Abstract: Embodiments of the present invention generally provide a system and method for testing integrity of data transmitted to and from a target device through a data connection using an asynchronous I/O dispatch method. In one embodiment, the method includes generating a data load on the data connection by repetitively writing test data patterns to the target device and reading data patterns from the target device using an asynchronous I/O dispatch method, measuring data throughput to and from the target device while generating the data load, comparing the data patterns read from the target device to the test data patterns to detect data corruptions, and generating debug information if a data corruption is detected.

Abstract: Embodiments of the present invention generally provide a system and method for testing integrity of data transmitted across a network connection. In one embodiment, the method generally includes creating one or more test threads on one or more test clients attached to a server through the network connection. The method further includes, for each test thread, generating a data load on the data connection by repetitively writing test data patterns to a data file on the server, reading data patterns from the data file, and comparing the data patterns read from the data file to the test data patterns written to the data file to detect data corruptions. The method may further include measuring data throughput between the one or more test clients and the server and generating debug information if a data corruption is detected by one of the test threads.

Abstract: Embodiments of the present invention generally provide a system and method for testing integrity of data transmitted to and from a target device through a data connection using a scatter/gather I/O dispatch method. In one embodiment, the method includes generating a data load on the data connection by repetitively writing test data patterns to the target device and reading data patterns from the target device using a scatter/gather I/O dispatch method, measuring data throughput to and from the target device while generating the data load, comparing the data patterns read from the target device to the test data patterns to detect data corruptions, and generating debug information if a data corruption is detected.

Abstract: A silicon photodetector capable of long wavelength response which includes means for aligning an optical fiber for edge illumination. The detector is formed in a silicon body (11 and 12) with major surfaces lying in the (110) plane. A groove (23) is etched in the body adjacent the detector to produce sidewalls (24) and an end wall (25) lying in (111) planes. The sidewalls form a v-shaped groove with a depth precisely determined by the width of the groove so that an optical fiber (26) placed in the groove is vertically aligned with the detector. The end wall is perpendicular to the surface of the body so that light from the fiber is not refracted from the plane of the detector.

Abstract: Described is a method of fabricating front-illuminated silicon photodiodes having high quantum efficiency, a short response time, (high gain and low excess noise in the case of avalanche diodes), low dark currents and good reliability. In the fabrication of an n.sup.+ -p-.pi.-p.sup.+ APD the method includes the steps of: (1) epitaxially growing a high resistivity .pi.-type silicon layer on a high conductivity p-type silicon substrate; (2) forming an n-type guard ring in the .pi.-layer; (3) forming a p-type channel stop around the guard ring; (4) forming in the .pi.-layer a p-layer by ion implantation and by driving in the implanted ions by heating in a suitable atmosphere; (5) masking the p-layer and introducing phosphorus into the backside to getter defects and/or impurities; (6) ramping the furnace temperature during steps (2) through (5) to reduce crystalline defects; (7) forming a thin n.sup.+ -layer in the p-layer; (8) forming an anti-reflection and passivation coating on the n.sup.