Patents by Inventor David M. Rusinko, Jr.

David M. Rusinko, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electrode tuning method and apparatus for a layered heater structure
    Patent number: 7777160
    Abstract: A layered heater structure including an electrode layer and a localized tuning method for tuning the electrode layer of a layered heater structure with high precision is provided. The localized tuning method tunes the electrode layer to its proper local resistance to minimize temperature offsets on the heater surface and thus provide a desired thermal profile that is in marked contrast to conventional, non-localized resistance tuning approaches based on thickness trimming practices, such as grinding or blasting, or resistivity adjustment, such as local heat treatment.
    Type: Grant
    Filed: December 17, 2007
    Date of Patent: August 17, 2010
    Assignee: Momentive Performance Materials Inc.
    Inventors: Wei Fan, Benjamin J. Olechnowicz, Marc Schaepkens, David M. Rusinko, Jr., Xiang Liu, John T. Mariner
  • Electrode tuning method and apparatus for a layered heater structure
    Publication number: 20090152259
    Abstract: A layered heater structure including an electrode layer and a localized tuning method for tuning the electrode layer of a layered heater structure with high precision is provided. The localized tuning method tunes the electrode layer to its proper local resistance to minimize temperature offsets on the heater surface and thus provide a desired thermal profile that is in marked contrast to conventional, non-localized resistance tuning approaches based on thickness trimming practices, such as grinding or blasting, or resistivity adjustment, such as local heat treatment.
    Type: Application
    Filed: December 17, 2007
    Publication date: June 18, 2009
    Inventors: Wei Fan, Benjamin J. Olechnowicz, Marc Schaepkens, David M. Rusinko, JR., Xiang Liu, John T. Mariner