Abstract: A device with a signal amplifier integrated into a semiconductor chip has an amplifier input for an input signal and an amplifier output for an output signal. The signal amplifier has at least two amplifier levels connected in series between the amplifier input and the amplifier output. A feedback network is arranged between the amplifier input and the amplifier output. A fault detection circuit is integrated into the semiconductor chip to detect a faulty modulation of the output signal caused by a fault in the circuitry of the integrated circuit. The fault detection circuit has a comparator that is designed to compare a comparator input signal present on a comparator input of the comparator with a predetermined tolerance value or a tolerance range. A comparator input is connected to a node of the signal amplifier, whereby on the node a signal can be output that is more strongly modulated than the input signal.

Abstract: A device has a differential output stage that has a first and a second complementary half bridge, in each of which two transistors are connected in series. A section of the half bridge located, in each case, between the transistors of each half bridge, is connected, in each case, to a signal output for a partial signal of a differential voltage signal. The device has a fault detection circuit to detect a fault on a load connected to the signal outputs. A transistor of each half bridge, in each case, is part of a current mirror, each of which is designed and coupled with a driver assigned to this transistor, such that when an output current flows in the applicable half bridge, a test current proportional to this output current flows in a current path assigned to this half bridge. The current path are connected to a summation node to add the test currents. The summation node is connected to a comparator in order to compare the sum current of the test currents with a reference value or a reference value range.

Abstract: A semiconductor chip with an integrated circuit has supply voltage connectors and an output stage with an output for releasing an output signal. The output is connected via a drain-source line of a first self-closing insulated-gate field-effect transistor to an output connection for the output signal. The semiconductor chip has a clock signal generator fed from the supply voltage connections, its clock signal output is connected galvanically decoupled to an input voltage connection of a charge pump. A first output voltage connection of the charge pump is connected to the gate, and a second output voltage connection is connected to the bulk of the insulated-gate field-effect transistor. The output voltage connections are also connected to one another by means of a discharge path.

Abstract: An electronic component has an integrated circuit, a capacitor, and several conductors that are connected by way of bonding wires with contact elements of the integrated circuit. Two conductors are connected to one another by way of a current path, in which the capacitor, a first electrically conductive layer connecting a first connector of the capacitor to the first conductor, and a second electrically conductive layer connecting a second connector of the capacitor to the second conductor are arranged. The integrated circuit has an impedance measuring device to measure the impedance between the conductors that are connected to one another by way of the current path, which device can be connected to the first conductor by means of a switch. The impedance measuring device is configured to determine the equivalent ohmic series resistance between the conductors. This enables the contact quality of the layers to be tested.

Abstract: A method for processing detection signals of magnetic field sensors, the method comprising generating a magnetic field by an excitation magnet; detecting a magnetic flux density B1, . . . , Bn of the generated magnetic field by means of a number n?2 of magnetic field sensors S1, . . . , Sn arranged on a circuit main surface of an integrated circuit; outputting detection signals VS1, . . . , VSn proportional to the magnetic flux density B1, . . . , Bn detected by the n magnetic field sensors S1, . . . , Sn to the integrated circuit; gain correcting the output detection signals VS1, . . . , VSn; transforming the phase-corrected detection signals VS1?, . . . , VSn? and gain correcting the transformed detection signals Vt1, Vt2.

Abstract: A semiconductor chip with an integrated circuit has supply voltage connectors and an output stage with an output for releasing an output signal. The output is connected via a drain-source line of a first self-closing insulated-gate field-effect transistor to an output connection for the output signal. The semiconductor chip has a clock signal generator fed from the supply voltage connections, its clock signal output is connected galvanically decoupled to an input voltage connection of a charge pump. A first output voltage connection of the charge pump is connected to the gate, and a second output voltage connection is connected to the bulk of the insulated-gate field-effect transistor. The output voltage connections are also connected to one another by means of a discharge path.

Abstract: A device and a method for compensating a harmonic in an output voltage of at least one xMR sensor assembly is provided. The device includes the at least one xMR sensor assembly including at least one magnetoresistive element, at least one excitation magnet, at least one demodulation unit, a scaling unit and a superposing unit. The method includes detecting the output voltage of the at least one xMR sensor assembly in a demodulation unit, converting the output voltage of the at least one xMR sensor assembly in the demodulation unit, generating a compensation voltage from the demodulation voltage in a scaling unit, and superposing the compensation voltage with the output voltage of the at least one xMR sensor assembly in a superposing unit.

Abstract: In a method for measuring a Hall voltage, a Hall sensor element is made available, which includes a plurality of connection pairs for imprinting a supply current or applying a supply voltage and for capturing detection signals.

Abstract: A Hall sensor has a Hall sensor element, which has multiple connection points spaced apart from one another. A supply source serves for feeding an exciter current into the Hall sensor element and is connected to a first and a second connection point of the Hall sensor element. The Hall sensor has a first and a second comparison device. The first comparison device has a first input connected to a third connection point of the Hall sensor element, a second input connected to a reference signal generator for an upper reference value signal, and an output for a first comparison signal. The second comparison device has a third input connected to the third connection point, a fourth input connected to a reference signal generator for a lower reference value signal, and an output for a second comparison signal. The outputs are connected to an evaluation device for generating an error signal as a function of the first and second comparison signal.

Abstract: A device and method for the processing of a measurement signal of a magnetic field B(?) is described. The device comprises a permanent magnet having two or four poles, an odd number of magnetic field sensors that are arranged in a plane below the magnets, and a signal processing unit, which is adapted to detect the values of the odd number of magnetic field sensors, to filter the fundamental frequency of the magnetic field out of the detected values of the lateral magnetic field sensors in order to calculate the value of the rotation angle from the fundamental frequency.

