Patents by Inventor David Michael
David Michael has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10864639Abstract: Described are machine vision systems and methods for simultaneous kinematic and hand-eye calibration. A machine vision system includes a robot and a 3D sensor in communication with a control system. The control system is configured to move the robot to poses, and for each pose: capture a 3D image of calibration target features and robot joint angles. The control system is configured to obtain initial values for robot calibration parameters, and determine initial values for hand-eye calibration parameters based on the initial values for the robot calibration parameters, the 3D image, and joint angles. The control system is configured to determine final values for the hand-eye calibration parameters and robot calibration parameters by refining the hand-eye calibration parameters and robot calibration parameters to minimize a cost function.Type: GrantFiled: June 21, 2019Date of Patent: December 15, 2020Assignee: Cognex CorporationInventors: Lifeng Liu, Cyril C. Marrion, Tian Gan, David Michael, Han Xiao
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Publication number: 20200175512Abstract: A key is generated in a secure electronic payment system by obtaining unique transaction data relating to a transaction, the unique transaction data comprising a plurality of bits, normalising the plurality of bits of the transaction data according to a predetermined normalisation format, generating the key by applying a predetermined key generator function to the normalised unique transaction data, generating an encryption key based on the normalised unique transaction data, using a second predetermined key derivation function, obtaining additional data associated with the transaction identifier, and decrypting the obtained additional data using the generated encryption key. Methods and apparatus for generating the key are disclosed.Type: ApplicationFiled: July 30, 2018Publication date: June 4, 2020Inventor: David MICHAEL
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Publication number: 20190374081Abstract: A surface cleaning apparatus includes an upper portion having a handle and a suction motor and a surface cleaning head pivotably connected to the upper portion. The surface cleaning head includes a vacuum inlet fluidly coupled to the suction motor and an air-agitation blower assembly. The air-agitation blower assembly includes at least one air-agitation blower and at least one discharge nozzle. The least one air-agitation blower is configured to generate a pressurize air flow and includes an air pump and an air-agitation motor drivingly connected to the air pump, the air-agitation motor being independent from the suction motor. The at least one discharge nozzle is fluidly coupled to the air pump and configured to discharge the pressurized air flow to form an air-blast agitation flow.Type: ApplicationFiled: October 13, 2017Publication date: December 12, 2019Inventors: David MICHAEL, Thomas D. FORD, Sunil MODA
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Publication number: 20190308326Abstract: Described are machine vision systems and methods for simultaneous kinematic and hand-eye calibration. A machine vision system includes a robot and a 3D sensor in communication with a control system. The control system is configured to move the robot to poses, and for each pose: capture a 3D image of calibration target features and robot joint angles. The control system is configured to obtain initial values for robot calibration parameters, and determine initial values for hand-eye calibration parameters based on the initial values for the robot calibration parameters, the 3D image, and joint angles. The control system is configured to determine final values for the hand-eye calibration parameters and robot calibration parameters by refining the hand-eye calibration parameters and robot calibration parameters to minimize a cost function.Type: ApplicationFiled: June 21, 2019Publication date: October 10, 2019Inventors: Lifeng Liu, Cyril C. Marrion, Tian Gan, David Michael, Han Xiao
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Patent number: 9735036Abstract: Described are computer-based methods and apparatuses, including computer program products, for aligning a wafer for fabrication. A first image of a first portion of a wafer is received from a first image capturing device. A second image of a second portion of the wafer is received from a second image capturing device, wherein an image capturing device transform defines a first relationship between the first image capturing device and the second image capturing device. A first fiducial pattern in the first image and a second fiducial pattern in the second image are identified, based on the image capturing device transform, a fiducial transform that defines, based on a specification for the wafer, a second relationship between the first fiducial pattern and the second fiducial pattern, and a threshold value configured to identify low contrast fiducial patterns on wafers. An alignment of the wafer is determined based on the identified first and second fiducial patterns.Type: GrantFiled: August 19, 2011Date of Patent: August 15, 2017Assignee: Cognex CorporationInventors: Gang Liu, David Michael
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Patent number: 9533418Abstract: A method and system for specifying an area of interest in a 3D imaging system including a plurality of cameras that include at least first and second cameras wherein each camera has a field of view arranged along a camera distinct trajectory, the method comprising the steps of presenting a part at a location within the fields of view of the plurality of cameras, indicating on the part an area of interest that is within the field of view of each of the plurality of cameras, for each of the plurality of cameras: (i) acquiring at least one image of the part including the area of interest, (ii) identifying a camera specific field of interest within the field of view of the camera associated with the area of interest in the at least one image and (iii) storing the field of interest for subsequent use.Type: GrantFiled: May 29, 2009Date of Patent: January 3, 2017Assignee: COGNEX CORPORATIONInventors: Aaron Wallack, David Michael
