Abstract: Residue generation systems for use in continuous-time and hybrid ADCs are described. An exemplary system includes a filter, e.g. a FIR filter, for generating a filtered analog output based on an analog input, a quantizer for generating a digital input to a feedforward DAC based on the filtered analog output generated by the filter, a feedforward DAC for generating a feedforward path analog output based on the digital input generated by the quantizer, and a subtractor for generating a residue signal based on the feedforward path analog output. Providing a filter that filters the analog input before it is quantized advantageously allows blockers to be attenuated before they are sampled and aliased by the quantizer. At least some of the residue generation systems described herein may be implemented with relatively small design and power dissipation overheads.

Abstract: A residue generation apparatus for use in continuous-time and hybrid ADCs is proposed. The apparatus includes a quantizer for digitizing an analog input to generate a digital output, and means for applying a first transfer function to the digital output from the quantizer to generate a digital input to a feedforward DAC, based on which the DAC can generate a feedforward path analog output. The apparatus further includes means for applying a second, continuous-time, transfer function to the analog input provided to the quantizer to generate a forward path analog output, and a subtractor for generating a residue signal based on a difference between the forward path analog output and the feedforward path analog output. Proposed apparatus allows selecting a combination of the first and second transfer functions so that, when each is applied in its respective path, the residue signal passed to further stages of an ADC is reduced.

Abstract: A flash analog-to-digital converter (ADC) includes comparators that convert an analog input signal to a digital output signal. Offsets of these comparators introduce noise and can hurt the performance of the ADC. Thus, these comparators are calibrated using calibration codes. Conventional calibration methods determine these calibration codes by removing the ADC from an input signal. Otherwise, it is difficult to distinguish the noise from the signal in the calibration measurement. In contrast, an embodiment can determine the calibration codes while the ADC converts the input signal to a digital signal. Such an embodiment can be achieved by a frequency-domain technique. In an embodiment employing a frequency-domain power meter, an input signal can be removed from the power measurement. This removal enables accurate measurement of in-band noise without having the measurement be corrupted by input signal power.

Abstract: An analog-to-digital converter (ADC) is a device that can include a reference shuffler and a loop filter. An ADC can achieve better performance with incremental adjustment of a pointer of the reference shuffler, changing coefficients of the loop filter, and storing calibration codes of the ADC in a non-volatile memory. By incrementally adjusting a pointer of the reference shuffler, a calibration can be performed more efficiently than with a random adjustment of the pointer. By temporarily changing the loop filter coefficients, a greater amount of activity can be introduced into the loop filter. This activity can allow the calibration to proceed more efficiently. By storing the calibration codes in a non-volatile memory, a search space for calibration codes can be reduced. Thus, a calibration can occur more quickly, and the calibration itself can be improved.

Abstract: Delta-sigma modulators do not handle overload well, and often become unstable if the input goes beyond the full-scale range of the modulator. To provide overload protection, an improved technique embeds an overload detector in the delta sigma modulator. When an overload condition is detected, coefficient(s) of the delta sigma modulator is adjusted to accommodate for the overloaded input. The improved technique advantageously allows the delta sigma modulator to handle overload gracefully without reset, and offers greater dynamic range at reduced resolution. Furthermore, the coefficient(s) of the delta sigma modulator can be adjusted in such a way to ensure the noise transfer function is not affected.

Abstract: Analog-to-digital converters (ADCs) can be used inside ADC architectures, such as delta-sigma ADCs. The error in such internal ADCs can degrade performance. To calibrate the errors in an internal ADC, comparator offsets of the internal ADC can be estimated by computing a mean of each comparator of the internal ADC. Relative differences in the computed means serves as estimates for comparator offsets. If signal paths in the internal ADC are shuffled, the estimation of comparator offsets can be performed in the background without interrupting normal operation. Shuffling of signal paths may introduce systematic measurement errors, which can be measured and reversed to improve the estimation of comparator offsets.

