient supply currents as need to preserve the narrow widths of these current pulses. These methods may include autozero techniques to remove supply current leakage current and DC offsets associated with practical current sensing currents.

Abstract: Methods and apparatus are provided for testing to determine the existence of defects and faults in circuits, devices, and systems such as digital integrated circuits, SRAM memory, mixed signal circuits, and the like. In particular, methods and apparatus are provided for detecting faults in circuits, devices, and systems using input control signals to generate controlled-duration, controlled pulse-width, transient power supply currents in a device under test, where said transient power supply currents are of controllable bandwidth and can be used as observables to determine faulty or defective operation. Additionally, methods and apparatus are provided to permit high bandwidth sensing of transient supply currents as need to preserve the narrow widths of these current pulses. These methods may include autozero techniques to remove supply current leakage current and DC offsets associated with practical current sensing currents.

Abstract: Methods and apparatus are provided for testing to determine the existence of defects and faults in circuits, devices, and systems such as digital integrated circuits, SRAM memory, mixed signal circuits, and the like. In particular, methods and apparatus are provided for detecting faults in circuits, devices, and systems using input control signals to generate controlled-duration, controlled pulse-width, transient power supply currents in a device under test, where said transient power supply currents are of controllable bandwidth and can be used as observables to determine faulty or defective operation. Additionally, methods and apparatus are provided to permit high bandwidth sensing of transient supply currents as need to preserve the narrow widths of these current pulses. These methods may include autozero techniques to remove supply current leakage current and DC offsets associated with practical current sensing currents.

Abstract: A proximity detection system for determining when a single channel receiver becomes proximate to any point on a wireless closed boundary continuously generated by a transmitter. The transmitter includes a magnetic field generator broadcasting a composite, modulated, time-varying magnetic field signal of a particular carrier frequency. The receiver forms a measure of the broadcast magnetic field intensity incident to the location of the receiver or a measure of the power or energy of incident field.

Abstract: A proximity detection system for determining when a single channel receiver becomes proximate to any point on a wireless closed boundary continuously generated by a transmitter. The transmitter includes a magnetic field generator broadcasting a composite, modulated, time-varying magnetic field signal of a particular carrier frequency. The receiver forms a measure of the broadcast magnetic field intensity incident to the location of the receiver or a measure of the power or energy of incident field.

Abstract: Methods and apparatus are provided for testing to determine the existence of defects and faults in circuits, devices, and systems such as digital integrated circuits, SRAM memory, mixed signal circuits, and the like. In particular, methods and apparatus are provided for detecting faults in circuits, devices, and systems using input control signals to generate controlled-duration, controlled pulse-width, transient power supply currents in a device under test, where said transient power supply currents are of controllable bandwidth and can be used as observables to determine faulty or defective operation. Additionally, methods and apparatus are provided to permit high bandwidth sensing of transient supply currents as need to preserve the narrow widths of these current pulses. These methods may include autozero techniques to remove supply current leakage current and DC offsets associated with practical current sensing currents.

Abstract: Methods and apparatus are provided for testing to determine the existence of defects and faults in circuits, devices, and systems such as digital integrated circuits, SRAM memory, mixed signal circuits, and the like. In particular, methods and apparatus are provided for detecting faults in circuits, devices, and systems using input control signals to generate controlled-duration, controlled pulse-width, transient power supply currents in a device under test, where said transient power supply currents are of controllable bandwidth and can be used as observables to determine faulty or defective operation. Additionally, methods and apparatus are provided to permit high bandwidth sensing of transient supply currents as need to preserve the narrow widths of these current pulses. These methods may include autozero techniques to remove supply current leakage current and DC offsets associated with practical current sensing currents.

