Patents by Inventor David Michael Dombrowski

David Michael Dombrowski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for integrating eddy current inspection with a coordinate measuring device
    Patent number: 8179132
    Abstract: A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model.
    Type: Grant
    Filed: February 18, 2009
    Date of Patent: May 15, 2012
    Assignee: General Electric Company
    Inventors: Yanyan Wu, Thomas James Batzinger, Nicholas Joseph Kray, Changting Wang, Haiyan Sun, Francis Howard Little, David Paul Lappas, David Michael Dombrowski
  • METHOD AND SYSTEM FOR INTEGRATING EDDY CURRENT INSPECTION WITH A COORDINATE MEASURING DEVICE
    Publication number: 20100207619
    Abstract: A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model.
    Type: Application
    Filed: February 18, 2009
    Publication date: August 19, 2010
    Inventors: Yanyan Wu, Thomas James Batzinger, Nicholas Joseph Kray, Changting Wang, Haiyan Sun, Francis Howard Little, David Paul Lappas, David Michael Dombrowski