Patents by Inventor David Merricks
David Merricks has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 6824665Abstract: Disclosed are methods for depositing a copper seed layer on a substrate having a conductive layer. Such methods are particularly suitable for depositing a copper seed layer on a substrate having small apertures, and preferably very small apertures.Type: GrantFiled: October 17, 2001Date of Patent: November 30, 2004Assignee: Shipley Company, L.L.C.Inventors: James G. Shelnut, David Merricks, Oleh B. Dutkewych, Charles R. Shipley
-
Patent number: 6660154Abstract: Disclosed are methods for repairing or enhancing discontinuous metal seed layers prior to subsequent metallization during the manufacture of electronic devices. Such repair methods do not require the use of a second electroplating bath.Type: GrantFiled: October 17, 2001Date of Patent: December 9, 2003Assignee: Shipley Company, L.L.C.Inventors: David Merricks, Denis Morrissey, Martin W. Bayes, Mark Lefebvre, James G. Shelnut, Donald E. Storjohann
-
Patent number: 6660153Abstract: Disclosed are methods for repairing seed layers prior to subsequent metallization during the manufacture of electronic devices.Type: GrantFiled: October 17, 2001Date of Patent: December 9, 2003Assignee: Shipley Company, L.L.C.Inventors: David Merricks, Denis Morrissey, Martin W. Bayes, Mark Lefebvre, James G. Shelnut, Donald E. Storjohann
-
Patent number: 6624070Abstract: Disclosed are catalyst compositions suitable for depositing electroless metal seed layers and for enhancing discontinuous seed layers. Also disclosed are methods of depositing electroless seed layers and enhancing discontinuous seed layers.Type: GrantFiled: October 24, 2001Date of Patent: September 23, 2003Assignee: Shipley Company, L.L.C.Inventors: David Merricks, Martin T. Goosey, Narinder Bains
-
Patent number: 6531046Abstract: Disclosed are methods of repairing metal seed layers prior to subsequent metallization. Such repair methods provide metal seed layers disposed on a substrate that are substantially free of metal oxide and substantially free of discontinuities.Type: GrantFiled: December 15, 2000Date of Patent: March 11, 2003Assignee: Shipley Company, L.L.C.Inventors: Denis Morrissey, David Merricks, Leon R. Barstad, Eugene N. Step, Jeffrey M. Calvert, Robert A. Schetty, III, James G. Shelnut, Mark Lefebvre, Martin W. Bayes, Donald E. Storjohann
-
Publication number: 20020134684Abstract: Disclosed is a process flows for treating seed layers including copper such that various problems such as oxidation and insufficient coverage can be repaired in an effective and efficient manner.Type: ApplicationFiled: October 25, 2001Publication date: September 26, 2002Applicant: Shipley Company, L.L.C.Inventors: Jeffrey M. Calvert, Denis Morrissey, David Merricks
-
Publication number: 20020132042Abstract: Disclosed are catalyst compositions suitable for depositing electroless metal seed layers and for enhancing discontinuous seed layers. Also disclosed are methods of depositing electroless seed layers and enhancing discontinuous seed layers.Type: ApplicationFiled: October 24, 2001Publication date: September 19, 2002Applicant: Shipley Company, L.L.C.Inventors: David Merricks, Martin T. Goosey, Narinder Bains
-
Publication number: 20020090484Abstract: Disclosed are electroplating baths for enhancing copper seed layers and for subsequent metallization on the seed layers. Methods of enhancing copper seed layers and depositing metal on such seed layers are also disclosed.Type: ApplicationFiled: October 17, 2001Publication date: July 11, 2002Applicant: Shipley Company, L.L.C.Inventors: David Merricks, Denis Morrissey, Martin W. Bayes, Mark Lefebvre, James G. Shelnut, Donald R. Storjohann
-
Publication number: 20020088713Abstract: Disclosed are methods for repairing seed layers prior to subsequent metallization during the manufacture of electronic devices.Type: ApplicationFiled: October 17, 2001Publication date: July 11, 2002Applicant: Shipley Company, L.L.C.Inventors: David Merricks, Denis Morrissey, Martin W. Bayes, Mark Lefebvre, James G. Shelnut, Donald E. Storjohann
-
Publication number: 20020084193Abstract: Disclosed are methods for repairing or enhancing discontinuous metal seed layers prior to subsequent metallization during the manufacture of electronic devices. Such repair methods do not require the use of a second electroplating bath.Type: ApplicationFiled: October 17, 2001Publication date: July 4, 2002Applicant: Shipley Company, L.L.C.Inventors: David Merricks, Denis Morrissey, Martin W. Bayes, Mark Lefebvre, James G. Shelnut, Donald E. Storjohann
-
Publication number: 20020066671Abstract: Disclosed are methods for depositing a copper seed layer on a substrate having a conductive layer. Such methods are particularly suitable for depositing a copper seed layer on a substrate having small apertures, and preferably very small apertures.Type: ApplicationFiled: October 17, 2001Publication date: June 6, 2002Applicant: Shipley Company, L.L.C.Inventors: James G. Shelnut, David Merricks, Oleh B. Dutkewych, Charles R. Shipley
-
Publication number: 20020000382Abstract: Disclosed are methods of repairing metal seed layers prior to subsequent metallization. Such repair methods provide metal seed layers disposed on a substrate that are substantially free of metal oxide and substantially free of discontinuities.Type: ApplicationFiled: December 15, 2000Publication date: January 3, 2002Applicant: Shipley Company, L.L.C. of MarlboroughInventors: Denis Morrissey, David Merricks, Leon R. Barstad, Eugene N. Step, Jeffrey M. Calvert, Robert A. Schetty, James G. Shelnut, Mark Lefebvre, Martin W. Bayes, Donald E. Storjohann