Patents by Inventor David Michael Obzansky

David Michael Obzansky has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5654159
    Abstract: An assay for photometrically detecting and/or quantitating the presence of an analyte in a sample in which the signal generated by a label associated with the analyte is photometrically detected in the presence of a suspended solid support.
    Type: Grant
    Filed: May 12, 1995
    Date of Patent: August 5, 1997
    Assignee: Dade International Inc.
    Inventors: William Jeffrey Allard, David Michael Obzansky, Hemant Chunilal Vaidya