Abstract: A semiconductor chip with an integrated circuit has supply voltage connectors and an output stage with an output for releasing an output signal. The output is connected via a drain-source line of a first self-closing insulated-gate field-effect transistor to an output connection for the output signal. The semiconductor chip has a clock signal generator fed from the supply voltage connections, its clock signal output is connected galvanically decoupled to an input voltage connection of a charge pump. A first output voltage connection of the charge pump is connected to the gate, and a second output voltage connection is connected to the bulk of the insulated-gate field-effect transistor. The output voltage connections are also connected to one another by means of a discharge path.

Abstract: A device and a method for compensating a harmonic in an output voltage of at least one xMR sensor assembly is provided. The device includes the at least one xMR sensor assembly including at least one magnetoresistive element, at least one excitation magnet, at least one demodulation unit, a scaling unit and a superposing unit. The method includes detecting the output voltage of the at least one xMR sensor assembly in a demodulation unit, converting the output voltage of the at least one xMR sensor assembly in the demodulation unit, generating a compensation voltage from the demodulation voltage in a scaling unit, and superposing the compensation voltage with the output voltage of the at least one xMR sensor assembly in a superposing unit.

Abstract: In a method for measuring a Hall voltage, a Hall sensor element is made available, which includes a plurality of connection pairs for imprinting a supply current or applying a supply voltage and for capturing detection signals.

Abstract: A Hall sensor has a Hall sensor element, which has multiple connection points spaced apart from one another. A supply source serves for feeding an exciter current into the Hall sensor element and is connected to a first and a second connection point of the Hall sensor element. The Hall sensor has a first and a second comparison device. The first comparison device has a first input connected to a third connection point of the Hall sensor element, a second input connected to a reference signal generator for an upper reference value signal, and an output for a first comparison signal. The second comparison device has a third input connected to the third connection point, a fourth input connected to a reference signal generator for a lower reference value signal, and an output for a second comparison signal. The outputs are connected to an evaluation device for generating an error signal as a function of the first and second comparison signal.

Abstract: A device and method for the processing of a measurement signal of a magnetic field B(?) is described. The device comprises a permanent magnet having two or four poles, an odd number of magnetic field sensors that are arranged in a plane below the magnets, and a signal processing unit, which is adapted to detect the values of the odd number of magnetic field sensors, to filter the fundamental frequency of the magnetic field out of the detected values of the lateral magnetic field sensors in order to calculate the value of the rotation angle from the fundamental frequency.

Abstract: A Hall sensor has a Hall sensor element, having multiple connection locations and a current supply source or voltage supply source, which has a first and a second supply connector for output of a supply current or a supply voltage. The first supply connector is connected or can be connected with a first connection location to feed a current into the Hall sensor element, and the second supply connector is connected or can be connected with a second connection location of the Hall sensor element. The Hall sensor has a NAND gate, which is connected with the first connection location of the Hall sensor element using a first input, and with the second connection location of the Hall sensor element using a second input, and has an output for output of a first error signal.

Abstract: A Hall sensor has a Hall sensor element, which has multiple connection points spaced apart from one another. A supply source serves for feeding an exciter current into the Hall sensor element and is connected to a first and a second connection point of the Hall sensor element. The Hall sensor has a first and a second comparison device. The first comparison device has a first input connected to a third connection point of the Hall sensor element, a second input connected to a reference signal generator for an upper reference value signal, and an output for a first comparison signal. The second comparison device has a third input connected to the third connection point, a fourth input connected to a reference signal generator for a lower reference value signal, and an output for a second comparison signal. The outputs are connected to an evaluation device for generating an error signal as a function of the first and second comparison signal.

Abstract: A Hall sensor has a Hall sensor element, having multiple connection locations and a current supply source or voltage supply source, which has a first and a second supply connector for output of a supply current or a supply voltage. The first supply connector is connected or can be connected with a first connection location to feed a current into the Hall sensor element, and the second supply connector is connected or can be connected with a second connection location of the Hall sensor element. The Hall sensor has a NAND gate, which is connected with the first connection location of the Hall sensor element using a first input, and with the second connection location of the Hall sensor element using a second input, and has an output for output of a first error signal.

Abstract: A device and method for the processing of a measurement signal of a magnetic field B(?) is described. The device comprises a permanent magnet having two or four poles, an odd number of magnetic field sensors that are arranged in a plane below the magnets, and a signal processing unit, which is adapted to detect the values of the odd number of magnetic field sensors, to filter the fundamental frequency of the magnetic field out of the detected values of the lateral magnetic field sensors in order to calculate the value of the rotation angle from the fundamental frequency.

Abstract: A method is provided for operating a magnetic field detector circuit, whereby the magnetic field detector circuit is operated alternately in an active state or in a sleep state and the magnetic field detector circuit has a magnetic field measuring device and a wake-up timer, whereby the magnetic field measuring device comprises a magnetic field sensor. In the active state, the magnetic field measuring device is operated with a supply voltage and an output signal is generated by the magnetic field sensor. The magnetic field detector circuit comprises a wake-up timer, whereby the wake-up timer is operated with the supply voltage in the sleep state and a wake-up signal is generated by the wake-up timer after a predetermined sleep interval, and the magnetic field measuring device changes from the sleep state to the active state.