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Publication number: 20130044206Abstract: Described are computer-based methods and apparatuses, including computer program products, for aligning a wafer for fabrication. A first image of a first portion of a wafer is received from a first image capturing device. A second image of a second portion of the wafer is received from a second image capturing device, wherein an image capturing device transform defines a first relationship between the first image capturing device and the second image capturing device. A first fiducial pattern in the first image and a second fiducial pattern in the second image are identified, based on the image capturing device transform, a fiducial transform that defines, based on a specification for the wafer, a second relationship between the first fiducial pattern and the second fiducial pattern, and a threshold value configured to identify low contrast fiducial patterns on wafers. An alignment of the wafer is determined based on the identified first and second fiducial patterns.Type: ApplicationFiled: August 19, 2011Publication date: February 21, 2013Applicant: Cognex CorporationInventors: Gang Liu, David Michael
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Patent number: 8126253Abstract: A method for automatically determining machine vision tool parameters is presented, including: marking to indicate a desired image result for each image of a plurality of images; selecting a combination of machine vision tool parameters, and running the machine vision tool on the plurality of images using the combination of parameters to provide a computed image result for each image of the plurality of images, each computed image result including a plurality of computed measures; comparing each desired image result with a corresponding computed image result to provide a comparison result vector associated with the combination of machine vision tool parameters, then comparing the comparison result vector associated with the combination of machine vision tool parameters to a previously computed comparison result vector associated with a previous combination of machine vision tool parameters using a result comparison heuristic to determine which combination of machine vision tool parameters is best overall.Type: GrantFiled: March 29, 2006Date of Patent: February 28, 2012Assignee: Cognex Technology and Investment CorporationInventors: Aaron Wallack, David Michael
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Patent number: 8111904Abstract: The invention provides inter alia methods and apparatus for determining the pose, e.g., position along x-, y- and z-axes, pitch, roll and yaw (or one or more characteristics of that pose) of an object in three dimensions by triangulation of data gleaned from multiple images of the object. Thus, for example, in one aspect, the invention provides a method for 3D machine vision in which, during a calibration step, multiple cameras disposed to acquire images of the object from different respective viewpoints are calibrated to discern a mapping function that identifies rays in 3D space emanating from each respective camera's lens that correspond to pixel locations in that camera's field of view. In a training step, functionality associated with the cameras is trained to recognize expected patterns in images to be acquired of the object.Type: GrantFiled: October 7, 2005Date of Patent: February 7, 2012Assignee: Cognex Technology and Investment Corp.Inventors: Aaron S Wallack, David Michael
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Publication number: 20110317906Abstract: A method for automatically determining machine vision tool parameters is presented, including: marking to indicate a desired image result for each image of a plurality of images; selecting a combination of machine vision tool parameters, and running the machine vision tool on the plurality of images using the combination of parameters to provide a computed image result for each image of the plurality of images, each computed image result including a plurality of computed measures; comparing each desired image result with a corresponding computed image result to provide a comparison result vector associated with the combination of machine vision tool parameters, then comparing the comparison result vector associated with the combination of machine vision tool parameters to a previously computed comparison result vector associated with a previous combination of machine vision tool parameters using a result comparison heuristic to determine which combination of machine vision tool parameters is best overall.Type: ApplicationFiled: March 29, 2006Publication date: December 29, 2011Inventors: Aaron Wallack, David Michael
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Patent number: 7965887Abstract: Machine vision tools are applied to color images using methods that utilize an optimized spectrum of the color information. Such methods include full color normalized correlation techniques and methods to convert color images to greyscale using weighting factors that maximize color contrast in a corresponding greyscale image.Type: GrantFiled: December 1, 2005Date of Patent: June 21, 2011Assignee: Cognex Technology and Investment Corp.Inventors: Aaron S. Wallack, David Michael
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Publication number: 20110058730Abstract: Digital image processing methods are applied to an image of a semiconductor interconnection pad to preprocess the image prior to an inspection or registration. An image of a semiconductor pads exhibiting spatial patterns from structure, texture or features are filtered without affecting features in the image not associated with structure or texture. The filtered image is inspected in a probe mark inspection operation.Type: ApplicationFiled: November 17, 2010Publication date: March 10, 2011Applicant: COGNEX CORPORATIONInventors: Aaron Wallack, Juha Koljonen, David Michael