Abstract: A continuous-time baseline restoration (BLR) circuit providing built-in pulse tail-cancellation, or BLR tail-cancel circuit, in constant fraction discriminator (CFD) arming and timing circuits. The BLR tail cancel circuit is applied at the output of constant fraction timing shaping filters and arming circuits to permit monolithic integrated circuit implementation of CFD circuits operating at high input signal count rates. The BLR tail-cancel circuit provides correction of dc offset and count-rate dependent baseline errors along with simultaneous tail-cancellation. Correction of dc offsets due to electronic device mismatches and count-rate dependent baseline errors is required for accurate time pickoff from the input signals. The reduction of pulse width, or pulse tail-cancellation is required to shorten the duration of high count rate signals to prevent the severe distortion caused by the occurrence a new signal superimposed on the tails of previous signals, a condition known as pulse pileup.

Abstract: A continuous-time baseline restoration (BLR) circuit providing built-in pulse tail-cancellation, or BLR tail-cancel circuit, in constant fraction discriminator (CFD) arming and timing circuits. The BLR tail cancel circuit is applied at the output of constant fraction timing shaping filters and arming circuits to permit monolithic integrated circuit implementation of CFD circuits operating at high input signal count rates. The BLR tail-cancel circuit provides correction of dc offset and count-rate dependent baseline errors along with simultaneous tail-cancellation. Correction of dc offsets due to electronic device mismatches and count-rate dependent baseline errors is required for accurate time pickoff from the input signals. The reduction of pulse width, or pulse tail-cancellation is required to shorten the duration of high count rate signals to prevent the severe distortion caused by the occurrence a new signal superimposed on the tails of previous signals, a condition known as pulse pileup.

Abstract: Methods and apparatus are provided for testing to determine the existence of defects and faults in circuits, devices, and systems such as digital integrated circuits, SRAM memory, mixed signal circuits, and the like. In particular, methods and apparatus are provided for detecting faults in circuits, devices, and systems using input control signals to generate controlled-duration, controlled pulse-width, transient power supply currents in a device under test, where said transient power supply currents are of controllable bandwidth and can be used as observables to determine faulty or defective operation. Additionally, methods and apparatus are provided to permit high bandwidth sensing of transient supply currents as need to preserve the narrow widths of these current pulses. These methods may include autozero techniques to remove supply current leakage current and DC offsets associated with practical current sensing currents.

Abstract: A proximity detection system for determining when a single channel receiver becomes proximate to any point on a wireless closed boundary continuously generated by a transmitter. The transmitter includes a magnetic field generator broadcasting a composite, modulated, time-varying magnetic field signal of a particular carrier frequency. The receiver forms a measure of the broadcast magnetic field intensity incident to the location of the receiver or a measure of the power or energy of incident field.

Abstract: An amplitude- and rise-time-insensitive timing-shaping filter (10) for converting a selected input signal into a bi-polar output signal having a zero-crossing point which is independent of the rise-time and amplitude of substantially linear-edge input signals, and which is amplitude insensitive for input signals of arbitrary fixed shapes. The amplitude- and rise-time-insensitive timing-shaping filter (10) includes an attenuator (14) for generating an attenuated signal, a delay path (12) for generating a delay signal, and a differencer (16) for subtracting the attenuated signal from the delayed signal. The delay path (12) of the present invention includes a low-pass filter of a selected order and configuration, an all-pass filter with a selected order and configuration, or an all-pass-low-pass filter combination for generating a delayed signal.

Abstract: A gain control circuit (10) for remotely controlling the gain of a photomultiplier tube (PMT (12)). The remote gain control circuit (10) may be used with a PMT (12) having any selected number of dynodes (DY). The remote gain control circuit (10) is connected to the last dynode nearest the anode (16) in the dynode string which controls the total dynode supply voltage and influences the gain of each dynode (DY). The remote gain control circuit (10) of the present invention includes an integrated-circuit operational amplifier (U1), a high-voltage transistor (Q1), a plurality of resistors (R), a plurality of capacitors (C), and a plurality of diodes (D). Negative feedback is used to set the last dynode voltage proportional to a voltage controlled by the gain control voltage delivered by a voltage source such as a digital-to-analog converter. The control circuit (10) of the present invention is connected to the last dynode using a single connecting wire (22).