Abstract: An apparatus 10 for the contactless measurement of a rotation angle 15 is described. A permanent magnet 60 having a number of poles, wherein the number of poles amounts to four or more and cannot be divided by three, is mounted on the front of an axle. In a plane below the permanent magnet 16 at least three first lateral Hall sensors 40a-c are located in a circular path 50. A method for calculation the rotation angle 15 with the aid of the lateral Hall sensors 40a-40c is also described.

Abstract: A method for testing a signal path of a first IC formed as a monolithically integrated circuit on a semiconductor body together with a magnetic field sensor and has a signal output and a power supply connection and a test mode state and a normal operating state. A power supply of the first IC is switched off, and a signal output is connected with a reference potential, and the power supply of the first IC is switched on and the signal output is disconnected from the reference potential. Subsequently in a test mode state, a self-test is performed in the first IC and a test pattern is configured at the signal output or at the power supply connection and the test pattern is evaluated by the control unit for testing of the signal path.

Abstract: A method is provided for operating a magnetic field detector circuit, whereby the magnetic field detector circuit is operated alternately in an active state or in a sleep state and the magnetic field detector circuit has a magnetic field measuring device and a wake-up timer, whereby the magnetic field measuring device comprises a magnetic field sensor. In the active state, the magnetic field measuring device is operated with a supply voltage and an output signal is generated by the magnetic field sensor. The magnetic field detector circuit comprises a wake-up timer, whereby the wake-up timer is operated with the supply voltage in the sleep state and a wake-up signal is generated by the wake-up timer after a predetermined sleep interval, and the magnetic field measuring device changes from the sleep state to the active state.

Abstract: A method for testing a signal path of a first IC formed as a monolithically integrated circuit on a semiconductor body together with a magnetic field sensor and has a signal output and a power supply connection and a test mode state and a normal operating state. A power supply of the first IC is switched off, and a signal output is connected with a reference potential, and the power supply of the first IC is switched on and the signal output is disconnected from the reference potential. Subsequently in a test mode state, a self-test is performed in the first IC and a test pattern is configured at the signal output or at the power supply connection and the test pattern is evaluated by the control unit for testing of the signal path.

Abstract: An apparatus 10 for the contactless measurement of a rotation angle 15 is described. A permanent magnet 60 having a number of poles, wherein the number of poles amounts to four or more and cannot be divided by three, is mounted on the front of an axle. In a plane below the permanent magnet 16 at least three first lateral Hall sensors 40a-c are located in a circular path 50. A method for calculation the rotation angle 15 with the aid of the lateral Hall sensors 40a-40c is also described.

Abstract: A continuous-time delta sigma modulator, having an integrator and a comparator clocked with a clock frequency that are connected in a feedback loop, having a voltage source that is connected to the comparator for applying a threshold voltage to the comparator, in which an integration time constant of the integrator has a first resistor and a first capacitor, in which the voltage source has a second resistor and a second capacitor for setting the threshold voltage, in which the first resistor and the second resistor are part of a resistor pairing structure, and in which the first capacitor and the second capacitor are part of a capacitor pairing structure.

Abstract: A method for monitoring the function of a sensor module including sensor which generates a measurement signal for a physical quantity to be determined and applies the measurement signal to an output terminal in an unchanged form or in processed form. In addition, a test signal is generated whose spectrum lies outside the spectrum of the measurement signal. The test signal is supplied at a place in the sensor from which it reaches the output terminal in unchanged form or in processed form only in the case of a functional sensor. An output signal present at the output terminal is compared with the test signal and a diagnosis signal is generated, which indicates whether the test signal is present at the output terminal. The test signal is filtered out of the output signal and the remaining signal is applied as the measurement signal at an output of the sensor module.

Abstract: A continuous-time delta sigma modulator, having an integrator and a comparator clocked with a clock frequency that are connected in a feedback loop, having a voltage source that is connected to the comparator for applying a threshold voltage to the comparator, in which an integration time constant of the integrator has a first resistor and a first capacitor, in which the voltage source has a second resistor and a second capacitor for setting the threshold voltage, in which the first resistor and the second resistor are part of a resistor pairing structure, and in which the first capacitor and the second capacitor are part of a capacitor pairing structure.

Abstract: A device for measuring an angle at which a magnetic field is aligned in a plane relative to a reference axis has at least two magnetic field sensors, which are aligned with their measurement axes in and/or parallel to the plane and oriented at right angles to each other. The device has a PLL phase control circuit with a follow-on oscillator arranged in a phase control loop, which has at least one oscillator output for a digital oscillating signal. The magnetic field sensors are coupled to the phase control loop in such a way that the digital oscillating signal is phase synchronous with a rotation scanning signal formed by rotary scanning of the measurement signals of the magnetic field sensors. The oscillator output is connected to a phasing detector for determining the phasing of the digital oscillating signal.

Abstract: In a method for monitoring the function of a sensor module, which has a sensor, by means of the sensor a measurement signal for a physical quantity to be determined is generated and applied to an output terminal in an unchanged form or in processed form—after at least one linear signal processing step and/or at least one nonlinear signal processing step are performed. In addition, a test signal is generated whose spectrum lies substantially outside the spectrum of the measurement signal. The test signal is supplied at a place in the sensor from which it reaches the output terminal in unchanged form or in processed form—after the performance of the at least one linear signal processing step—only in the case of a functional sensor. An output signal present at the output terminal is compared with the test signal and a diagnosis signal is generated, which indicates whether the test signal is present at the output terminal.