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Publication number: 20100303337Abstract: A method and system for specifying an area of interest in a 3D imaging system including a plurality of cameras that include at least first and second cameras wherein each camera has a field of view arranged along a camera distinct trajectory, the method comprising the steps of presenting a part at a location within the fields of view of the plurality of cameras, indicating on the part an area of interest that is within the field of view of each of the plurality of cameras, for each of the plurality of cameras: (i) acquiring at least one image of the part including the area of interest, (ii) identifying a camera specific field of interest within the field of view of the camera associated with the area of interest in the at least one image and (iii) storing the field of interest for subsequent use.Type: ApplicationFiled: May 29, 2009Publication date: December 2, 2010Inventors: Aaron Wallack, David Michael
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Patent number: 7809583Abstract: A method for a manufacturer of an information handling system to pay royalties for software preloaded onto an information handling system which includes determining when software that is preloaded onto the information handling system is executed by a user and paying a royalty for the software when the software is executed by the user so as to make the royalty payment based upon a point of use of the software is disclosed.Type: GrantFiled: December 22, 2005Date of Patent: October 5, 2010Assignee: Dell Products L.P.Inventors: Mujianto Rusman, David Michael, Katherine Reichert
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Patent number: 7672862Abstract: Generating a supply chain plan includes accessing data describing a supply chain network having buffers. Each buffer is operable to store items and is associated with a corresponding time variable. The supply chain network is constrained by a constraint. A linear programming problem is generated for the supply chain network. The linear programming problem is approximated by discretizing the time variables of the buffers to yield discretized time variables and by relaxing the constraint to yield a relaxed constraint. An optimized supply chain plan is calculated for the approximated linear programming problem. The optimized supply chain plan describes a quantity of items at each buffer for at least one time value of the corresponding time variable. The optimized supply chain plan is adjusted to satisfy the constraint.Type: GrantFiled: December 4, 2001Date of Patent: March 2, 2010Assignee: i2 Technologies US, Inc.Inventors: Narayan Venkatasubramanyan, Manoj Abraham, David Michael, Mehdi Sheikhzadeh
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Publication number: 20090141973Abstract: Machine vision tools are applied to color images using methods that that utilize an optimized spectrum of the color information. Such methods include full color normalized correlation techniques and methods to convert color images to greyscale using weighting factors that maximize color contrast in a corresponding greyscale image.Type: ApplicationFiled: December 1, 2005Publication date: June 4, 2009Inventors: Aaron S. Wallack, David Michael
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Publication number: 20080144917Abstract: An image of a semiconductor interconnection pad is analyzed to determine a geometric description of the zone regions of a multiple zone semiconductor interconnection pad. Edge detection machine vision tools are used to extract features in the image. The extracted features are analyzed to derive geometric descriptions of the zone regions of the pad, that are applied in semiconductor device inspection, fabrication, and assembly operations.Type: ApplicationFiled: December 19, 2006Publication date: June 19, 2008Inventors: Gang Liu, Aaron Wallack, David Michael
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Publication number: 20070213198Abstract: A refractory material, comprised of a refractory material having about 70% to about 96% by weight magnesia particles, about 3% to about 20% by weight fine zirconia particles having a particle size less than 35 Tyler mesh (less than 425 ?m), and about 1% to about 8% coarse zirconia or about 1% to about 12% coarse spinel.Type: ApplicationFiled: March 8, 2006Publication date: September 13, 2007Inventor: David Michael
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Patent number: 7242801Abstract: Digital image processing methods are applied to an image of a semiconductor interconnection pad to preprocess the image prior to an inspection or registration. An image of a semiconductor pads exhibiting spatial patterns from structure, texture or features are filtered without affecting features in the image not associated with structure or texture. The filtered image is inspected in a probe mark inspection operation.Type: GrantFiled: May 22, 2003Date of Patent: July 10, 2007Assignee: Cognex Technology and Investment CorporationInventors: Aaron Wallack, Juha Koljonen, David Michael
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Publication number: 20070150294Abstract: A method for a manufacturer of an information handling system to pay royalties for software preloaded onto an information handling system which includes determining when software that is preloaded onto the information handling system is executed by a user and paying a royalty for the software when the software is executed by the user so as to make the royalty payment based upon a point of use of the software is disclosed.Type: ApplicationFiled: December 22, 2005Publication date: June 28, 2007Inventors: Mujianto Rusman, David Michael, Katherine Reichert