Patents by Inventor David M. Bouse

David M. Bouse has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260086149
    Abstract: A test and measurement system includes a plurality of nodes, one or more nodes comprising sensors configured to receive signals, one or more generative adversarial network (GAN) models, one or more signal generators configured to generate and transmit signals, and one or more processors configured to execute code to cause the one or more processors to receive a request for a signal having a signal profile from a node of the plurality of nodes, send the signal profile and the request to one of the one or more GAN models, receive a matching signal profile that matches the signal profile, and transmit the matching signal profile to one of the one or more signal generators to generate and transmit a matching signal.
    Type: Application
    Filed: August 19, 2025
    Publication date: March 26, 2026
    Inventors: Keith R. Tinsley, David M. Bouse, Sarah R. Boen, Josiah A. Bartlett
  • Patent number: 12436189
    Abstract: A method of generating a calibration signal includes setting a first parameter to an initial first value and a second parameter to an initial second value, generating an initial eye diagram using the initial first value and the initial second value, determining a first difference between a first dimension of the initial eye diagram and a target first dimension, and a second difference between a second dimension of the initial eye diagram and a second target dimension, estimating a next first value to cause the first difference to be zero, setting the first parameter to the next first value, generating a next eye diagram, repeating the estimating, setting, and generating until the first dimension of a most recent next eye diagram is within the first target dimension, setting a final first parameter value to a most recent next first value, setting a final second parameter value to the initial second value when the second dimension of the most recent next eye diagram is within the second target dimension, genera
    Type: Grant
    Filed: December 13, 2021
    Date of Patent: October 7, 2025
    Assignee: Tektronix, Inc.
    Inventors: Subhankar Ghose, Ankit Dash, David M. Bouse
  • Patent number: 12339298
    Abstract: A method of automatically selecting a continuous time linear equalization (CTLE) filter includes capturing a response waveform for a channel of a communication link of a device under test (DUT), generating a set of candidate CTLEs, and automatically selecting the CTLE from the set of candidate CTLEs using the response waveform. A test and measurement instrument has a user interface, a port to allow the instrument to connect to a device under test (DUT), and one or more processors configured to execute code to cause the one or more processors to: generate a set of CTLE candidates; capture a response waveform for the channel; and automatically select the CTLE from the set of candidate CTLEs using the response waveform.
    Type: Grant
    Filed: November 28, 2022
    Date of Patent: June 24, 2025
    Assignee: Tektronix, Inc.
    Inventors: Subhankar Ghose, Ankit Dash, David M. Bouse, Pradeep Joshi
  • Publication number: 20250004014
    Abstract: A test and measurement instrument has a port to receive a signal from a device under test (DUT), one or more processors configured to execute code that causes the one or more processors to acquire a waveform from the signal, derive a pattern waveform from the waveform using one of either hardware or software clock recovery, perform linear fit pulse response (LFPR) extractions on the pattern waveform to extract more than one LFPR, determine a reference pulse response from the more than one LFPRs, compare at least one of the LFPRs to the reference pulse response to determine a difference, and tune the DUT to reduce the difference. The test and measurement instrument may also use the multiple LFPRs as an input to a machine learning network to perform measurement predictions for the DUT.
    Type: Application
    Filed: June 26, 2024
    Publication date: January 2, 2025
    Inventors: Kan Tan, David M. Bouse, John J. Pickerd
  • Publication number: 20230204629
    Abstract: A method of automatically selecting a continuous time linear equalization (CTLE) filter includes capturing a response waveform for a channel of a communication link of a device under test (DUT), generating a set of candidate CTLEs, and automatically selecting the CTLE from the set of candidate CTLEs using the response waveform. A test and measurement instrument has a user interface, a port to allow the instrument to connect to a device under test (DUT), and one or more processors configured to execute code to cause the one or more processors to: generate a set of CTLE candidates; capture a response waveform for the channel; and automatically select the CTLE from the set of candidate CTLEs using the response waveform.
    Type: Application
    Filed: November 28, 2022
    Publication date: June 29, 2023
    Inventors: Subhankar Ghose, Ankit Dash, David M. Bouse, Pradeep Joshi
  • Publication number: 20220192486
    Abstract: A method of generating a calibration signal includes setting a first parameter to an initial first value and a second parameter to an initial second value, generating an initial eye diagram using the initial first value and the initial second value, determining a first difference between a first dimension of the initial eye diagram and a target first dimension, and a second difference between a second dimension of the initial eye diagram and a second target dimension, estimating a next first value to cause the first difference to be zero, setting the first parameter to the next first value, generating a next eye diagram, repeating the estimating, setting, and generating until the first dimension of a most recent next eye diagram is within the first target dimension, setting a final first parameter value to a most recent next first value, setting a final second parameter value to the initial second value when the second dimension of the most recent next eye diagram is within the second target dimension, genera
    Type: Application
    Filed: December 13, 2021
    Publication date: June 23, 2022
    Applicant: Tektronix, Inc.
    Inventors: Subhankar Ghose, Ankit Dash, David M. Bouse