Abstract: A method for handling an interrupt during testing of at least one logic block of a processor includes performing a test on at least one logic block of a processor; during the performing, receiving an interrupt; determining a progress status of the test in response to receiving the interrupt; and determining when the processor responds to an interrupt, wherein the determining when the processor responds to an interrupt is based on the progress of the test.

Abstract: A timer circuit, comprises a delay indication circuit, a frequency indication circuit, and a plurality of counters. The delay indication circuit is for providing a delay time indication. The frequency indication circuit is for providing a frequency indication of a frequency of a clock signal. Each counter of the plurality of counters includes a load input to receive an initial value, and an indication output to provide a count complete indication of the counter. During operation a set of the counters of the plurality of counters is coupled in series to provide an indication that a delay time has expired. At least a portion of the frequency indication is provided to the load input of one counter of the set and at least a portion of the delay time indication is provided to the load input of another counter of the set.

Abstract: A timer circuit, comprises a delay indication circuit, a frequency indication circuit, and a plurality of counters. The delay indication circuit is for providing a delay time indication. The frequency indication circuit is for providing a frequency indication of a frequency of a clock signal. Each counter of the plurality of counters includes a load input to receive an initial value, and an indication output to provide a count complete indication of the counter. During operation a set of the counters of the plurality of counters is coupled in series to provide an indication that a delay time has expired. At least a portion of the frequency indication is provided to the load input of one counter of the set and at least a portion of the delay time indication is provided to the load input of another counter of the set.

Abstract: A method for handling an interrupt during testing of at least one logic block of a processor includes performing a test on at least one logic block of a processor; during the performing, receiving an interrupt; determining a progress status of the test in response to receiving the interrupt; and determining when the processor responds to an interrupt, wherein the determining when the processor responds to an interrupt is based on the progress of the test.