Abstract: A Hall sensor has a Hall sensor element, having multiple connection locations and a current supply source or voltage supply source, which has a first and a second supply connector for output of a supply current or a supply voltage. The first supply connector is connected or can be connected with a first connection location to feed a current into the Hall sensor element, and the second supply connector is connected or can be connected with a second connection location of the Hall sensor element. The Hall sensor has a NAND gate, which is connected with the first connection location of the Hall sensor element using a first input, and with the second connection location of the Hall sensor element using a second input, and has an output for output of a first error signal.

Abstract: A Hall sensor has a Hall sensor element, having multiple connection locations and a current supply source or voltage supply source, which has a first and a second supply connector for output of a supply current or a supply voltage. The first supply connector is connected or can be connected with a first connection location to feed a current into the Hall sensor element, and the second supply connector is connected or can be connected with a second connection location of the Hall sensor element. The Hall sensor has a NAND gate, which is connected with the first connection location of the Hall sensor element using a first input, and with the second connection location of the Hall sensor element using a second input, and has an output for output of a first error signal.

Abstract: A Hall sensor has a Hall sensor element, which has multiple connection points spaced apart from one another. A supply source serves for feeding an exciter current into the Hall sensor element and is connected to a first and a second connection point of the Hall sensor element. The Hall sensor has a first and a second comparison device. The first comparison device has a first input connected to a third connection point of the Hall sensor element, a second input connected to a reference signal generator for an upper reference value signal, and an output for a first comparison signal. The second comparison device has a third input connected to the third connection point, a fourth input connected to a reference signal generator for a lower reference value signal, and an output for a second comparison signal. The outputs are connected to an evaluation device for generating an error signal as a function of the first and second comparison signal.

Abstract: A device and method for the processing of a measurement signal of a magnetic field B(?) is described. The device comprises a permanent magnet having two or four poles, an odd number of magnetic field sensors that are arranged in a plane below the magnets, and a signal processing unit, which is adapted to detect the values of the odd number of magnetic field sensors, to filter the fundamental frequency of the magnetic field out of the detected values of the lateral magnetic field sensors in order to calculate the value of the rotation angle from the fundamental frequency.

Abstract: A method is provided for operating a magnetic field detector circuit, whereby the magnetic field detector circuit is operated alternately in an active state or in a sleep state and the magnetic field detector circuit has a magnetic field measuring device and a wake-up timer, whereby the magnetic field measuring device comprises a magnetic field sensor. In the active state, the magnetic field measuring device is operated with a supply voltage and an output signal is generated by the magnetic field sensor. The magnetic field detector circuit comprises a wake-up timer, whereby the wake-up timer is operated with the supply voltage in the sleep state and a wake-up signal is generated by the wake-up timer after a predetermined sleep interval, and the magnetic field measuring device changes from the sleep state to the active state.

Abstract: An apparatus 10 for the contactless measurement of a rotation angle 15 is described. A permanent magnet 60 having a number of poles, wherein the number of poles amounts to four or more and cannot be divided by three, is mounted on the front of an axle. In a plane below the permanent magnet 16 at least three first lateral Hall sensors 40a-c are located in a circular path 50. A method for calculation the rotation angle 15 with the aid of the lateral Hall sensors 40a-40c is also described.

Abstract: A method for testing a signal path of a first IC formed as a monolithically integrated circuit on a semiconductor body together with a magnetic field sensor and has a signal output and a power supply connection and a test mode state and a normal operating state. A power supply of the first IC is switched off, and a signal output is connected with a reference potential, and the power supply of the first IC is switched on and the signal output is disconnected from the reference potential. Subsequently in a test mode state, a self-test is performed in the first IC and a test pattern is configured at the signal output or at the power supply connection and the test pattern is evaluated by the control unit for testing of the signal path.

Abstract: A method is provided for operating a magnetic field detector circuit, whereby the magnetic field detector circuit is operated alternately in an active state or in a sleep state and the magnetic field detector circuit has a magnetic field measuring device and a wake-up timer, whereby the magnetic field measuring device comprises a magnetic field sensor. In the active state, the magnetic field measuring device is operated with a supply voltage and an output signal is generated by the magnetic field sensor. The magnetic field detector circuit comprises a wake-up timer, whereby the wake-up timer is operated with the supply voltage in the sleep state and a wake-up signal is generated by the wake-up timer after a predetermined sleep interval, and the magnetic field measuring device changes from the sleep state to the active state.

Abstract: A method for testing a signal path of a first IC formed as a monolithically integrated circuit on a semiconductor body together with a magnetic field sensor and has a signal output and a power supply connection and a test mode state and a normal operating state. A power supply of the first IC is switched off, and a signal output is connected with a reference potential, and the power supply of the first IC is switched on and the signal output is disconnected from the reference potential. Subsequently in a test mode state, a self-test is performed in the first IC and a test pattern is configured at the signal output or at the power supply connection and the test pattern is evaluated by the control unit for testing of the signal path.

Abstract: An apparatus 10 for the contactless measurement of a rotation angle 15 is described. A permanent magnet 60 having a number of poles, wherein the number of poles amounts to four or more and cannot be divided by three, is mounted on the front of an axle. In a plane below the permanent magnet 16 at least three first lateral Hall sensors 40a-c are located in a circular path 50. A method for calculation the rotation angle 15 with the aid of the lateral Hall sensors 40a-40c is also described.