Abstract: A flash analog-to-digital converter (ADC) includes comparators that convert an analog input signal to a digital output signal. Offsets of these comparators introduce noise and can hurt the performance of the ADC. Thus, these comparators are calibrated using calibration codes. Conventional calibration methods determine these calibration codes by removing the ADC from an input signal. Otherwise, it is difficult to distinguish the noise from the signal in the calibration measurement. In contrast, an embodiment can determine the calibration codes while the ADC converts the input signal to a digital signal. Such an embodiment can be achieved by a frequency-domain technique. In an embodiment employing a frequency-domain power meter, an input signal can be removed from the power measurement. This removal enables accurate measurement of in-band noise without having the measurement be corrupted by input signal power.

Abstract: An analog-to-digital converter (ADC) is a device that can include a reference shuffler and a loop filter. An ADC can achieve better performance with incremental adjustment of a pointer of the reference shuffler, changing coefficients of the loop filter, and storing calibration codes of the ADC in a non-volatile memory. By incrementally adjusting a pointer of the reference shuffler, a calibration can be performed more efficiently than with a random adjustment of the pointer. By temporarily changing the loop filter coefficients, a greater amount of activity can be introduced into the loop filter. This activity can allow the calibration to proceed more efficiently. By storing the calibration codes in a non-volatile memory, a search space for calibration codes can be reduced. Thus, a calibration can occur more quickly, and the calibration itself can be improved.

Abstract: Delta-sigma modulators do not handle overload well, and often become unstable if the input goes beyond the full-scale range of the modulator. To provide overload protection, an improved technique embeds an overload detector in the delta sigma modulator. When an overload condition is detected, coefficient(s) of the delta sigma modulator is adjusted to accommodate for the overloaded input. The improved technique advantageously allows the delta sigma modulator to handle overload gracefully without reset, and offers greater dynamic range at reduced resolution. Furthermore, the coefficient(s) of the delta sigma modulator can be adjusted in such a way to ensure the noise transfer function is not affected.

Abstract: A calibration system for an analog-to-digital converter (ADC) an internal ADC that receives an analog input and converts the analog input to digital multi-bit data. The calibration system also includes a reference shuffling circuit that shuffles reference values of comparators of the internal ADC. Further, the calibration system includes a calibration circuit that calibrates the comparators of the internal ADC. The calibration system includes a digital block that measures an amplitude based on the digital multi-bit data. Additionally, the calibration system includes calibration logic that controls the calibration circuit based on an output of the digital block.

Abstract: In one example implementation, the present disclosure provides a loop filter for use in a continuous-time sigma-delta analog-to-digital converter. Specifically, a capacitive feedback digital-to-analog converter path is provided at the input of a first opamp in a series of opamp integrators. The capacitive feedback digital-to-analog converter at the input of the first opamp reduces the signal content at the output of the first opamp, and thereby reduces the output swing of the first opamp. A reduction in output swing provides a more efficient loop filter.

Abstract: In one example implementation, the present disclosure provides a loop filter for use in a continuous-time sigma-delta analog-to-digital converter. Specifically, a capacitive feedback digital-to-analog converter path is provided at the input of a first opamp in a series of opamp integrators. The capacitive feedback digital-to-analog converter at the input of the first opamp reduces the signal content at the output of the first opamp, and thereby reduces the output swing of the first opamp. A reduction in output swing provides a more efficient loop filter.

Abstract: A calibration system for an analog-to-digital converter (ADC) an internal ADC that receives an analog input and converts the analog input to digital multi-bit data. The calibration system also includes a reference shuffling circuit that shuffles reference values of comparators of the internal ADC. Further, the calibration system includes a calibration circuit that calibrates the comparators of the internal ADC. The calibration system includes a digital block that measures an amplitude based on the digital multi-bit data. Additionally, the calibration system includes calibration logic that controls the calibration circuit based on an output of the digital block.

Abstract: A switch circuit can include an impedance selection switch and a multi-output-resistance switch driver. The impedance selection switch can electrically connect an impedance to an input of an amplifier in response to a driver output signal, and include at least one transistor. The multi-output-impedance switch driver may provide the driver output signal to the switch, and have a first, relatively higher output resistance when providing a first logic state of the driver output signal to turn on the switch, and a second, relatively lower output resistance when providing a second logic state of the driver output signal to turn off the switch. The ratio of the first output resistance to the second output resistance can be greater than a selected predetermined ratio value.